Abstract: A micro light emitting element includes: a nitride semiconductor layer in which an N-type layer, a light emitting layer, and a P-type layer are stacked. Viewing in a direction perpendicular to a surface of the nitride semiconductor layer, multiple V pits are arranged at positions corresponding to vertexes of a polygon in a one-to-one relation in a region of the nitride semiconductor layer.

Abstract: An image display element, provided with a pixel region and a connection region, includes a light-emitting unit and a driving circuit substrate. The light-emitting unit includes a semiconductor layer obtained by layering a second conductive layer, a light-emitting layer, and a first conductive layer, mesa shapes formed by dividing the semiconductor layer, and a step portion separated from the mesa shapes by a groove. A first electrode is connected to the first conductive layer and a first driving electrode. The light-emitting unit further includes, between the mesa shapes adjacent to each other, a wiring line layer forming a conductive path, the wiring line layer being thinner than a layer thickness of a portion of each of the mesa shapes in the semiconductor layer. The wiring line layer extends to a top of the step portion and is connected to a common second electrode provided on the step portion.

Abstract: A location displacement of an electrode of a device relative to an electrode pad of a semiconductor element is detected based on a conduction state between the electrode pad of the semiconductor element and the electrode of the device. The electrode pad of the semiconductor element is segmented into multiple portions and a first pad through a fourth pad uniformly arranged. A location displacement detector determines that no location displacement has occurred when the electrode pad of the semiconductor element is conductive to the electrode of the device, and determines that a location displacement has occurred when the electrode pad of the semiconductor element is non-conductive to the electrode of the device.

Abstract: In a light-emitting element module, at least two or more first electrodes of a first substrate that includes a circuit element are joined to at least two or more light-emitting elements. The first substrate includes a first wiring line to an n-th wiring line (n is an integer of 2 or more) that are formed into layers in order from the at least two or more light-emitting elements in a thickness direction of the first substrate. The first wiring line that is located in one of the layers of the first substrate nearest to the at least two or more light-emitting elements is formed at least in an interelectrode region between the adjacent first electrodes of the first substrate in a plan view.

Abstract: In a light-emitting element module, at least two or more first electrodes of a first substrate that includes a circuit element are joined to at least two or more light-emitting elements. The first substrate includes a first wiring line to an n-th wiring line (n is an integer of 2 or more) that are formed into layers in order from the at least two or more light-emitting elements in a thickness direction of the first substrate. The first wiring line that is located in one of the layers of the first substrate nearest to the at least two or more light-emitting elements is formed at least in an interelectrode region between the adjacent first electrodes of the first substrate in a plan view.

Abstract: A location displacement of an electrode of a device relative to an electrode pad of a semiconductor element is detected based on a conduction state between the electrode pad of the semiconductor element and the electrode of the device. The electrode pad of the semiconductor element is segmented into multiple portions and a first pad through a fourth pad uniformly arranged. A location displacement detector determines that no location displacement has occurred when the electrode pad of the semiconductor element is conductive to the electrode of the device, and determines that a location displacement has occurred when the electrode pad of the semiconductor element is non-conductive to the electrode of the device.

Abstract: To provide a light emitting module capable of reducing luminance unevenness. A light emitting module 10 includes an element substrate 11 extending in one direction, and a plurality of LEDs 12 mounted in alignment in a longitudinal direction of the element substrate 11, and an end surface 11a in the longitudinal direction of the element substrate 11 has an inclined surface 11c which is inclined with respect to an end surface 11b in a short side direction.

Abstract: To provide an electronic device that can detect an abnormality in an element with a simple configuration. An electronic device 1 includes: a first element string group 21 formed by at least one element string 211 to 21m connected in parallel, the element string 211 to 21m being formed by at least one element connected in series; a second element string group 22 formed by the element string 221 to 22n being at least one in number and connected in parallel; and an abnormality detecting unit 4 that detects an abnormality in the element string 211 to 21m and 221 to 22n forming at least one of the first element string group 21 and the second element string group 22, based on whether or not a first current I21 being the sum of current flowing through the element string 211 to 21m forming the first element string group 21 and a second current I22 being the sum of current flowing through the element string 221 to 22n forming the second element string group 22 satisfy a prescribed relationship.

Abstract: To provide a light emitting module capable of reducing luminance unevenness. A light emitting module 10 includes an element substrate 11 extending in one direction, and a plurality of LEDs 12 mounted in alignment in a longitudinal direction of the element substrate 11, and an end surface 11a in the longitudinal direction of the element substrate 11 has an inclined surface 11c which is inclined with respect to an end surface 11b in a short side direction.

Abstract: To provide an electronic device that can detect an abnormality in an element with a simple configuration. An electronic device 1 includes: a first element string group 21 formed by at least one element string 211 to 21m connected in parallel, the element string 211 to 21m being formed by at least one element connected in series; a second element string group 22 formed by the element string 221 to 22n being at least one in number and connected in parallel; and an abnormality detecting unit 4 that detects an abnormality in the element string 211 to 21m and 221 to 22n forming at least one of the first element string group 21 and the second element string group 22, based on whether or not a first current I21 being the sum of current flowing through the element string 211 to 21m forming the first element string group 21 and a second current I22 being the sum of current flowing through the element string 221 to 22n forming the second element string group 22 satisfy a prescribed relationship.