Patents by Inventor Yutaka Kuriyama

Yutaka Kuriyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10444008
    Abstract: In a spherical shape measurement method for measuring a surface shape, a sphere to be measured is made freely rotatable. The partial spherical shape of each measurement area, which is established so as to have an area overlapping with another measurement area adjacent to each other, is measured at each rotation position, and the surface shape is measured by joining the partial spherical shapes of the measurement areas by a stitching operation based on the shape of the overlapping area. In the state of detaching the sphere from the sphere hold mechanism to which the sphere is freely attachable and detachable, the sphere support table holds the sphere. The sphere is re-held at a different position, so that the shape of the entire sphere can be measured with high accuracy.
    Type: Grant
    Filed: July 15, 2015
    Date of Patent: October 15, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Takeshi Hagino, Yuichiro Yokoyama, Yutaka Kuriyama
  • Patent number: 10415949
    Abstract: A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: September 17, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Yutaka Kuriyama, Nobuhiro Ishikawa
  • Patent number: 10393495
    Abstract: A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. The detection element is disposed in one of the two supporting members that is farthest away from a rotational center position of rotation generated in the stylus when a measuring force is applied to the contact part from a direction perpendicular to the axial direction, to detect a strain amount of the one of the two supporting members.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: August 27, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Yutaka Kuriyama, Nobuhiro Ishikawa
  • Patent number: 10352678
    Abstract: A measurement target and a reference gauge are placed in parallel in an inside of a temperature-controlled chamber. After an interior temperature of the temperature-controlled chamber is set at a first temperature, a relative measurement of a length from a first surface to a second surface of the measurement target is performed with reference to a length from a first reference surface to a second reference surface of the reference gauge. Then, the interior temperature of the temperature-controlled chamber is set at a second temperature and a relative measurement of the length from the first surface to the second surface is similarly performed with reference to the length from the first reference surface to the second reference surface. A CTE of the measurement target is calculated based on the length of the measurement target at the first temperature and the length of the measurement target at the second temperature.
    Type: Grant
    Filed: September 21, 2016
    Date of Patent: July 16, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Yuichiro Yokoyama, Takeshi Hagino, Yutaka Kuriyama
  • Publication number: 20170248402
    Abstract: A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.
    Type: Application
    Filed: February 23, 2017
    Publication date: August 31, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Satoshi KOGA, Akinori SAITO, Hiroyuki KANAMORI, Yutaka KURIYAMA, Nobuhiro ISHIKAWA
  • Publication number: 20170248400
    Abstract: A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. The detection element is disposed in one of the two supporting members that is farthest away from a rotational center position of rotation generated in the stylus when a measuring force is applied to the contact part from a direction perpendicular to the axial direction, to detect a strain amount of the one of the two supporting members.
    Type: Application
    Filed: February 23, 2017
    Publication date: August 31, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Satoshi KOGA, Akinori SAITO, Hiroyuki KANAMORI, Yutaka KURIYAMA, Nobuhiro ISHIKAWA
  • Publication number: 20170089683
    Abstract: A measurement target and a reference gauge are placed in parallel in an inside of a temperature-controlled chamber. After an interior temperature of the temperature-controlled chamber is set at a first temperature, a relative measurement of a length from a first surface to a second surface of the measurement target is performed with reference to a length from a first reference surface to a second reference surface of the reference gauge. Then, the interior temperature of the temperature-controlled chamber is set at a second temperature and a relative measurement of the length from the first surface to the second surface is similarly performed with reference to the length from the first reference surface to the second reference surface. A CTE of the measurement target is calculated based on the length of the measurement target at the first temperature and the length of the measurement target at the second temperature.
    Type: Application
    Filed: September 21, 2016
    Publication date: March 30, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Yuichiro YOKOYAMA, Takeshi HAGINO, Yutaka KURIYAMA
  • Patent number: 9297631
    Abstract: A spherical-form measuring apparatus includes a turntable 5, a holding unit 10 for holding the sphere 20, and a probe 6 for measuring a contour of a sphere part 22 of the sphere 20. The holding unit 10 includes a base part 12, a vertical holding part 14 and an inclined holding part 16 which are placed at separate positions on the base part 12. The vertical holding part 14 holds the stem part 24 of the sphere 20 with it set in a direction perpendicular to the turntable 5. The inclined holding part 16 holds the stem part 24 with it set in a direction at an angle. The vertical and inclined holding part 14, 16 are disposed such that their axial lines meet at an intersection point P and such that the distance from the point P to the vertical holding part 14 agrees with the distance from the point P to the inclined holding part 16.
    Type: Grant
    Filed: November 14, 2013
    Date of Patent: March 29, 2016
    Assignee: MITUTOYO CORPORATION
    Inventors: Takeshi Hagino, Yuichiro Yokoyama, Yutaka Kuriyama
  • Publication number: 20160018215
    Abstract: In a spherical shape measurement method for measuring a surface shape, a sphere to be measured is made freely rotatable. The partial spherical shape of each measurement area, which is established so as to have an area overlapping with another measurement area adjacent to each other, is measured at each rotation position, and the surface shape is measured by joining the partial spherical shapes of the measurement areas by a stitching operation based on the shape of the overlapping area. In the state of detaching the sphere from the sphere hold mechanism to which the sphere is freely attachable and detachable, the sphere support table holds the sphere. The sphere is re-held at a different position, so that the shape of the entire sphere can be measured with high accuracy.
    Type: Application
    Filed: July 15, 2015
    Publication date: January 21, 2016
    Inventors: Takeshi Hagino, Yuichiro Yokoyama, Yutaka Kuriyama
  • Publication number: 20150226538
    Abstract: A grazing incidence interferometer includes: a graduated instrument showing an index at an overlapping area where adjacent ones of measurement areas overlap with each other; and a measuring unit including: an image acquiring unit that acquires interference fringe images at image-capturing positions for the measurement areas, individually, the interference fringe images each showing each of the measurement areas and the index; and a profile computing unit that combines measurement results based on the interference fringe images of the adjacent ones of the measurement areas in a manner that images of the index included in common in the interference fringe images of the adjacent ones of the measurement areas are superimposed on each other.
    Type: Application
    Filed: February 9, 2015
    Publication date: August 13, 2015
    Applicant: MITUTOYO CORPORATION
    Inventors: Reiya OTAO, Yutaka KURIYAMA
  • Patent number: 8913250
    Abstract: A grazing incidence interferometer includes a light source, a light beam divider configured to divide original light coming from the light source, an illuminator configured to apply measurement light to a measurement subject, a light beam combining module configured to combine the measurement light reflected from the measurement subject with reference light, and a photodetector configure to detect a combined light beam. The grazing incidence interferometer includes an interferometer main body, a stage configured to hold the measurement subject, a moving mechanism capable of moving the interferometer main body along the measurement subject, and an auxiliary reflector disposed on an extension of an axis of movement of the interferometer main body, an auxiliary light beam separator configured to separate auxiliary light from the original light and to apply the auxiliary light to the auxiliary reflector, and an auxiliary photodetector configured to detect the auxiliary light reflected by the auxiliary reflector.
    Type: Grant
    Filed: June 18, 2012
    Date of Patent: December 16, 2014
    Assignee: Mitutoyo Corporation
    Inventors: Reiya Ootao, Yutaka Kuriyama
  • Patent number: 8879068
    Abstract: An abscissa calibration jig of a laser interference measuring apparatus, includes: an image projection unit configured to project an image with a marker; a first support mechanism configured to rotatably support the image projection unit around a first rotation axis passing a predetermined rotation center; and a second support mechanism configured to rotatably support the first support mechanism around a second rotation axis crossing the first rotation axis at the rotation center.
    Type: Grant
    Filed: July 20, 2012
    Date of Patent: November 4, 2014
    Assignee: Mitutoyo Corporation
    Inventors: Takeshi Hagino, Yuichiro Yokoyama, Yutaka Kuriyama
  • Publication number: 20140130363
    Abstract: A spherical-form measuring apparatus includes a turntable 5, a holding unit 10 for holding the sphere 20, and a probe 6 for measuring a contour of a sphere part 22 of the sphere 20. The holding unit 10 includes a base part 12, a vertical holding part 14 and an inclined holding part 16 which are placed at separate positions on the base part 12. The vertical holding part 14 holds the stem part 24 of the sphere 20 with it set in a direction perpendicular to the turntable 5. The inclined holding part 16 holds the stem part 24 with it set in a direction at an angle. The vertical and inclined holding part 14, 16 are disposed such that their axial lines meet at an intersection point P and such that the distance from the point P to the vertical holding part 14 agrees with the distance from the point P to the inclined holding part 16.
    Type: Application
    Filed: November 14, 2013
    Publication date: May 15, 2014
    Applicant: Mitutoyo Corporation
    Inventors: Takeshi Hagino, Yuichiro Yokoyama, Yutaka Kuriyama
  • Patent number: 8441650
    Abstract: A grazing incidence interferometer includes: a beam splitting section configured to split a beam from a beam source section into a measuring beam emergent to a measurement surface and a reference beam serving as a measurement reference, and configured to cause the measuring beam to emerge obliquely to the measurement surface; a beam combining part configured to combine the reference beam and the measuring beam reflected at the measurement surface, to obtain a combined beam; a detecting section configured to detect a profile of the measurement surface based on an interference fringe formed by the combined beam; and an image inverting part configured to invert an orientation of a wave front of the measuring beam or the reference beam, the image inverting part being provided in an optical path of the measuring beam or the reference beam leading from the beam splitting section to the beam combining section.
    Type: Grant
    Filed: August 4, 2010
    Date of Patent: May 14, 2013
    Assignee: Mitutoyo Corporation
    Inventors: Yutaka Kuriyama, Reiya Ootao
  • Patent number: 8379222
    Abstract: A Fizeau interferometer includes: a reference spherical surface; and a measuring apparatus including an intensity obtaining section and a form calculating section, wherein: a focal point of the reference spherical surface is aligned with a center of curvature of the spherical surface in order to set the center of curvature as a center position, and two positions equidistant from the center position are set as a start position and an end position, the intensity obtaining section obtains the intensity maps of the interferograms at n positions at equal intervals; and the form calculating section measures the form of the spherical surface using a phase analysis method in which a coefficient of the intensity maps of the interferograms at an i-th position and a coefficient of the intensity maps of the interferograms at an (n?i+1)th position have a same value.
    Type: Grant
    Filed: December 8, 2010
    Date of Patent: February 19, 2013
    Assignee: Mitutoyo Corporation
    Inventors: Takeshi Hagino, Yuichiro Yokoyama, Yutaka Kuriyama
  • Publication number: 20130021614
    Abstract: An abscissa calibration jig of a laser interference measuring apparatus, includes: an image projection unit configured to project an image with a marker; a first support mechanism configured to rotatably support the image projection unit around a first rotation axis passing a predetermined rotation center; and a second support mechanism configured to rotatably support the first support mechanism around a second rotation axis crossing the first rotation axis at the rotation center.
    Type: Application
    Filed: July 20, 2012
    Publication date: January 24, 2013
    Applicant: MITUTOYO CORPORATION
    Inventors: Takeshi HAGINO, Yuichiro YOKOYAMA, Yutaka KURIYAMA
  • Publication number: 20120327425
    Abstract: A grazing incidence interferometer includes a light source, a light beam divider configured to divide original light coming from the light source, an illuminator configured to apply measurement light to a measurement subject, a light beam combining module configured to combine the measurement light reflected from the measurement subject with reference light, and a photodetector configure to detect a combined light beam. The grazing incidence interferometer includes an interferometer main body, a stage configured to hold the measurement subject, a moving mechanism capable of moving the interferometer main body along the measurement subject, and an auxiliary reflector disposed on an extension of an axis of movement of the interferometer main body, an auxiliary light beam separator configured to separate auxiliary light from the original light and to apply the auxiliary light to the auxiliary reflector, and an auxiliary photodetector configured to detect the auxiliary light reflected by the auxiliary reflector.
    Type: Application
    Filed: June 18, 2012
    Publication date: December 27, 2012
    Applicant: MITUTOYO CORPORATION
    Inventors: Reiya OOTAO, Yutaka KURIYAMA
  • Publication number: 20110134437
    Abstract: A Fizeau interferometer includes: a reference spherical surface; and a measuring apparatus including an intensity obtaining section and a form calculating section, wherein: a focal point of the reference spherical surface is aligned with a center of curvature of the spherical surface in order to set the center of curvature as a center position, and two positions equidistant from the center position are set as a start position and an end position, the intensity obtaining section obtains the intensity maps of the interferograms at n positions at equal intervals; and the form calculating section measures the form of the spherical surface using a phase analysis method in which a coefficient of the intensity maps of the interferograms at an i-th position and a coefficient of the intensity maps of the interferograms at an (n?i+1)th position have a same value.
    Type: Application
    Filed: December 8, 2010
    Publication date: June 9, 2011
    Applicant: MITUTOYO CORPORATION
    Inventors: Takeshi Hagino, Yuichiro Yokoyama, Yutaka Kuriyama
  • Publication number: 20110032536
    Abstract: A grazing incidence interferometer includes: a beam splitting section configured to split a beam from a beam source section into a measuring beam emergent to a measurement surface and a reference beam serving as a measurement reference, and configured to cause the measuring beam to emerge obliquely to the measurement surface; a beam combining part configured to combine the reference beam and the measuring beam reflected at the measurement surface, to obtain a combined beam; a detecting section configured to detect a profile of the measurement surface based on an interference fringe formed by the combined beam; and an image inverting part configured to invert an orientation of a wave front of the measuring beam or the reference beam, the image inverting part being provided in an optical path of the measuring beam or the reference beam leading from the beam splitting section to the beam combining section.
    Type: Application
    Filed: August 4, 2010
    Publication date: February 10, 2011
    Applicant: MITUTOYO CORPORATION
    Inventors: Yutaka Kuriyama, Reiya Ootao
  • Patent number: 7882891
    Abstract: A precision surface plate has a hollow casing with a reference plane used as a surface on which either or both of a workpiece and mechanical equipment are placed, a honeycomb structure, which is a collection of substantially identically-shaped enclosed cells disposed inside the casing, and a heat transfer device provided in the honeycomb structure to allow cells of the honeycomb structure to communicate with each other and transfer heat. The precision surface plate further includes casing ventilation openings provided in a wall of the casing to allow cells of the honeycomb structure inside the casing to communicate with the outside of the casing, and a shutter for opening and closing the casing ventilation openings. The heat is transferred effectively between the cells of the honeycomb structure through the heat transfer device.
    Type: Grant
    Filed: May 9, 2006
    Date of Patent: February 8, 2011
    Assignee: Mitutoyo Corporation
    Inventor: Yutaka Kuriyama