Abstract: Apparatuses and methods for triggering row hammer address sampling are described. An example apparatus includes an oscillator circuit configured to provide a clock signal, and a filter circuit. The filter circuit includes a control circuit configured to receive pulses of the clock signal and provide an output signal that represents a count number by counting a number of pulses of the clock signal and control a probability of enabling the output signal based on the count number. The filter circuit further includes a logic gate configured to pass one of the pulses of the clock signal responsive to the output signal from the control circuit being enabled and filter another of the pulses responsive to the output signal from the control circuit being not enabled.

Abstract: An apparatus may include an address counter to provide first address information and second address information. The first address information may include a first number of bits and the second address information may include a second number of bits that is smaller than the first number of bits. The address counter may perform a first updating operation. The first updating operation being such that the first address information is updated from a first initial value to a first final value. The address counter may also perform a second updating operation, the second updating operation being such that the second address information is updated from a second initial value to a second final value. In addition, the address counter may also perform the second updating operation at least twice per the first updating operation being performed once.

Abstract: Disclosed herein is an apparatus that includes a memory cell array, a row hammer refresh circuit configured to generate a row hammer refresh address based on an access history of the memory cell array, a redundancy circuit configured to store a plurality of defective addresses of the memory cell array, and a row pre-decoder configured to skip a refresh operation on the row hammer refresh address when the row hammer refresh address matches any one of the plurality of defective addresses.

Abstract: A laminated film containing at least a gas barrier layer and an inorganic polymer layer being laminated on a resin substrate, wherein concerning a distance from a surface of the inorganic polymer layer in a film thickness direction of the layer and the ratio of an oxygen atom to a total amount of a silicon atom, an oxygen atom, a carbon atom and a nitrogen atom, the ratio of a value of the oxygen atomic ratio in a region from a surface on a side opposite to the gas barrier layer up to 30% of a film thickness of the inorganic polymer layer in a depth direction to a value of the oxygen atomic ratio in a region from 30% of a film thickness of the inorganic polymer layer in a depth direction up to a surface on a side of the gas barrier layer is 1.05 or more.

Abstract: Apparatuses and methods for triggering row hammer address sampling are described. An example apparatus includes an oscillator circuit configured to provide a clock signal, and a filter circuit. The filter circuit includes a control circuit configured to receive pulses of the clock signal and provide an output signal that represents a count number by counting a number of pulses of the clock signal and control a probability of enabling the output signal based on the count number.

Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for generating multiple row hammer address refresh sequences. An example apparatus may include an address scrambler and a refresh control circuit. The address scrambler may receive a first address, output a second address in response to a first control signal, and output a third address in response to a second control signal. The second address may physically adjacent to the first address and the third address may physically adjacent to the second address. The refresh control circuit may perform a refresh operation on the second address when the first control signal is active and perform the refresh operation on the third address when the second control signal is active.

Abstract: Apparatuses and methods for executing row hammer (RH) refresh are described. An example apparatus includes a RH control circuit to provide a row hammer address, and a refresh control circuit to perform a RH refresh operation on a memory address array related to the RH address. The RH control circuit includes first latches each to store an old row address used to access the memory and second latches provided correspondingly to the first latches each set to a state indicating whether the old row address stored in one of the first latches is valid. The RH control circuit further including a signal generator configured to assert a sample signal when a new row address to be used to access the memory array matches the old row address stored in any one of the first latches is valid based on a state of one of the second latches.

Abstract: Apparatuses for executing row hammer refresh are described. An example apparatus includes: memory banks, each memory bank of the memory banks includes: a latch that stores a row address; and a time based sampling circuit. The time based sampling circuit includes: a sampling timing generator that provides a timing signal of sampling a row address; and a plurality of bank sampling circuits, wherein each bank sampling circuit of the bank sampling circuits is included in a corresponding memory bank of the memory banks and provides a sampling signal to the latch in the corresponding memory bank responsive to the timing signal of sampling the row address; and an interval measurement circuit that receives an oscillation signal, measures an interval of a row hammer refresh execution based on a cycle of the oscillation signal, and further provides a steal rate timing signal for adjusting a steal rate to the sampling timing generator.

Abstract: Disclosed herein is an apparatus that includes a memory cell array, a row hammer refresh circuit configured to generate a row hammer refresh address based on an access history of the memory cell array, a redundancy circuit configured to store a plurality of detective addresses of the memory cell array, and a row pre-decoder configured to skip a refresh operation on the row hammer refresh address when the row hammer refresh address matches any one of the plurality of defective addresses.

Abstract: A semiconductor device includes a first interlayer film formed on an upper surface of a substrate, a first metal wiring line, a second interlayer film, a second metal wiring line, a first via electrically connecting the first metal wiring line and the second metal wiring line, a landing pad embedded in an upper portion of the first interlayer film and penetrating the second interlayer film, and a second via penetrating the substrate and the first interlayer film from a back side of the substrate and connected to the landing pad. The lower surface position of the landing pad is different from that of the first metal wiring line.

Abstract: An apparatus may include an address counter to provide first address information and second address information. The first address information may include a first number of bits and the second address information may include a second number of bits that is smaller than the first number of bits. The address counter may perform a first updating operation. The first updating operation being such that the first address information is updated from a first initial value to a first final value. The address counter may also perform a second updating operation, the second updating operation being such that the second address information is updated from a second initial value to a second final value. In addition, the address counter may also perform the second updating operation at least twice per the first updating operation being performed once.

Abstract: A semiconductor device according to an aspect of the present invention has: a plurality of memory cells MC; a plurality of word lines WL each coupled to a corresponding one of the plurality of memory cells MC; and a control circuit that intermittently monitors accesses to the plurality of word lines WL, stores/erases some captured row-addresses in a first number of registers, and detects, by comparison with stored addresses, in response to a first number of accesses to one of the word lines WL in a first period of time. According to the present invention, access histories can be precisely analyzed by a small-scale circuit configuration, and measures against, for example, the Row Hammer problem, etc. can be taken.

Abstract: Apparatuses and methods for executing row hammer (RH) refresh are described. An example apparatus includes a RH control circuit to provide a row hammer address, and a refresh control circuit to perform a RH refresh operation on a memory address array related to the RH address. The RH control circuit includes first latches each to store an old row address used to access the memory and second latches provided correspondingly to the first latches each set to a state indicating whether the old row address stored in one of the first latches is valid. The RH control circuit further including a signal generator configured to assert a sample signal when a new row address to be used to access the memory array matches the old row address stored in any one of the first latches is valid based on a state of one of the second latches.

Abstract: The invention provides a gas barrier laminated film having high impact resistance when a heterolayer is formed on a thin film layer. The laminated film includes a flexible substrate and a thin film layer formed on at least one surface of the substrate, wherein the thin film layer contains Si, O, and C, and the ratio of the number of carbon atoms to the number of silicon atoms which is calculated using peaks each corresponding to each binding energy of 2p of Si, 1s of O, 1s of N, and 1s of C obtained from wide scan spectrums is in the range defined by the following formula (1) when the surface of the thin film layer is subjected to X-ray photoelectron spectrometry, and a intensity ratio of a peak intensity (I2) at 1240 to 1290 cm?1 to a peak intensity (I1) at 950 to 1050 cm?1 is in the range defined by the following formula (2) when the surface of the thin film layer is measured by an ATR method in infrared spectrometry: 0.01<C/Si?0.02??(1) 0.01?I2/I1<0.05??(2).

Abstract: Apparatuses and methods for executing row hammer (RH) refresh are described. An example apparatus includes a RH control circuit to provide a row hammer address, and a refresh control circuit to perform a RH refresh operation on a memory address array related to the RH address. The RH control circuit includes first latches each to store an old row address used to access the memory and second latches provided correspondingly to the first latches each set to a state indicating whether the old row address stored in one of the first latches is valid. The RH control circuit further including a signal generator configured to assert a sample signal when a new row address to be used to access the memory array matches the old row address stored in any one of the first latches is valid based on a state of one of the second latches.

Abstract: Semiconductor memory testing devices and methods are disclosed. In one respect, a device is disclosed that includes a first memory cell array having a first bit-line and a plurality of first memory cells coupled to the first bit-line; a second memory cell array having a second bit-line and a plurality of second memory cells coupled to the second bit-line, the number of second memory cells being smaller than that of the first memory cells; a sense amplifier coupled to the first bit-line and a first end of the second bit-line; a word decoder configured to operate the second memory cells responsive to a first test signal; and a transistor coupled to a second end of the second bit-line and operated by a second test signal.

Abstract: A semiconductor device according to an aspect of die present invention has: a plurality of memory cells MC; a plurality of word lines WL each coupled to a corresponding one of the plurality of memory cells MC; and a control circuit that intermittently monitors accesses to, the plurality of word lines WL, stores/erases some captured row-addresses in a first number of registers, and detects, by comparison with stored addresses, in response to a first number of accesses to one of the word lines WL a first period of time. According to the present invention, access histories can be precisely analyzed by a small-scale circuit configuration, and measures against, for example, the Row Hammer problem, etc. can be taken.

Abstract: Apparatuses for executing row hammer refresh are described. An example apparatus includes: memory banks, each memory bank of the memory banks includes: a latch that stores a row address; and a time based sampling circuit. The time based sampling circuit includes: a sampling timing generator that provides a timing signal of sampling a row address; and a plurality of bank sampling circuits, wherein each bank sampling circuit of the bank sampling circuits is included in a corresponding memory bank of the memory banks and provides a sampling signal to the latch in the corresponding memory bank responsive to the timing signal of sampling the row address; and an interval measurement circuit that receives an oscillation signal, measures an interval of a row hammer refresh execution based on a cycle of the oscillation signal, and further provides a steal rate timing signal for adjusting a steal rate to the sampling timing generator.

Abstract: Apparatuses for executing interrupt refresh are described. An example apparatus includes: memory banks, a sampling timing generator circuit, bank sampling circuits and a command state signal generator circuit that provides a command state signal responsive to a command. Each memory bank includes a latch that stores an address for interrupt refresh. The sampling timing generator circuit receives an oscillation signal and provides a trigger signal of sampling the address. Each bank sampling circuit is associated with a corresponding memory bank. Each bank sampling circuit provides a sampling signal to the latch in the corresponding memory bank responsive to the trigger signal of sampling the address. The sampling timing generator circuit provides the trigger signal of sampling the address, responsive, at least in part, to the command state signal, and the latch stores the address, responsive, at least in part, to the at least one trigger signal of sampling the address.

Abstract: Apparatuses for executing row hammer refresh are described. An example apparatus includes: memory banks, each memory bank of the memory banks includes: a latch that stores a row address; and a time based sampling circuit. The time based sampling circuit includes: a sampling timing generator that provides a timing signal of sampling a row address; and a plurality of bank sampling circuits, wherein each bank sampling circuit of the bank sampling circuits is included in a corresponding memory bank of the memory banks and provides a sampling signal to the latch in the corresponding memory bank responsive to the timing signal of sampling the row address; and an interval measurement circuit that receives an oscillation signal, measures an interval of a row hammer refresh execution based on a cycle of the oscillation signal, and further provides a steal rate timing signal for adjusting a steal rate to the sampling timing generator.