Patents by Inventor Yutaka Ochiai
Yutaka Ochiai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7286642Abstract: A maximum tube voltage value setting module 240a, a warming-up module 240b, a limit tube voltage control module 240c, a limit tube current control module 240d and a focus grid electrode control module 240e of an operation program 240 which respectively correspond to different maximum tube voltage values are stored in storage sections 32a-e of an X-ray tube control apparatus 3. When the maximum tube voltage value of an X-ray tube 1 is changed, an extraction section 34 extracts each module of the operation program 240 which corresponds to the maximum tube voltage value after being changed from the storage sections 32a-e. A communications section 36 sends the operation program 240 comprised of each extracted module to an X-ray tube controller 2 and overwrites it in a memory section 24.Type: GrantFiled: April 4, 2003Date of Patent: October 23, 2007Assignee: Hamamatsu Photonics K.K.Inventors: Masayoshi Ishikawa, Takane Yokoi, Tsutomu Nakamura, Yutaka Ochiai, Kinji Takase
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Patent number: 7212610Abstract: An initial image (the image of a slit plate 5 imaged when adjusted to an optimal focal diameter) is stored in a storage section 72 of an X-ray tube adjusting apparatus 7. An acquisition section 74 acquires a test image (the image of the slit plate 5 imaged at the time of adjusting the focal diameter). A presentation section 76 presents the initial image and an image representing the luminance on the initial image (showing a contrast ?a between a slit portion 764a and a residual area portion 766a in the initial image) and the test image and an image representing the luminance on the test image (showing a contrast ?b between a slit portion 764b and a residual area portion 766b in the initial image) simultaneously (in a comparable manner).Type: GrantFiled: April 4, 2003Date of Patent: May 1, 2007Assignee: Hamamatsu Photonics K.K.Inventors: Masayoshi Ishikawa, Takane Yokoi, Tsutomu Nakamura, Yutaka Ochiai, Kinji Takase
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Patent number: 7106829Abstract: An x-ray emitting window is formed at a front end face, and a taper surface tilted with respect to the x-ray emitting direction is formed near the emitting window, whereby an object to be inspected can be prevented from abutting against the front end face even if the object is pivoted about an axis intersecting the emitting direction while the object is disposed closer to the x-ray emitting window. As a consequence, while the object is disposed closer to the x-ray emitting position, the orientation of the object can be changed. Therefore, when inspecting the internal structure of the object and the like by irradiating the object with x-rays and detecting the x-rays transmitted through the object, not only a magnified penetration image of the object with a high magnification rate is obtained, but also the internal structure of the object and the like can be verified in detail by changing the orientation of the object.Type: GrantFiled: January 26, 2005Date of Patent: September 12, 2006Assignee: Hamamatsu Photonics K.K.Inventors: Yutaka Ochiai, Tutomu Inazuru
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Publication number: 20060153335Abstract: A maximum tube voltage value setting module 240a, a warming-up module 240b, a limit tube voltage control module 240c, a limit tube current control module 240d and a focus grid electrode control module 240e of an operation program 240 which respectively correspond to different maximum tube voltage values are stored in storage sections 32a-e of an X-ray tube control apparatus 3. When the maximum tube voltage value of an X-ray tube 1 is changed, an extraction section 34 extracts each module of the operation program 240 which corresponds to the maximum tube voltage value after being changed from the storage sections 32a-e. A communications section 36 sends the operation program 240 comprised of each extracted module to an X-ray tube controller 2 and overwrites it in a memory section 24.Type: ApplicationFiled: April 4, 2003Publication date: July 13, 2006Inventors: Masayoshi Ishikawa, Takane Yokoi, Tsutomu Nakamura, Yutaka Ochiai
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Publication number: 20060067477Abstract: An initial image (the image of a slit plate 5 imaged when adjusted to an optimal focal diameter) is stored in a storage section 72 of an X-ray tube adjusting apparatus 7. An acquisition section 74 acquires a test image (the image of the slit plate 5 imaged at the time of adjusting the focal diameter). A presentation section 76 presents the initial image and an image representing the luminance on the initial image (showing a contrast ?a between a slit portion 764a and a residual area portion 766a in the initial image) and the test image and an image representing the luminance on the test image (showing a contrast Ab between a slit portion 764b and a residual area portion 766b in the initial image) simultaneously (in a comparable manner).Type: ApplicationFiled: April 4, 2003Publication date: March 30, 2006Inventors: Masayoshi Ishikawa, Takane Yokoi, Tsutomu Nakamura, Yutaka Ochiai, Kinji Takase
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Publication number: 20060008053Abstract: An X-ray tube controller measures operation information (filament power supply time in an X-ray tube and a grid voltage value applied to grid electrodes to maintain the tube current value under a predetermined tube voltage). The information is transmitted to an X-ray tube operation information acquiring unit via a communication line. In a storage section of the information acquiring unit, a database written with degree of attrition corresponding to the integrated power supply time of a filament (reduction ratio of thermalelectron emission amount (tube current value at a predetermined G1 voltage) to the initial value (thermalelectron emission amount when the filament is first used) is stored. An attrition degree determination section determines the degree of attrition of the filament from the count of filament power supply time with reference to the database. Also, the attrition degree determination section determines the end of life from the G1 voltage value.Type: ApplicationFiled: April 24, 2003Publication date: January 12, 2006Inventors: Masayoshi Ishikawa, Takane Yokoi, Tsutomu Nakamura, Yutaka Ochiai, Kinji Takase
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Publication number: 20050147207Abstract: An x-ray emitting window is formed at a front end face, and a taper surface tilted with respect to the x-ray emitting direction is formed near the emitting window, whereby an object to be inspected can be prevented from abutting against the front end face even if the object is pivoted about an axis intersecting the emitting direction while the object is disposed closer to the x-ray emitting window. As a consequence, while the object is disposed closer to the x-ray emitting position, the orientation of the object can be changed. Therefore, when inspecting the internal structure of the object and the like by irradiating the object with x-rays and detecting the x-rays transmitted through the object, not only a magnified penetration image of the object with a high magnification rate is obtained, but also the internal structure of the object and the like can be verified in detail by changing the orientation of the object.Type: ApplicationFiled: January 26, 2005Publication date: July 7, 2005Inventors: Yutaka Ochiai, Tutomu Inazuru
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Patent number: 6856671Abstract: An x-ray emitting window is formed at a front end face, and a taper surface tilted with respect to the x-ray emitting direction is formed near the emitting window, whereby an object to be inspected can be prevented from abutting against the front end face even if the object is pivoted about an axis intersecting the emitting direction while the object is disposed closer to the x-ray emitting window. As a consequence, while the object is disposed closer to the x-ray emitting position, the orientation of the object can be changed. Therefore, when inspecting the internal structure of the object and the like by irradiating the object with x-rays and detecting the x-rays transmitted through the object, not only a magnified penetration image of the object with a high magnification rate is obtained, but also the internal structure of the object and the like can be verified in detail by changing the orientation of the object.Type: GrantFiled: November 18, 2002Date of Patent: February 15, 2005Assignee: Hamamatsu Photonics K.K.Inventors: Yutaka Ochiai, Tutomu Inazuru
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Patent number: 6639969Abstract: For eliminating a high-tension cable in order to improve the handling, the open type X-ray generating apparatus (1) in accordance with the present invention employs a mold power unit in which a high-voltage generating part, a grid connecting line, and a filament connecting line which attain a high voltage are molded with a resin, whereas the mold power unit is secured to the proximal end side of a tubular portion (2), whereby an apparatus of a type integrated with a power supply is realized. Since the high-voltage generating part, grid connecting line, and filament connecting line are confined within the resin mold as such, the degree of freedom in structure of the high-voltage generating part and the degree of freedom in bending the lines improve remarkably.Type: GrantFiled: April 26, 2002Date of Patent: October 28, 2003Assignee: Hamamatsu Photonics K.K.Inventors: Yutaka Ochiai, Kinji Takase
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Patent number: 6600809Abstract: A nondestructive inspection apparatus with integrated power supply comprises a molded power supply section (14) having a resin-molded high voltage (e.g. 160 kV) generating section (15) secured to the base of a tubular section (2). The durability and handlability are improved by omitting a high voltage cable. Since the high voltage generating section (15) is confined in a molding resin, the degree of freedom in the arrangement of the high voltage generating section (15) within the mold is enhanced significantly. Furthermore, an X-ray generating unit (1) can be installed stably in the nondestructive inspection apparatus (70) by disposing the heavy molded power supply section (14) under a target (10).Type: GrantFiled: April 29, 2002Date of Patent: July 29, 2003Assignee: Hamamatsu Photonics K.K.Inventor: Yutaka Ochiai
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Publication number: 20030068013Abstract: An x-ray emitting window is formed at a front end face, and a taper surface tilted with respect to the x-ray emitting direction is formed near the emitting window, whereby an object to be inspected can be prevented from abutting against the front end face even if the object is pivoted about an axis intersecting the emitting direction while the object is disposed closer to the x-ray emitting window. As a consequence, while the object is disposed closer to the x-ray emitting position, the orientation of the object can be changed. Therefore, when inspecting the internal structure of the object and the like by irradiating the object with x-rays and detecting the x-rays transmitted through the object, not only a magnified penetration image of the object with a high magnification rate is obtained, but also the internal structure of the object and the like can be verified in detail by changing the orientation of the object.Type: ApplicationFiled: November 18, 2002Publication date: April 10, 2003Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Yutaka Ochiai, Tutomu Inazuru
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Patent number: 6490341Abstract: An x-ray emitting window is formed at a front end face, and a taper surface tilted with respect to the x-ray emitting direction is formed near the emitting window, whereby an object to be inspected can be prevented from abutting against the front end face even if the object is pivoted about an axis intersecting the emitting direction while the object is disposed closer to the x-ray emitting window. As a consequence, while the object is disposed closer to the x-ray emitting position, the orientation of the object can be changed. Therefore, when inspecting the internal structure of the object and the like by irradiating the object with x-rays and detecting the x-rays transmitted through the object, not only a magnified penetration image of the object with a high magnification rate is obtained, but also the internal structure of the object and the like can be verified in detail by changing the orientation of the object.Type: GrantFiled: August 4, 2000Date of Patent: December 3, 2002Assignee: Hamamatsu Photonics K.K.Inventors: Yutaka Ochiai, Tutomu Inazuru
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Publication number: 20020168050Abstract: For eliminating a high-tension cable in order to improve the handling, the open type X-ray generating apparatus (1) in accordance with the present invention employs a mold power unit in which a high-voltage generating part, a grid connecting line, and a filament connecting line which attain a high voltage are molded with a resin, whereas the mold power unit is secured to the proximal end side of a tubular portion (2), whereby an apparatus of a type integrated with a power supply is realized. Since the high-voltage generating part, grid connecting line, and filament connecting line are confined within the resin mold as such, the degree of freedom in structure of the high-voltage generating part and the degree of freedom in bending the lines improve remarkably.Type: ApplicationFiled: April 26, 2002Publication date: November 14, 2002Inventors: Yutaka Ochiai, Kinji Takase
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Patent number: 5517545Abstract: This invention aims at providing an X-ray apparatus having a stable X-ray output. Since the focus electrode of the X-ray tube of the X-ray apparatus according to this invention maintains a ground potential, the focus diameter of electrons bombarded against a target becomes constant. Hence, the X-ray output emerging from an exit window is stabilized. Since the potential ratio of a cathode to the target is always constant, the electric field distribution between the cathode and the target is stabilized, thereby stabilizing the X-ray output emerging from the exit window.Type: GrantFiled: July 15, 1994Date of Patent: May 14, 1996Assignee: Hamamatsu Photonics K.K.Inventors: Tsutomu Nakamura, Takane Yokoi, Yutaka Ochiai, Mitsumasa Furukawa, Hiroki Kawakami, Tadaoki Matsushita, Harumoto Sawada, Toshihiro Suzuki