Patents by Inventor Yuuki Sameshima

Yuuki Sameshima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of analyzing microparticle composition and microparticle composition analyzing device
    Patent number: 9285298
    Abstract: A method of analyzing microparticle compositions and a microparticle composition analyzing device are capable of quantitatively analyzing the mass concentration of air microparticles online for each chemical composition. The particle ray of microparticles in an air sample is converged, and is irradiated onto a narrow domain of a capture body which includes a mesh-shaped structure for capturing the microparticles in the particle ray while removing surplus gas phase components, and the microparticles are captured. Then, the narrow region is subjected to concentrated irradiation of energy rays, and the microparticles that are captured by the capture body are vaporized, sublimated or reacted to yield a desorbed component, which is analyzed.
    Type: Grant
    Filed: December 6, 2010
    Date of Patent: March 15, 2016
    Assignees: THE UNIVERSITY OF TOKYO, FUJI ELECTRIC CO., LTD.
    Inventors: Nobuyuki Takegawa, Takayuki Nakamura, Yuuki Sameshima, Masahiko Takei, Noritomo Hirayama
  • METHOD OF ANALYZING MICROPARTICLE COMPOSITION AND MICROPARTICLE COMPOSITION ANALYZING DEVICE
    Publication number: 20130011930
    Abstract: A method of analyzing microparticle compositions and a microparticle composition analyzing device are capable of quantitatively analyzing the mass concentration of air microparticles online for each chemical composition. The particle ray of microparticles in an air sample is converged, and is irradiated onto a narrow domain of a capture body which includes a mesh-shaped structure for capturing the microparticles in the particle ray while removing surplus gas phase components, and the microparticles are captured. Then, the narrow region is subjected to concentrated irradiation of energy rays, and the microparticles that are captured by the capture body are vaporized, sublimated or reacted to yield a desorbed component, which is analyzed.
    Type: Application
    Filed: December 6, 2010
    Publication date: January 10, 2013
    Applicants: Fuji Electric Co., Ltd., The University of Tokyo
    Inventors: Nobuyuki Takegawa, Takayuki Nakamura, Yuuki Sameshima, Masahiko Takei, Noritomo Hirayama