Abstract: A novel semiconductor device is provided. The semiconductor device includes a driver circuit and a first transistor layer to a third transistor layer. The first transistor layer includes a first memory cell including a first transistor and a first capacitor. The second transistor layer includes a second memory cell including a second transistor and a second capacitor. The third transistor layer includes a switching circuit and an amplifier circuit. The first transistor is electrically connected to a first local bit line. The second transistor is electrically connected to a second local bit line. The switching circuit has a function of selecting the first local bit line or the second local bit line and electrically connecting the selected local bit line to the amplifier circuit. The first transistor layer to the third transistor layer are provided over the silicon substrate. The third transistor layer is provided between the first transistor layer and the second transistor layer.

Abstract: A novel semiconductor device is provided. The semiconductor device includes a driver circuit including a plurality of transistors using a silicon substrate for channels, and a first transistor layer and a second transistor layer including a plurality of transistors using a metal oxide for channels. The first transistor layer and the second transistor layer are provided over the silicon substrate layer. The first transistor layer includes a first memory cell including a first transistor and a first capacitor. The first transistor is electrically connected to a first local bit line. The second transistor layer includes a second transistor whose gate is electrically connected to the first local bit line and a first correction circuit electrically connected to the second transistor. The first correction circuit is electrically connected to a first global bit line.

Abstract: A semiconductor device with a novel structure is provided. The semiconductor device includes an oscillation circuit including a first coil, a second coil, a first capacitor, a second capacitor, a first transistor, and a second transistor and a frequency correction circuit including a third capacitor, a fourth capacitor, a third transistor, a fourth transistor, and a switching circuit. The switching circuit has a function of controlling a conduction state or a non-conduction state of the third transistor and the fourth transistor. The frequency correction circuit is provided above the oscillation circuit and has a function of adjusting an oscillation frequency of the oscillation circuit. The first transistor and the second transistor each include a semiconductor layer containing silicon in a channel formation region. The third transistor and the fourth transistor each include a semiconductor layer containing an oxide semiconductor in a channel formation region.

Abstract: A semiconductor device capable of measuring a minute current is provided. The semiconductor device includes an operational amplifier and a diode element. An inverting input terminal of the operational amplifier and an input terminal of the diode element are electrically connected to a first terminal to which current is input, and an output terminal of the operational amplifier and an output terminal of the diode element are electrically connected to a second terminal from which voltage is output. A diode-connected transistor that includes a metal oxide in a channel formation region is used as the diode element. Since the off-state current of the transistor is extremely low, a minute current can flow between the first terminal and the second terminal. Thus, when voltage is output from the second terminal, a minute current that flows through the first terminal can be estimated from the voltage.

Abstract: A semiconductor device in which an increase in circuit area is inhibited is provided. The semiconductor device includes a first circuit layer and a second circuit layer over the first circuit layer; the first circuit layer includes a first transistor; the second circuit layer includes a second transistor; a gate of the second transistor is electrically connected to one of a source and a drain of the first transistor; a source and a drain of the second transistor are electrically connected to the other of the source and the drain of the first transistor; and a semiconductor layer of the second transistor contains a metal oxide.

Abstract: A low-power semiconductor device is provided. A retention transistor is provided between a control circuit and an output transistor. An output terminal of the control circuit is electrically connected to one of a source and a drain of the retention transistor, and the other of the source and the drain of the retention transistor is electrically connected to a gate of the output transistor. A node to which the other of the source and the drain of the retention transistor and the gate of the output transistor are electrically connected is a retention node. When the retention transistor is in an on state, a potential corresponding to a potential output from the control circuit is written to the retention node. Then, when the retention transistor is in an off state, the potential of the retention node is retained. Thus, a gate potential of the output transistor can be kept at a constant value even when the control circuit is off.

Abstract: A memory device with shortened access time in data reading is provided. The memory device includes a first layer and a second layer positioned above the first layer, the first layer includes a reading circuit, and the second layer includes a first memory cell and a second memory cell. The reading circuit includes a Si transistor. The first memory cell and the second memory cell each include an OS transistor. The first memory cell is electrically connected to the reading circuit, and the second memory cell is electrically connected to the reading circuit. When a first current corresponding to first data retained in the first memory cell flows from the reading circuit to the first memory cell and a second current corresponding to second data retained in the second memory cell flows from the reading circuit to the second memory cell, the reading circuit compares the current amounts of the first current and the second current, and reads the first data.

Abstract: A semiconductor device capable of measuring a minute current is provided. The semiconductor device includes an operational amplifier and a diode element. An inverting input terminal of the operational amplifier and an input terminal of the diode element are electrically connected to a first terminal to which current is input, and an output terminal of the operational amplifier and an output terminal of the diode element are electrically connected to a second terminal from which voltage is output. A diode-connected transistor that includes a metal oxide in a channel formation region is used as the diode element. Since the off-state current of the transistor is extremely low, a minute current can flow between the first terminal and the second terminal. Thus, when voltage is output from the second terminal, a minute current that flows through the first terminal can be estimated from the voltage.

Abstract: A semiconductor device is provided which includes a first control circuit including a first transistor in a silicon substrate channel, a second control circuit provided over the first control circuit, a memory circuit provided over the second control circuit, and a global bit line and an inverted global bit line that have a function of transmitting a signal between the first control circuit and the second control circuit. The first control circuit includes a sense amplifier circuit including an input terminal and an inverted input terminal. In a first period for reading data from the memory circuit to the first control circuit, the second control circuit controls whether the global bit line and the inverted global bit line from which electric charge is discharged are charged or not in accordance with the data read from the memory circuit.

Abstract: Power consumption is reduced. A semiconductor device includes an arithmetic processing circuit, a power supply circuit, a power management unit (PMU), and a power switch. The arithmetic processing circuit includes a storage circuit retaining generated data. The storage circuit includes a backup circuit including a transistor and a capacitor. When a control signal for transition to a resting state is input from the arithmetic processing circuit, the PMU performs voltage scaling operation for lowering a power supply potential of the arithmetic processing circuit. When the period of the resting state exceeds the set time, the PMU performs power gating operation for stopping power supply to the arithmetic processing circuit. Data saving operation of the storage circuit is performed before the voltage scaling operation.

Abstract: A memory device includes m memory cell blocks, m×(k+1) word lines, n bit lines, and a word line driver circuit (m, k, and n are each an integer greater than or equal to 1). The memory cell block includes memory cells of (k+1) rows×n columns, and each of the memory cells is electrically connected to a word line and a bit line. The word line driver circuit has a function of outputting signals to m×k word lines that are selected from m×(k+1) word lines by using a switch transistor, and selection information is written to a gate of the switch transistor by using a transistor having a low off-state current. The memory cells of k rows×n columns included in the memory cell block are normal memory cells, and each of the memory cell blocks includes redundant memory cells of one row×n columns.

Abstract: A protection circuit and a control circuit of a secondary battery are provided, for example. A circuit with low power consumption is provided. A circuit with a high degree of integration is provided. The control circuit includes a first resistance circuit, a second resistance circuit, a comparator, and a memory circuit.

Abstract: A control system for a secondary battery that effectively performs temperature control of the secondary battery before getting to a charging station, thereby enabling high speed charging, is provided. It relates to a vehicle including a first secondary battery, a second secondary battery, a first temperature control unit, a secondary battery monitoring unit, and an arithmetic unit. The secondary battery monitoring unit acquires remaining amount data of the first secondary battery. The arithmetic unit compares the remaining amount data and a set value. In the case where the remaining amount data is smaller than the set value, the secondary battery monitoring unit acquires the temperature of the first secondary battery. The arithmetic unit calculates an adjustment term required to adjust the temperature of the first secondary battery to a set temperature. The arithmetic unit calculates an arrival term required to get to a set charging station.

Abstract: A control circuit of a secondary battery with a novel structure is provided. The control circuit of a secondary battery includes a first transistor, a first voltage generation circuit generating a first voltage, and a second voltage generation circuit generating a second voltage. The first voltage generation circuit includes a second transistor and a first capacitor. The second voltage generation circuit includes a third transistor and a second capacitor. The difference between the first voltage and the second voltage is set in accordance with the threshold voltage of the first transistor. When the first transistor includes a back gate, a voltage retention circuit having a function of retaining the voltage of the back gate is included. The voltage retention circuit includes a fourth transistor and a third capacitor. The third capacitor includes a ferroelectric layer between a pair of electrodes.

Abstract: A semiconductor device capable of changing drive capability as appropriate is provided. A semiconductor device (100A) includes first to third circuits (102, 103, 101) and a first holding circuit (SH2), and the first holding circuit (SH2) includes a first holding portion (node ND2) and holds a first potential. The first circuit (102) has a function of changing the first potential of the first holding portion (node ND2) to a second potential, and the second circuit (103) has a function of generating a bias current based on the first potential or the second potential of the first holding portion (node ND2). The third circuit (101) includes first to third terminals (TLa4, TLa1, TLa2) and has a function of generating a third potential in accordance with an input potential to the second terminal (TLa1) by supply of the bias current to the first terminal (TLa4) and outputting the third potential from the third terminal (TLa2).

Abstract: A semiconductor device with a novel structure is provided. The semiconductor device includes a current-to-voltage conversion portion, a current switch portion, a voltage-to-current conversion portion, and a control portion. The current switch portion includes a first transistor. The voltage-to-current conversion portion includes a second transistor. The control portion includes a third transistor. The first transistor includes an oxide semiconductor in a channel formation region. The second transistor includes a nitride semiconductor in a channel formation region. The third transistor includes silicon in a channel formation region. The first transistor is provided over a first substrate. The second transistor and the third transistor are provided over a second substrate.

Abstract: A novel semiconductor device is provided. The semiconductor device includes a mixer circuit and a bias circuit. The mixer circuit includes a voltage-to-current conversion portion, a current switch portion, and a current-to-voltage conversion portion. The bias circuit includes a bias supply portion and a first transistor. The voltage-to-current conversion portion includes a second transistor and a third transistor. The bias supply portion has a function of outputting a bias voltage to be supplied to a gate of the second transistor and a gate of the third transistor. One of a source and a drain of the first transistor is electrically connected to the gate of the second transistor and the gate of the third transistor. The first transistor is turned off when the bias voltage is supplied, and the first transistor is turned on when the supply of the bias voltage is stopped.

Abstract: A semiconductor device that can be embedded in a living body is provided. The semiconductor device being embeddable in a living body includes a communication portion, a control portion, a memory portion, an arithmetic portion, and a sensor portion. The control portion has a function of controlling the communication portion, the arithmetic portion, and the memory portion. The memory portion has a function of retaining identification information. The arithmetic portion has a function of using first information and second information supplied from the sensor portion to generate third information. The control portion has a function of making the arithmetic portion perform arithmetic processing in response to a signal input through the communication portion. The control portion has a function of outputting, through the communication portion to the outside, one or both of the identification information and the third information, in response to a signal input through the communication portion.

Abstract: A control system for a secondary battery which is less affected by the ambient temperature by performing temperature control of the secondary battery is provided. A control system for a secondary battery which is less affected by the ambient temperature and in which a plurality of kinds of secondary batteries are used for temperature control is achieved and mounted on a vehicle. Specifically, when the ambient temperature is low, some of second secondary batteries are heated by self-heating of a first secondary battery. After the second secondary batteries are sufficiently heated, the rest of the second secondary batteries are heated in stages by self-heating of the some of the second secondary batteries whose temperature has been increased.

Abstract: Power consumption is reduced. A semiconductor device includes an arithmetic processing circuit, a power supply circuit, a power management unit (PMU), and a power switch. The arithmetic processing circuit includes a storage circuit retaining generated data. The storage circuit includes a backup circuit including a transistor and a capacitor. When a control signal for transition to a resting state is input from the arithmetic processing circuit, the PMU performs voltage scaling operation for lowering a power supply potential of the arithmetic processing circuit. When the period of the resting state exceeds the set time, the PMU performs power gating operation for stopping power supply to the arithmetic processing circuit. Data saving operation of the storage circuit is performed before the voltage scaling operation.