Patents by Inventor Yuuichi Ootsuji

Yuuichi Ootsuji has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electromigration evaluation circuit
    Patent number: 6614251
    Abstract: An electromigration evaluation circuit includes two transfer gates and two measurement terminals. The two measurement terminals are connected respectively to both ends of a to-be-evaluated device. In response to a control signal, each of the transfer gates is connected/disconnected to/from each of the measurement terminals. While performing a test for applying a load current to the to-be-evaluated device, the transfer gates are OFF, thereby electrically disconnecting the measurement terminals from the to-be-evaluated device. Just before or after the test, the transfer gates are ON, thereby electrically connecting the measurement terminals to the to-be-evaluated device. Then, the resistance of the to-be-evaluated device is obtained by an external measurement device. The resistance values which are obtained just before or after the test are compared with each other, so that electromigration resistance of the to-be-evaluated device can be evaluated.
    Type: Grant
    Filed: July 11, 2001
    Date of Patent: September 2, 2003
    Assignee: NEC Electronics Corporation
    Inventor: Yuuichi Ootsuji
  • Electromigration evaluation circuit
    Publication number: 20020005731
    Abstract: An electromigration evaluation circuit includes two transfer gates and two measurement terminals. The two measurement terminals are connected respectively to both ends of a to-be-evaluated device. In response to a control signal, each of the transfer gates is connected/disconnected to/from each of the measurement terminals. While performing a test for applying a load current to the to-be-evaluated device, the transfer gates are OFF, thereby electrically disconnecting the measurement terminals from the to-be-evaluated device. Just before or after the test, the transfer gates are ON, thereby electrically connecting the measurement terminals to the to-be-evaluated device. Then, the resistance of the to-be-evaluated device is obtained by an external measurement device. The resistance values which are obtained just before or after the test are compared with each other, so that electromigration resistance of the to-be-evaluated device can be evaluated.
    Type: Application
    Filed: July 11, 2001
    Publication date: January 17, 2002
    Inventor: Yuuichi Ootsuji