Patents by Inventor Yusuke OMURO

Yusuke OMURO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10712147
    Abstract: A measurement system includes a measuring instrument, a measurement control device, and a ranging device. The measuring instrument includes a base that is to be fixed to a tool shaft of a machining apparatus, a first rod and a second rod that are connected to the base, and a first measuring head and a second measuring head that are fixed to the respective rods and irradiate an object to be measured with measurement light. The measurement control device acquires a distance I between the first measuring head and an inner peripheral surface of the hole of the object to be measured, and a distance O between the second measuring head and an outer peripheral surface of the object from the ranging device, and calculates the thickness of the object on the basis of the distance I, the distance O, and a distance between the first and second measuring heads.
    Type: Grant
    Filed: August 29, 2019
    Date of Patent: July 14, 2020
    Assignee: Hitachi Metals, Ltd.
    Inventors: Masahiro Watanabe, Koji Utsumi, Shigeyoshi Fujihara, Yusuke Omuro, Shinji Kayama
  • Publication number: 20200103219
    Abstract: A measurement system includes a measuring instrument, a measurement control device, and a ranging device. The measuring instrument includes a base that is to be fixed to a tool shaft of a machining apparatus, a first rod and a second rod that are connected to the base, and a first measuring head and a second measuring head that are fixed to the respective rods and irradiate an object to be measured with measurement light. The measurement control device acquires a distance I between the first measuring head and an inner peripheral surface of the hole of the object to be measured, and a distance O between the second measuring head and an outer peripheral surface of the object from the ranging device, and calculates the thickness of the object on the basis of the distance I, the distance O, and a distance between the first and second measuring heads.
    Type: Application
    Filed: August 29, 2019
    Publication date: April 2, 2020
    Inventors: Masahiro WATANABE, Koji UTSUMI, Shigeyoshi FUJIHARA, Yusuke OMURO, Shinji KAYAMA