Abstract: The vehicle includes a vehicle body including an underbody, and a battery pack attached to the vehicle body below the underbody. The battery pack includes an upper surface portion provided to face the underbody, and a heat insulating material (mounting member) attached to the upper surface portion. The upper surface portion is provided with a projecting portion protruding toward the underbody side. The heat insulating material is formed with a hole portion into which the projecting portion is inserted. The shortest distance between the projecting portion and the underbody is less than the minimum value of the thickness of the insulation.

Abstract: The objective is to provide an emotion determination system and the like for determining the emotion of an animal by a simple method. The emotion determination system comprises: an acquisition unit for acquiring an image of an animal; a behavior information generation unit for generating behavior information relating to a behavior of the animal from the image of the animal acquired by the acquisition unit; and an emotion determination unit for determining the emotion of the animal based on the behavior information generated by the behavior information generation unit.

Abstract: Provided are a sensor device and a detection method. The sensor device includes: a light emitting unit transmitting a transmission signal toward a target; a light receiving unit receiving a reflected signal of the transmission signal and generating a binarized signal; a TDC delay line measurement unit and a waveform integration unit generating waveform data indicating temporal changes in the binarized signal and integrating the waveform data to generate integrated waveform data; a stage number calculation unit and a distance conversion unit calculating a near-side distance value and a far-side distance value from intersections of the integrated waveform data and a high threshold value and a low threshold value, respectively; and a determination unit determining whether the target is present on the basis of a distance value calculated from the near-side distance value and the far-side distance value and on the basis of a predetermined distance threshold value.

Abstract: An electrostatic separator separates conductive particles from raw materials includes: a container with a raw material layer; a gas dispersion plate at the bottom of the raw material layer; at least one vibrating body in the raw material layer flush with the gas dispersion plate or above it; a fluidization gas supplier introduced from the container bottom into the raw material layer flows upward through the gas dispersion plate; an upper electrode above the raw material layer; a lower electrode in the raw material layer, the lower electrode being flush with the gas dispersion plate or above it; a power supply applies a voltage between the upper and lower electrode wherein one becomes a negative electrode, the other becomes a positive electrode, and an electric field is generated between them; and a capturer captures conductive particles that have flown out of the raw material layer surface toward the upper electrode.

Abstract: An electrostatic separation method includes: applying voltage between a lower electrode at a bottom portion of or in the raw material layer and an upper electrode above the raw material layer, generating an electric field between electrodes; fluidizing the raw material layer and bringing conductive particles and the lower electrode into contact in the raw material layer charging only the conductive particles wherein their polarity becomes the same as the lower electrode; generating polarity, the same as the upper electrode, by dielectric polarization on a conveyor belt downward-facing conveyance surface passing through a capture region above the raw material layer and under the upper electrode, the conveyance surface including a nonconductor; separates charged conductive particles from the raw material layer surface by electrostatic force and adhering conductive particles to the conveyor belt conveyance surface; and separating and collecting the particles from the conveyance surface that moved outside the ele

Abstract: An electrostatic separator separates conductive particles from raw materials includes: a container with a raw material layer; a gas dispersion plate at the bottom of the raw material layer; at least one vibrating body in the raw material layer flush with the gas dispersion plate or above it; a fluidization gas supplier introduced from the container bottom into the raw material layer flows upward through the gas dispersion plate; an upper electrode above the raw material layer; a lower electrode in the raw material layer, the lower electrode being flush with the gas dispersion plate or above it; a power supply applies a voltage between the upper and lower electrode wherein one becomes a negative electrode, the other becomes a positive electrode, and an electric field is generated between them; and a capturer captures conductive particles that have flown out of the raw material layer surface toward the upper electrode.

Abstract: An electrostatic separation method includes: applying voltage between a lower electrode at a bottom portion of or in the raw material layer and an upper electrode above the raw material layer, generating an electric field between electrodes; fluidizing the raw material layer and bringing conductive particles and the lower electrode into contact in the raw material layer charging only the conductive particles wherein their polarity becomes the same as the lower electrode; generating polarity, the same as the upper electrode, by dielectric polarization on a conveyor belt downward-facing conveyance surface passing through a capture region above the raw material layer and under the upper electrode, the conveyance surface including a nonconductor; separates charged conductive particles from the raw material layer surface by electrostatic force and adhering conductive particles to the conveyor belt conveyance surface; and separating and collecting the particles from the conveyance surface that moved outside the ele

Abstract: The present invention provides a sensor system with which a change in the state of a workpiece which has occurred in a conveyance process can be detennined. The sensor system comprises: a plurality of sensors positioned along a line and measuring data indicating that a workpiece being conveyed upon the line has passed thereby; a plurality of slave units respectively connected to the plurality of sensors and acquiring the data measured by the plurality of sensors; and a master unit connected to the plurality of slave units. The master unit comprises: a storage part for storing the data in association with information which relates to the timing at which the data was measured; and a determination part for comparing the data transmitted from two or more of the plurality of slave units using the information which relates to the timing, and determining a change in the state of the workpiece.

Abstract: Provided are a photoelectric sensor and a threshold setting method. The photoelectric sensor is a photoelectric sensor detecting an object and includes a light reception part, an object determination part, and a setting part. The light reception part receives light to obtain a light reception amount. The object determination part determines presence/absence of the object based on the light reception amount and a threshold. The setting part sets the threshold based on the light reception amount during a period in which it has been determined that the object is present and the light reception amount during a period in which it has been determined that the object is absent.

Abstract: A scanning electron microscopy system that includes a primary electron beam radiation unit configured to irradiate a first pattern of a substrate having a second pattern formed in a peripheral region of the first pattern, a detection unit configured to detect back scattered electrons emitted from the substrate, an image generation unit configured to generate an electron beam image corresponding to a strength of the back scattered electrons, a designating unit configured to designate a depth measurement region in which the first pattern exists on the electron beam image, and a processing unit configured to obtain an image signal of the depth measurement region and a pattern density in the peripheral region where the second pattern exists, and to estimate a depth of the first pattern based on the obtained image signal of the depth measurement region and the pattern density in the peripheral region.

Abstract: The present invention can detect early an abnormality or signs of abnormality in a workpiece. A sensor system 1 is provided with: a first sensor 30a that measures a workpiece; a second sensor 30b that measures the workpiece in a relatively longer cycle than the first sensor 30a; and a master unit 10. The master unit 10 includes: an acquisition unit 11 that acquires data measured by the first sensor 30a and data measured by the second sensor 30b; and a generation unit 12 that generates learning data which is used for machine learning of a learning model and in which the acquired data of the first sensor 30a is regarded as input data and the acquired data of the second sensor 30b is regarded as label data indicating a property of the input data.

Abstract: A sensor device measuring a distance to an object includes: a light projection unit repeatedly emitting detection light toward the object; a light reception unit receiving reflected light of the detection light and outputting a binarized light reception signal (RT); a light projection oscillation unit controlling the emission of the detection light and outputting a start signal synchronized with the emission of the detection light; a counter measurement unit starting counting of the RT when receiving the RT and the start signal, and outputting a stop signal corresponding to a feature point of the RT; a delay line measurement unit outputting a delay line output signal corresponding to the delay time of the RT near the feature point of the RT when receiving the RT and the stop signal; and a distance calculation unit calculating the distance to the object based on the delay line output signal.

Abstract: An electron microscope apparatus includes a detection unit that detects reflected electrons reflected from a sample when the sample is irradiated with primary electrons emitted by a primary electron generation unit (electron gun), an image generation unit that generates an image of a surface of the sample with the reflected electrons based on output from the detection unit, and a processing unit that generates a differential waveform signal of the image generated by the image generation unit, processes the image by using information of the differential waveform signal, and measures a dimension of a pattern formed on the sample.

Abstract: A displacement sensor includes an emitting unit periodically emitting pulse signals; a receiving unit receiving reflection signals generated from the pulse signals and reflected by an object and outputs binary signals that indicate signal intensity of the received reflection signals; a waveform summation unit generating a summation waveform by accumulating temporal waveforms of the binary signals for the respective corresponding periods of time with reference to emission timings of the corresponding pulse signals; a distance calculation unit calculating a value that indicates a distance to the object on the basis of waveform features corresponding to waveform features of the pulse signals that appear in the summation waveform; and a reception signal amount calculation unit calculating a reception signal amount that is intensity of the reflection signals received by the receiving unit on the basis of feature amounts indicated by cumulative values that appear in the summation waveform.

Abstract: Provided are a sensor device and a detection method. The sensor device includes: a light emitting unit transmitting a transmission signal toward a target; a light receiving unit receiving a reflected signal of the transmission signal and generating a binarized signal; a TDC delay line measurement unit and a waveform integration unit generating waveform data indicating temporal changes in the binarized signal and integrating the waveform data to generate integrated waveform data; a stage number calculation unit and a distance conversion unit calculating a near-side distance value and a far-side distance value from intersections of the integrated waveform data and a high threshold value and a low threshold value, respectively; and a determination unit determining whether the target is present on the basis of a distance value calculated from the near-side distance value and the far-side distance value and on the basis of a predetermined distance threshold value.

Abstract: A scanning electron microscopy system that includes a primary electron beam radiation unit configured to irradiate a first pattern of a substrate having a second pattern formed in a peripheral region of the first pattern, a detection unit configured to detect back scattered electrons emitted from the substrate, an image generation unit configured to generate an electron beam image corresponding to a strength of the back scattered electrons, a designating unit configured to designate a depth measurement region in which the first pattern exists on the electron beam image, and a processing unit configured to obtain an image signal of the depth measurement region and a pattern density in the peripheral region where the second pattern exists, and to estimate a depth of the first pattern based on the obtained image signal of the depth measurement region and the pattern density in the peripheral region.

Abstract: The present invention provides a sensor system with which a change in the state of a workpiece which has occurred in a conveyance process can be detennined. The sensor system comprises: a plurality of sensors positioned along a line and measuring data indicating that a workpiece being conveyed upon the line has passed thereby; a plurality of slave units respectively connected to the plurality of sensors and acquiring the data measured by the plurality of sensors; and a master unit connected to the plurality of slave units. The master unit comprises: a storage part for storing the data in association with information which relates to the timing at which the data was measured; and a determination part for comparing the data transmitted from two or more of the plurality of slave units using the information which relates to the timing, and determining a change in the state of the workpiece.

Abstract: An electron microscope apparatus includes a detection unit that detects reflected electrons reflected from a sample when the sample is irradiated with primary electrons emitted by a primary electron generation unit (electron gun), an image generation unit that generates an image of a surface of the sample with the reflected electrons based on output from the detection unit, and a processing unit that generates a differential waveform signal of the image generated by the image generation unit, processes the image by using information of the differential waveform signal, and measures a dimension of a pattern formed on the sample.

Abstract: A sensor control device and a sensor system are provided through which it is possible to automatically detect whether mutual interference occurs for a plurality of sensor units, and it is possible to automatically set periodic light projection timings for preventing mutual interference. A sensor control device includes a light projection control part configured to instruct a light projection operation for each of a plurality of sensor units and a light projection timing setting part configured to set periodic light projection timings when each of the sensor units is periodically operated based on results of light projection control for each of the sensor units and detection results of each of the sensor units.

Abstract: A sensor device measuring a distance to an object includes: a light projection unit repeatedly emitting detection light toward the object; a light reception unit receiving reflected light of the detection light and outputting a binarized light reception signal (RT); a light projection oscillation unit controlling the emission of the detection light and outputting a start signal synchronized with the emission of the detection light; a counter measurement unit starting counting of the RT when receiving the RT and the start signal, and outputting a stop signal corresponding to a feature point of the RT; a delay line measurement unit outputting a delay line output signal corresponding to the delay time of the RT near the feature point of the RT when receiving the RT and the stop signal; and a distance calculation unit calculating the distance to the object based on the delay line output signal.