Abstract: The purpose of the present invention is to provide a cell evaluation method and a cell evaluation device that can more precisely estimate the condition of an internal short circuit, the method including: a puncture initiation step in which a metallic projection is moved at a predetermined speed in order to begin puncturing a test cell; a measurement initiation step for beginning to measure the voltage and the electrical resistance between a positive electrode terminal of the test cell and the metallic projection; and a first determination step in which, when the voltage becomes greater than a first threshold voltage V1 and the electrical resistance becomes lower than a first threshold resistance R1, the metallic projection is determined to have made contact with a negative electrode of the test cell. This cell evaluation device can be used directly in the implementation of this cell evaluation method.

Abstract: The purpose of the present invention is to provide a cell evaluation method and a cell evaluation device that can more precisely estimate the condition of an internal short circuit, the method including: a puncture initiation step in which a metallic projection is moved at a predetermined speed in order to begin puncturing a test cell; a measurement initiation step for beginning to measure the voltage and the electrical resistance between a positive electrode terminal of the test cell and the metallic projection; and a first determination step in which, when the voltage becomes greater than a first threshold voltage V1 and the electrical resistance becomes lower than a first threshold resistance R1, the metallic projection is determined to have made contact with a negative electrode of the test cell. This cell evaluation device can be used directly in the implementation of this cell evaluation method.