Abstract: A piezoelectric material includes a metal oxide containing at least Ba, Ca, Ti, Zr, and Mn, in which the piezoelectric material has a perovskite structure, in which: x, which represents a ratio of a content (mol) of Ca to A (mol) representing a total content of Ba and Ca, falls within a range of 0.10?x?0.18; y, which represents a ratio of a content (mol) of Zr to B (mol) representing a total content of Ti, Zr, and Mn, falls within a range of 0.055?y?0.085; and z, which represents a ratio of a content (mol) of Mn to the B (mol), falls within a range of 0.003?z?0.012, and in which the piezoelectric material satisfies a relationship of 0?(|d31(?20u)?d31(?20d)|)/|d31(?20u)|?0.08, and has a value of 130 pm/V or more for each of |d31(?20u)| and |d31(?20d)|.

Abstract: A piezoelectric material includes a metal oxide containing at least Ba, Ca, Ti, Zr, and Mn, in which the piezoelectric material has a perovskite structure, in which: x, which represents a ratio of a content (mol) of Ca to A (mol) representing a total content of Ba and Ca, falls within a range of 0.10x0.18; y, which represents a ratio of a content (mol) of Zr to B (mol) representing a total content of Ti, Zr, and Mn, falls within a range of 0.055?y?0.085; and z, which represents a ratio of a content (mol) of Mn to the B (mol), falls within a range of 0.003?z?0.012, and in which the piezoelectric material satisfies a relationship of 0?(|d31(31 20u)?d31(?20d)|)/|d31(?20u)|?0.08, and has a value of 130 pm/V or more for each of |d31(?20u)| and |d31(?20d)|.

Abstract: The invention provides an X-ray apparatus and an X-ray measurement method that can increase sensitivity to a positional shift of an X-ray as compared with related art. An X-ray apparatus includes a splitting element configured to spatially split an X-ray from an X-ray generator and form an X-ray beam; a detector configured to detect an intensity of the X-ray beam, which has been split by the splitting element and has passed through a detection object, the detector including a plurality of pixels; and an absorbing element arranged at a boundary of two pixels from among the plurality of pixels included in the detector and configured to absorb part of the X-ray beam. The X-ray beam is configured to discretely irradiate the two pixels of the detector.