Patents by Inventor Yusuke IZUTANI

Yusuke IZUTANI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12174103
    Abstract: Provided are a light scattering measuring apparatus. The light scattering measuring apparatus includes: light sources; a single light receiver; a sample holder including a cell, a frame body, a first opening formed in an incident portion of a first optical path used for forward measurement or side measurement, and a second opening formed in an incident portion of a second optical path used for back measurement, and an optical element; and a moving mechanism. The first optical path and the second optical path are separated from each other in vertical direction. The moving mechanism moves the first opening to a position of the incident portion of the first optical path when the forward or side measurement is to be performed, and to move the second opening to a position of the incident portion of the second optical path when the back measurement is to be performed.
    Type: Grant
    Filed: November 12, 2021
    Date of Patent: December 24, 2024
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Yusuke Izutani, Ikuo Wakayama, Hiroya Nagasawa
  • Publication number: 20220155203
    Abstract: Provided are a light scattering measuring apparatus. The light scattering measuring apparatus includes: light sources; a single light receiver; a sample holder including a cell, a frame body, a first opening formed in an incident portion of a first optical path used for forward measurement or side measurement, and a second opening formed in an incident portion of a second optical path used for back measurement, and an optical element; and a moving mechanism. The first optical path and the second optical path are separated from each other in vertical direction. The moving mechanism moves the first opening to a position of the incident portion of the first optical path when the forward or side measurement is to be performed, and to move the second opening to a position of the incident portion of the second optical path when the back measurement is to be performed.
    Type: Application
    Filed: November 12, 2021
    Publication date: May 19, 2022
    Inventors: Yusuke IZUTANI, Ikuo WAKAYAMA, Hiroya NAGASAWA
  • Patent number: 10788412
    Abstract: An optical measurement apparatus includes a main body base, an optical base movably combined with the main body base, a measurement optical system fixed to the optical base, and an optical base moving mechanism which moves the optical base relative to the main body base. The optical base moving mechanism moves the optical base relative to the main body base between an internal measurement position and an external measurement position. A measurement object position of the measurement optical system coincides with an internal measurement object position within the main body base. The measurement object position of the measurement optical system coincides with an external measurement object position outside the main body base.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: September 29, 2020
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Yusuke Izutani, Ikuo Wakayama
  • Publication number: 20190011351
    Abstract: An optical measurement apparatus includes a main body base, an optical base movably combined with the main body base, a measurement optical system fixed to the optical base, and an optical base moving mechanism which moves the optical base relative to the main body base. The optical base moving mechanism moves the optical base relative to the main body base between an internal measurement position and an external measurement position. A measurement object position of the measurement optical system coincides with an internal measurement object position within the main body base. The measurement object position of the measurement optical system coincides with an external measurement object position outside the main body base.
    Type: Application
    Filed: June 22, 2018
    Publication date: January 10, 2019
    Inventors: Yusuke IZUTANI, Ikuo WAKAYAMA
  • Publication number: 20150369733
    Abstract: A dynamic light scattering measurement device includes an irradiation section that applies light emitted from a low-coherence light source to a sample that includes particles, a spectral intensity acquisition section that disperses reflected light from a reference plane and scattered light from the sample that has passed through the reference plane to acquire a spectral intensity of interference light of the reflected light and the scattered light, the reference plane being situated to intersect an optical path through which the light is applied to the sample, and a measurement section that measures dynamic light scattering of the sample based on the acquired spectral intensity.
    Type: Application
    Filed: June 18, 2015
    Publication date: December 24, 2015
    Inventors: Yusuke IZUTANI, Toshiaki IWAI