Patents by Inventor Yutaka Sakurai
Yutaka Sakurai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11953631Abstract: A scintillator panel includes a substrate made of an organic material, a barrier layer formed on the substrate and including thallium iodide as a main component, and a scintillator layer formed on the barrier layer and including cesium iodide as a main component. According to this scintillator panel, moisture resistance can be improved by providing the barrier layer between the substrate and the scintillator layer.Type: GrantFiled: November 10, 2022Date of Patent: April 9, 2024Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Keisuke Goto, Kazuhiro Shirakawa, Hidenori Jonishi, Masashi Hatanaka, Haruki Yamaji, Jun Sakurai, Yutaka Kusuyama
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Publication number: 20240069297Abstract: In an optical fiber cable in which an optical fiber ribbon formed by parallelly arranging a plurality of optical fibers is packaged in an internal space, a core portion of each optical fiber is made of pure quartz and an effective cross-sectional area of the core portion at a wavelength of 1,550 nm is 110 ?m2 or more and 150 ?m2 or less. The optical fiber ribbon is an optical fiber ribbon in which the optical fibers are connected by continuously applying an adhesive resin between adjacent optical fibers. An occupation ratio of the optical fiber ribbon to the internal space calculated from a ratio of a cross-sectional area of the internal space to a cross-sectional area of the packaged optical fiber ribbon is 25% or more and 55% or less.Type: ApplicationFiled: November 10, 2021Publication date: February 29, 2024Inventors: Yutaka HASHIMOTO, Fumiaki SATO, Masashi KIKUCHI, Akira SAKURAI, Yusuke YAMADA
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Patent number: 5526698Abstract: A capacitance type electromagnetic flowmeter whose output is relatively free from fluctuations caused by external vibrations has a flow tube supported in a casing member by means of members having elasticity and viscosity (e.g., O-rings). Magnetic parts such as coils and a core are fixed to the casing member so as to define a space therewith, and protective rings are kept liquid-tight with respect to the flow tube by O-rings interposed therebetween. The equivalent mass of the flowmeter section vibrating integrally with the flow tube is reduced to increase the resonance frequency. Further, since the flow tube is insulated from vibrations of the protective rings, the flow is less subject to vibrations, thereby decreasing fluctuations in output due to external vibrations.Type: GrantFiled: September 28, 1993Date of Patent: June 18, 1996Assignee: Hitachi, Ltd.Inventors: Yutaka Sakurai, Tamio Ishihara
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Patent number: 5469746Abstract: An electromagnetic flow meter for industries includes a transducer and a signal processor provided separately from the transducer. The transducer having an exciting circuit, an amplifying and calculating part and a transmitting part outputs an analog flow rate signal and digital signals which are superimposed to the an analog flow rate signal to the signal processor. The analog signal sent to the signal processor is passed through the signal processor without receiving any signal processing and the digital signals are sent into the transducer or taken into the signal processor through alternating current coupling means. The data transmission is diagnosed by checking the conformity between the data stored in the signal sending part and the received data. Data set in a data setting part provided in the signal processor are sent to the transducer through a transmitting cable in which the flow rate data are also transmitted.Type: GrantFiled: March 21, 1994Date of Patent: November 28, 1995Assignee: Hitachi, Ltd.Inventors: Masao Fukunaga, Yutaka Sakurai, Kouji Saito, Tamio Ishihara
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Patent number: 5458003Abstract: An electromagnetic flow meter comprises a ceramic measuring pipe formed into a straight cylinder through which fluid to be measured flows, electromagnetic field generating device disposed adjacent to a central portion of an outer surface of the central portion of the ceramic measuring pipe for generating an electromagnetic field into a radial direction of the ceramic measuring pipe, electrodes for detecting an electric potential generated in the fluid, a case which accommodates the ceramic measuring pipe, the electromagnetic field generating device and the electrodes, and sealing members which are disposed between inner surfaces of the flanges of the case and ends of outer circumference of the ceramic measuring pipe. The case has a length longer than that of the ceramic measuring pipe and flanges at both ends thereof. Inner diameters of the flanges are slightly larger than an outer diameter of the ceramic measuring pipe.Type: GrantFiled: November 30, 1992Date of Patent: October 17, 1995Assignees: Hitachi, Ltd., Hitachi Instrument Engineering Co, Ltd.Inventors: Tamio Ishihara, Yutaka Sakurai, Masao Fukunaga, Shigeo Nishino, Souzo Fujimoto
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Patent number: 5400659Abstract: An electromagnetic flowmeter comprises a ceramic measuring tube through which fluid to be measured flows, a pair of electromagnetic coils disposed on the outer surface of the measuring tube in the central region thereof at diametrically opposite positions and generating a magnetic field in a direction perpendicular to the direction of flow of the fluid, a pair of measuring electrodes fixed to the outer surface of the measuring tube in the central region thereof at diametrically opposite positions and having electrode axes perpendicular to both the direction of flow of the fluid and the direction of the magnetic field, and a pair of metallic shields fixed to the outer surface of the measuring tube in surrounding relation to the measuring electrodes. A pair of the measuring electrodes and a pair of the metallic shields are fixed to the ceramic measuring tube by a reaction product due to an interface reaction with the ceramic measuring tube under heating.Type: GrantFiled: February 2, 1993Date of Patent: March 28, 1995Assignee: Hitachi, Ltd.Inventors: Kazuaki Yokoi, Masatsugu Arai, Akiomi Kohno, Yuji Yoshitomi, Yutaka Sakurai, Tamio Ishihara
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Patent number: 5307687Abstract: An electromagnetic flowmeter for measuring the flow rate of a fluid. The flowmeter has a measuring tube made of ceramics and defining a fluid passage therein for the fluid, electrodes having ends exposed to an interior of the measuring tube through holes which are formed in a wall of the measuring tube, a magnetic field generating device disposed around the electrodes, and a case encasing the measuring tube, the electrodes and the magnetic field generating means. A ratio t/R between a wall thickness t and a mean radius R of the measuring tube is determined such that stress generated in the measuring tube by the fluid in the measuring tube does not exceed the rupture stress of the measuring tube. The measuring tube can have flanges on both axial ends thereof, a radial height of the flange from an outer surface of the measuring tube is not greater than the wall thickness of the tube when the tube is made of Al.sub.2 O.sub.Type: GrantFiled: May 29, 1992Date of Patent: May 3, 1994Assignee: Hitachi, Ltd.Inventors: Masatsugu Arai, Akiomi Kohno, Kazuaki Yokoi, Yuuji Yoshitomi, Yutaka Sakurai, Tamio Ishihara
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Patent number: 5146379Abstract: A thin film magnetic head of the present invention comprises an insulating layer and a protective layer both of which are made of a magnetic material or a nonmagnetic material containing a magnetic material so as to inhibit the contour effect which is a trouble in making an attempt to increase the recording density.Type: GrantFiled: May 30, 1991Date of Patent: September 8, 1992Assignee: Alps Electric Co., Ltd.Inventors: Tetsuya Iwata, Yutaka Sakurai
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Patent number: 5126904Abstract: Disclosed is a magnetic head supporting structure of the type which is in the form of a supporting plate or load beam and which supports a magnetic head at its free end. This magnetic head supporting structure comprises a flat section which includes thick-walled portions and thin-walled portions so as to form a pattern thereon.Type: GrantFiled: November 20, 1990Date of Patent: June 30, 1992Inventor: Yutaka Sakurai
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Patent number: 4680627Abstract: In an apparatus for checking patterns on printed circuit boards by comparing two patterns formed on two printed circuit boards, registration patterns each including orthogonal straight line segments and respectively formed on the two printed circuit boards are imaged by two imagers, and registration images from the imagers are matched by means of a registration unit to accurately match an image of a pattern to be checked on one printed circuit board with an image of a reference pattern on the other printed circuit board.Type: GrantFiled: March 12, 1986Date of Patent: July 14, 1987Assignee: Hitachi, Ltd.Inventors: Akira Sase, Takeo Nagata, Masao Fukunaga, Yutaka Sakurai, Yoshikatsu Satomi, deceased
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Patent number: 4321578Abstract: A pressure transducer is arranged to mount a semiconductor pressure sensor in a housing such that the pressure of a high-pressure fluid is applied to one side of the semiconductor pressure sensor through a high pressure seal diaphragm and a sealed liquid in the high pressure side, while the pressure of a low-pressure fluid is applied to the other side of the sensor through a low-pressure seal diaphragm and a sealed liquid in the low pressure side, and a protecting member is provided closer to the low-pressure seal diaphragm.Type: GrantFiled: October 3, 1979Date of Patent: March 23, 1982Assignee: Hitachi, Ltd.Inventors: Akira Nagasu, Yosimi Yamamoto, Takeo Nagata, Hiroyasu Uchida, Yutaka Sakurai
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Patent number: 4306460Abstract: A differential pressure transducer having a cantilever and a semiconductor strain gauge attached to each side of the cantilever at an intermediate portion of the latter. The cantilever has one end fixed by electron beam welding to a fixing member and the other end left for free displacement in response to a differential pressure. The displacement of the other end of the cantilever is detected as changes in the electric resistances of the semiconductor strain gauges.Type: GrantFiled: December 13, 1979Date of Patent: December 22, 1981Assignee: Hitachi, Ltd.Inventors: Yutaka Sakurai, Takeo Nagata, Yoshitaka Matsuoka, Satoshi Shimada, Mitsuo Ai