Abstract: In an optical packet processing apparatus, an optical coupler joins optical packets transmitted through a plurality of input side optical transmission lines and outputs the joined optical packets to an output side optical transmission line. The optical packet processing apparatus has delay sections for delaying desired optical packets for each input side optical transmission lines. Delay times of the delay sections are different by one optical packet time period, while a minimum delay time thereof is the optical packet time period or more.

Abstract: An inspection apparatus inspects an inspected object based on a waveform quality of a signal that the inspected object outputs. The inspection apparatus has a power supply section which outputs a control signal that controls an output of the inspected object, a waveform measuring section which measures the signal that the inspected object outputs to generate a waveform image, an analyzing section which derives a value indicating a waveform quality from the waveform image that the waveform measuring section measures, a deciding section which decides whether or not the value derived by the analyzing section satisfies a target value, and an optimizing section which changes a set value of the control signal that the power supply section outputs, based on a decision result of the deciding section.

Abstract: In an optical packet processing apparatus, an optical coupler joins optical packets transmitted through a plurality of input side optical transmission lines and outputs the joined optical packets to an output side optical transmission line. The optical packet processing apparatus has delay sections for delaying desired optical packets for each input side optical transmission lines. Delay times of the delay sections are different by one optical packet time period, while a minimum delay time thereof is the optical packet time period or more.

Abstract: An inspection apparatus inspects an inspected object based on a waveform quality of a signal that the inspected object outputs. The inspection apparatus has a power supply section which outputs a control signal that controls an output of the inspected object, a waveform measuring section which measures the signal that the inspected object outputs to generate a waveform image, an analyzing section which derives a value indicating a waveform quality from the waveform image that the waveform measuring section measures, a deciding section which decides whether or not the value derived by the analyzing section satisfies a target value, and an optimizing section which changes a set value of the control signal that the power supply section outputs, based on a decision result of the deciding section.