Patents by Inventor Yusuke Iida

Yusuke Iida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240146413
    Abstract: An object of the present invention is to provide a Brillouin gain spectrum distribution measuring method and apparatus capable of measuring a BGS, having a line width narrower than usual, in a distributed manner in the longitudinal direction of an optical fiber under test. This measuring apparatus prepares pump light in which a pulse is added to continuous light and probe light of continuous light in which a frequency is shifted from the pump light, makes the probe light incident on one end of the FUT and the pump light incident on the other end, and obtains a time waveform of a component amplified by the pump light pulse of a probe light intensity amplified by the pump light. This measuring apparatus changes an optical frequency difference between the pump light and the probe light, and obtains a time waveform for each optical frequency difference. This measuring apparatus obtains a BGS distribution of the FUT from these time waveforms.
    Type: Application
    Filed: January 26, 2021
    Publication date: May 2, 2024
    Applicant: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
    Inventors: Tomokazu ODA, Daisuke IIDA, Atsushi NAKAMURA, Yusuke KOSHIKIYA, Nazuki HONDA
  • Publication number: 20240118126
    Abstract: An object of the present disclosure is to provide a method for remotely identifying a utility pole position and estimating a state of an overhead optical fiber cable. The present disclosure is a method for identifying a utility pole position including identifying a boundary region of a vibration distribution as a utility pole position, from a vibration distribution pattern obtained by measuring strain amounts with respect to distances of an optical fiber by an optical fiber vibration distribution measuring method at each time and sequentially stacking the strain amounts.
    Type: Application
    Filed: February 17, 2021
    Publication date: April 11, 2024
    Applicant: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
    Inventors: Tatsuya OKAMOTO, Daisuke IIDA, Yusuke KOSHIKIYA, Nazuki HONDA
  • Publication number: 20240116028
    Abstract: A method of regenerating an acid gas adsorption device includes the steps of: causing an acid gas to be adsorbed to an acid gas adsorption material by supplying a gas including the acid gas to an acid gas adsorption device so that the gas is brought into contact with an acid gas adsorption layer; causing the acid gas to be desorbed from the acid gas adsorption material; removing the acid gas adsorption layer of the acid gas adsorption device, which has been subjected to the step of causing the acid gas to be adsorbed and the step of causing the acid gas to be desorbed, from a surface of a base material; and forming an acid gas adsorption layer including a porous carrier and an acid gas adsorption material on the surface of the base material from which the acid gas adsorption layer has been removed.
    Type: Application
    Filed: December 20, 2023
    Publication date: April 11, 2024
    Applicant: NGK INSULATORS, LTD.
    Inventors: Yusuke OKUMA, Yukinari SHIBAGAKI, Hirofumi KAN, Kazuki IIDA, Atsushi TORII, Kosuke NAKAGAWA
  • Publication number: 20240118127
    Abstract: The present disclosure is an optical line test system that detects a distribution of loss points of an optical line in a longitudinal direction, using a coherent light measurement device, applies vibration to facility disposed on a path of the optical line, detects a vibration point of the optical line in a longitudinal direction upon applying the vibration, using the coherent light measurement device, and identifies the loss point based on correspondence between the detected loss point and vibration point.
    Type: Application
    Filed: February 26, 2021
    Publication date: April 11, 2024
    Applicant: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
    Inventors: Daisuke IIDA, Yoshitaka ENOMOTO, Chihiro KITO, Tatsuya OKAMOTO, Yusuke KOSHIKIYA, Yoshifumi WAKISAKA, Nazuki HONDA
  • Patent number: 11944983
    Abstract: An electrostatic separation method includes: applying voltage between a lower electrode at a bottom portion of or in the raw material layer and an upper electrode above the raw material layer, generating an electric field between electrodes; fluidizing the raw material layer and bringing conductive particles and the lower electrode into contact in the raw material layer charging only the conductive particles wherein their polarity becomes the same as the lower electrode; generating polarity, the same as the upper electrode, by dielectric polarization on a conveyor belt downward-facing conveyance surface passing through a capture region above the raw material layer and under the upper electrode, the conveyance surface including a nonconductor; separates charged conductive particles from the raw material layer surface by electrostatic force and adhering conductive particles to the conveyor belt conveyance surface; and separating and collecting the particles from the conveyance surface that moved outside the ele
    Type: Grant
    Filed: October 19, 2021
    Date of Patent: April 2, 2024
    Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Takayuki Ihara, Koki Ikeda, Naoya Ogiyama, Yusuke Iida, Manabu Masamoto, Koji Fukumoto, Gen Kiyotaki, Keiichi Mashio, Tomoyuki Suzuki, Ryoma Yamamoto
  • Patent number: 11936370
    Abstract: A protection device is capable of protecting a load drive system at an appropriate timing according to a temperature of a power semiconductor. The protection device includes: a capacitor configured to output a voltage according to a charge accumulated by a first current; and a protection circuit configured to: (i) determine whether or not the voltage output by the capacitor exceeds a certain threshold value; (ii) generate a second current having a magnitude according to information related to the temperature of the power semiconductor which drives a load; and (iii) change a magnitude of the first current based on the second current.
    Type: Grant
    Filed: May 12, 2022
    Date of Patent: March 19, 2024
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Yusuke Yoshino, Takashi Nakagami, Ryo Iida
  • Publication number: 20240083215
    Abstract: An anti-fogging system according to the present disclosure includes an anti-fogging device that suppresses fogging of glass of a vehicle, and a control device that controls the anti-fogging device. The control device is configured to execute a process of operating an anti-fogging device when a predetermined condition is satisfied, a process of acquiring information on a conversation situation including at least whether or not a vehicle occupant is talking, and a process of changing a predetermined condition based on information on a conversation situation.
    Type: Application
    Filed: July 10, 2023
    Publication date: March 14, 2024
    Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Yusuke Tatesumi, Taiki Iida
  • Publication number: 20240083703
    Abstract: A sheet conveying device includes a conveyor, a sound collector, and circuitry. The conveyor conveys a sheet. The conveyor conveys a sheet in a sheet conveyance direction. The sound collector collects an operating sound generated by a conveyance of the sheet. The circuitry is to extract a feature amount of the operating sound collected by the sound collector, and determine, at different positions in the sheet conveyance direction based on the feature amount, whether an abnormal conveyance of the sheet occurs until the sheet is conveyed to a given position in the sheet conveyance direction.
    Type: Application
    Filed: September 8, 2023
    Publication date: March 14, 2024
    Inventors: Yosuke IIDA, Yusuke NAKAI, Chisa KATO, Hiroyuki KUNO, Yotaro MIZUNO
  • Publication number: 20230405604
    Abstract: An electrostatic separator separates conductive particles from raw materials includes: a container with a raw material layer; a gas dispersion plate at the bottom of the raw material layer; at least one vibrating body in the raw material layer flush with the gas dispersion plate or above it; a fluidization gas supplier introduced from the container bottom into the raw material layer flows upward through the gas dispersion plate; an upper electrode above the raw material layer; a lower electrode in the raw material layer, the lower electrode being flush with the gas dispersion plate or above it; a power supply applies a voltage between the upper and lower electrode wherein one becomes a negative electrode, the other becomes a positive electrode, and an electric field is generated between them; and a capturer captures conductive particles that have flown out of the raw material layer surface toward the upper electrode.
    Type: Application
    Filed: October 23, 2020
    Publication date: December 21, 2023
    Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Takayuki IHARA, Koki IKEDA, Naoya OGIYAMA, Yusuke IIDA, Manabu MASAMOTO, Koji FUKUMOTO, Gen KIYOTAKI, Keiichi MASHIO, Tomoyuki SUZUKI, Ryoma YAMAMOTO
  • Publication number: 20230398553
    Abstract: An electrostatic separation method includes: applying voltage between a lower electrode at a bottom portion of or in the raw material layer and an upper electrode above the raw material layer, generating an electric field between electrodes; fluidizing the raw material layer and bringing conductive particles and the lower electrode into contact in the raw material layer charging only the conductive particles wherein their polarity becomes the same as the lower electrode; generating polarity, the same as the upper electrode, by dielectric polarization on a conveyor belt downward-facing conveyance surface passing through a capture region above the raw material layer and under the upper electrode, the conveyance surface including a nonconductor; separates charged conductive particles from the raw material layer surface by electrostatic force and adhering conductive particles to the conveyor belt conveyance surface; and separating and collecting the particles from the conveyance surface that moved outside the ele
    Type: Application
    Filed: October 19, 2021
    Publication date: December 14, 2023
    Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Takayuki IHARA, Koki IKEDA, Naoya OGIYAMA, Yusuke IIDA, Manabu MASAMOTO, Koji FUKUMOTO, Gen KIYOTAKI, Keiichi MASHIO, Tomoyuki SUZUKI, Ryoma YAMAMOTO
  • Patent number: 11774464
    Abstract: The present invention provides a sensor system with which a change in the state of a workpiece which has occurred in a conveyance process can be detennined. The sensor system comprises: a plurality of sensors positioned along a line and measuring data indicating that a workpiece being conveyed upon the line has passed thereby; a plurality of slave units respectively connected to the plurality of sensors and acquiring the data measured by the plurality of sensors; and a master unit connected to the plurality of slave units. The master unit comprises: a storage part for storing the data in association with information which relates to the timing at which the data was measured; and a determination part for comparing the data transmitted from two or more of the plurality of slave units using the information which relates to the timing, and determining a change in the state of the workpiece.
    Type: Grant
    Filed: April 25, 2019
    Date of Patent: October 3, 2023
    Assignee: OMRON Corporation
    Inventors: Norihiro Tomago, Kiyoshi Imai, Yusuke Iida, Yusuke Shibasaki
  • Publication number: 20230057540
    Abstract: Provided are a photoelectric sensor and a threshold setting method. The photoelectric sensor is a photoelectric sensor detecting an object and includes a light reception part, an object determination part, and a setting part. The light reception part receives light to obtain a light reception amount. The object determination part determines presence/absence of the object based on the light reception amount and a threshold. The setting part sets the threshold based on the light reception amount during a period in which it has been determined that the object is present and the light reception amount during a period in which it has been determined that the object is absent.
    Type: Application
    Filed: February 4, 2021
    Publication date: February 23, 2023
    Applicant: OMRON Corporation
    Inventors: Kohei TANISUE, Yusuke IIDA, Norihiro TOMAGO
  • Patent number: 11545336
    Abstract: A scanning electron microscopy system that includes a primary electron beam radiation unit configured to irradiate a first pattern of a substrate having a second pattern formed in a peripheral region of the first pattern, a detection unit configured to detect back scattered electrons emitted from the substrate, an image generation unit configured to generate an electron beam image corresponding to a strength of the back scattered electrons, a designating unit configured to designate a depth measurement region in which the first pattern exists on the electron beam image, and a processing unit configured to obtain an image signal of the depth measurement region and a pattern density in the peripheral region where the second pattern exists, and to estimate a depth of the first pattern based on the obtained image signal of the depth measurement region and the pattern density in the peripheral region.
    Type: Grant
    Filed: April 5, 2019
    Date of Patent: January 3, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Akira Hamaguchi, Yusuke Iida
  • Publication number: 20220390925
    Abstract: The present invention can detect early an abnormality or signs of abnormality in a workpiece. A sensor system 1 is provided with: a first sensor 30a that measures a workpiece; a second sensor 30b that measures the workpiece in a relatively longer cycle than the first sensor 30a; and a master unit 10. The master unit 10 includes: an acquisition unit 11 that acquires data measured by the first sensor 30a and data measured by the second sensor 30b; and a generation unit 12 that generates learning data which is used for machine learning of a learning model and in which the acquired data of the first sensor 30a is regarded as input data and the acquired data of the second sensor 30b is regarded as label data indicating a property of the input data.
    Type: Application
    Filed: December 1, 2020
    Publication date: December 8, 2022
    Applicant: OMRON Corporation
    Inventors: Yusuke IIDA, Norihiro TOMAGO, Kohei TANISUE, Yutaka KATO, Masanori TAKAHASHI
  • Patent number: 11506787
    Abstract: A sensor device measuring a distance to an object includes: a light projection unit repeatedly emitting detection light toward the object; a light reception unit receiving reflected light of the detection light and outputting a binarized light reception signal (RT); a light projection oscillation unit controlling the emission of the detection light and outputting a start signal synchronized with the emission of the detection light; a counter measurement unit starting counting of the RT when receiving the RT and the start signal, and outputting a stop signal corresponding to a feature point of the RT; a delay line measurement unit outputting a delay line output signal corresponding to the delay time of the RT near the feature point of the RT when receiving the RT and the stop signal; and a distance calculation unit calculating the distance to the object based on the delay line output signal.
    Type: Grant
    Filed: June 28, 2018
    Date of Patent: November 22, 2022
    Assignee: OMRON Corporation
    Inventors: Shoichi Ohnaka, Yusuke Iida, Ryosuke Tsuzuki, Koji Iguchi, Osamu Harada
  • Patent number: 11302513
    Abstract: An electron microscope apparatus includes a detection unit that detects reflected electrons reflected from a sample when the sample is irradiated with primary electrons emitted by a primary electron generation unit (electron gun), an image generation unit that generates an image of a surface of the sample with the reflected electrons based on output from the detection unit, and a processing unit that generates a differential waveform signal of the image generated by the image generation unit, processes the image by using information of the differential waveform signal, and measures a dimension of a pattern formed on the sample.
    Type: Grant
    Filed: April 5, 2019
    Date of Patent: April 12, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Akira Hamaguchi, Yusuke Iida, Chihiro Ida
  • Patent number: 11294057
    Abstract: A displacement sensor includes an emitting unit periodically emitting pulse signals; a receiving unit receiving reflection signals generated from the pulse signals and reflected by an object and outputs binary signals that indicate signal intensity of the received reflection signals; a waveform summation unit generating a summation waveform by accumulating temporal waveforms of the binary signals for the respective corresponding periods of time with reference to emission timings of the corresponding pulse signals; a distance calculation unit calculating a value that indicates a distance to the object on the basis of waveform features corresponding to waveform features of the pulse signals that appear in the summation waveform; and a reception signal amount calculation unit calculating a reception signal amount that is intensity of the reflection signals received by the receiving unit on the basis of feature amounts indicated by cumulative values that appear in the summation waveform.
    Type: Grant
    Filed: September 11, 2018
    Date of Patent: April 5, 2022
    Assignee: OMRON Corporation
    Inventors: Yusuke Iida, Ryosuke Tsuzuki, Shoichi Ohnaka, Koji Iguchi, Osamu Harada
  • Publication number: 20210389458
    Abstract: Provided are a sensor device and a detection method. The sensor device includes: a light emitting unit transmitting a transmission signal toward a target; a light receiving unit receiving a reflected signal of the transmission signal and generating a binarized signal; a TDC delay line measurement unit and a waveform integration unit generating waveform data indicating temporal changes in the binarized signal and integrating the waveform data to generate integrated waveform data; a stage number calculation unit and a distance conversion unit calculating a near-side distance value and a far-side distance value from intersections of the integrated waveform data and a high threshold value and a low threshold value, respectively; and a determination unit determining whether the target is present on the basis of a distance value calculated from the near-side distance value and the far-side distance value and on the basis of a predetermined distance threshold value.
    Type: Application
    Filed: September 25, 2019
    Publication date: December 16, 2021
    Applicant: OMRON Corporation
    Inventors: Shoichi OHNAKA, Kiyoshi IMAI, Yusuke IIDA, Ryosuke TSUZUKI
  • Publication number: 20210027983
    Abstract: A scanning electron microscopy system that includes a primary electron beam radiation unit configured to irradiate a first pattern of a substrate having a second pattern formed in a peripheral region of the first pattern, a detection unit configured to detect back scattered electrons emitted from the substrate, an image generation unit configured to generate an electron beam image corresponding to a strength of the back scattered electrons, a designating unit configured to designate a depth measurement region in which the first pattern exists on the electron beam image, and a processing unit configured to obtain an image signal of the depth measurement region and a pattern density in the peripheral region where the second pattern exists, and to estimate a depth of the first pattern based on the obtained image signal of the depth measurement region and the pattern density in the peripheral region.
    Type: Application
    Filed: April 5, 2019
    Publication date: January 28, 2021
    Inventors: Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Akira Hamaguchi, Yusuke Iida
  • Publication number: 20210018528
    Abstract: The present invention provides a sensor system with which a change in the state of a workpiece which has occurred in a conveyance process can be detennined. The sensor system comprises: a plurality of sensors positioned along a line and measuring data indicating that a workpiece being conveyed upon the line has passed thereby; a plurality of slave units respectively connected to the plurality of sensors and acquiring the data measured by the plurality of sensors; and a master unit connected to the plurality of slave units. The master unit comprises: a storage part for storing the data in association with information which relates to the timing at which the data was measured; and a determination part for comparing the data transmitted from two or more of the plurality of slave units using the information which relates to the timing, and determining a change in the state of the workpiece.
    Type: Application
    Filed: April 25, 2019
    Publication date: January 21, 2021
    Applicant: OMRON Corporation
    Inventors: Norihiro TOMAGO, Kiyoshi IMAI, Yusuke IIDA, Yusuke SHIBASAKI