Patents by Inventor Yusuke Shiro

Yusuke Shiro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11374248
    Abstract: An oriented apatite-type oxide ion conductor includes a composite oxide expressed as A9.33+x[T6.00?yMy]O26.0+z, where A represents one or two or more elements selected from the group consisting of La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Be, Mg, Ca, Sr, and Ba, T represents an element including Si or Ge or both, and M represents one or two or more elements selected from the group consisting of B, Ge, Zn, Sn, W, and Mo, and where x is from ?1.00 to 1.00, y is from 0.40 to less than 1.00, and z is from ?3.00 to 2.00.
    Type: Grant
    Filed: February 14, 2019
    Date of Patent: June 28, 2022
    Assignee: MITSUI MINING & SMELTING CO., LTD.
    Inventors: Shingo Ide, Yusuke Shiro
  • Publication number: 20210057759
    Abstract: An oxygen permeable element includes an anode, a cathode, and a solid electrolyte. With a voltage applied between the anode and the cathode, oxygen gas in the cathode side atmosphere is allowed to pass through the solid electrolyte to the anode side. The oxygen permeable element has interlayers located between the solid electrolyte and at least one of the cathode and the anode, at least one interlayer containing an oxide of bismuth. The solid electrolyte contains an oxide of lanthanum.
    Type: Application
    Filed: January 17, 2019
    Publication date: February 25, 2021
    Inventors: Tokiharu OYAMA, Shingo IDE, Yusuke SHIRO
  • Publication number: 20200381760
    Abstract: An oriented apatite-type oxide ion conductor includes a composite oxide expressed as A9.33+x[T6.00?yMy]O26.0+z, where A represents one or two or more elements selected from the group consisting of La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Be, Mg, Ca, Sr, and Ba, T represents an element including Si or Ge or both, and M represents one or two or more elements selected from the group consisting of B, Ge, Zn, Sn, W, and Mo, and where x is from ?1.00 to 1.00, y is from 0.40 to less than 1.00, and z is from ?3.00 to 2.00.
    Type: Application
    Filed: February 14, 2019
    Publication date: December 3, 2020
    Inventors: Shingo IDE, Yusuke SHIRO
  • Patent number: 9448330
    Abstract: A fluorite having all the more excellent laser durability compared to a conventional fluorite is provided. A fluorite is proposed, in which the standard deviation of the surface areas of the Voronoi regions in a diagram from a Voronoi decomposition of the distribution of etch-pits in the (111) plane is 6,000 ?m2 or less, or, in which the standard deviation of the distances of the Delaunay edges in a diagram from a Delaunay decomposition of the distribution of etch-pits of the (111) plane is 80 ?m or less.
    Type: Grant
    Filed: November 7, 2013
    Date of Patent: September 20, 2016
    Assignee: Nihon Kessho Kogaku Co., Ltd.
    Inventors: Takafumi Yamazaki, Yusuke Shiro
  • Patent number: 9322954
    Abstract: A fluorite with excellent laser durability is provided by devising a heat-treatment method for CaF2 crystal. A fluorite production method is proposed, wherein heat-treatment is carried out by providing, through compartment walls in the periphery of a fluorite crystal, a fluoride gas trap layer containing a fluoride gas-adsorbing material.
    Type: Grant
    Filed: June 30, 2011
    Date of Patent: April 26, 2016
    Assignee: Nihon Kessho Kogaku Co., Ltd.
    Inventors: Takafumi Yamazaki, Yusuke Shiro, Masao Sekiguchi
  • Patent number: 8784970
    Abstract: A fluorite having all the more excellent laser durability compared to a conventional fluorite is provided. A fluorite is proposed, in which the standard deviation of the surface areas of the Voronoi regions in a diagram from a Voronoi segmentation of the distribution of etch-pits in the (111) plane is 6,000 ?m2 or less, or, in which the standard deviation of the distances of the Delaunay edges in a diagram from a Delaunay segmentation of the distribution of etch-pits of the (111) plane is 80 ?m or less.
    Type: Grant
    Filed: June 30, 2011
    Date of Patent: July 22, 2014
    Assignee: Nihon Kessho Kogaku Co., Ltd.
    Inventors: Takafumi Yamazaki, Yusuke Shiro
  • Publication number: 20140099471
    Abstract: A fluorite having all the more excellent laser durability compared to a conventional fluorite is provided. A fluorite is proposed, in which the standard deviation of the surface areas of the Voronoi regions in a diagram from a Voronoi decomposition of the distribution of etch-pits in the (111) plane is 6,000 ?m2 or less, or, in which the standard deviation of the distances of the Delaunay edges in a diagram from a Delaunay decomposition of the distribution of etch-pits of the (111) plane is 80 ?m or less.
    Type: Application
    Filed: November 7, 2013
    Publication date: April 10, 2014
    Applicant: Nihon Kessho Kogaku Co., Ltd.
    Inventors: Takafumi Yamazaki, Yusuke Shiro
  • Publication number: 20130115158
    Abstract: A fluorite with excellent laser durability is provided by devising a heat-treatment method for CaF2 crystal. A fluorite production method is proposed, wherein heat-treatment is carried out by providing, through compartment walls in the periphery of a fluorite crystal, a fluoride gas trap layer containing a fluoride gas-adsorbing material.
    Type: Application
    Filed: June 30, 2011
    Publication date: May 9, 2013
    Applicant: NIHON KESSHO KOGAKU CO., LTD.
    Inventors: Takafumi Yamazaki, Yusuke Shiro, Masao Sekiguchi
  • Publication number: 20130115425
    Abstract: A fluorite having all the more excellent laser durability compared to a conventional fluorite is provided. A fluorite is proposed, in which the standard deviation of the surface areas of the Voronoi regions in a diagram from a Voronoi decomposition of the distribution of etch-pits in the (111) plane is 6,000 ?m2 or less, or, in which the standard deviation of the distances of the Delaunay edges in a diagram from a Delaunay decomposition of the distribution of etch-pits of the (111) plane is 80 ?m or less.
    Type: Application
    Filed: June 30, 2011
    Publication date: May 9, 2013
    Applicant: NIHON KESSHO KOGAKU CO., LTD.
    Inventors: Takafumi Yamazaki, Yusuke Shiro