Patents by Inventor Yuuya Washiyama

Yuuya Washiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11587775
    Abstract: An ion detector according to this embodiment has a structure for reducing influences of signal reflection or the like on an output signal. The ion detector comprises an electron multiplier, a signal output unit, a signal output terminal, and an AC coupler. The AC coupler is disposed on a signal line between the signal output unit and the signal output terminal, including a resin sheet and a pair of conductive sections facing each other with the resin sheet interposed therebetween. One conductive section is electrically connected to an output terminal of the signal output unit, and the other conductive section is electrically connected to the signal output terminal.
    Type: Grant
    Filed: May 19, 2020
    Date of Patent: February 21, 2023
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Hiroshi Kobayashi, Sayaka Takatsuka, Yuuya Washiyama, Yuto Yanagihara
  • Publication number: 20200373136
    Abstract: An ion detector according to this embodiment has a structure for reducing influences of signal reflection or the like on an output signal. The ion detector comprises an electron multiplier, a signal output unit, a signal output terminal, and an AC coupler. The AC coupler is disposed on a signal line between the signal output unit and the signal output terminal, including a resin sheet and a pair of conductive sections facing each other with the resin sheet interposed therebetween. One conductive section is electrically connected to an output terminal of the signal output unit, and the other conductive section is electrically connected to the signal output terminal.
    Type: Application
    Filed: May 19, 2020
    Publication date: November 26, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Hiroshi KOBAYASHI, Sayaka TAKATSUKA, Yuuya WASHIYAMA, Yuto YANAGIHARA
  • Publication number: 20140097339
    Abstract: An MCP unit of the present invention has a triode structure with a structure to achieve a desired time response characteristic independent of restrictions from a channel diameter of MCP, and is provided with an MCP group, a first electrode, a second electrode, an anode, and an acceleration electrode. Particularly, the MCP unit further comprises a ring member between the acceleration electrode and the anode, as s restriction structure for confining reflected electrons emitted from the anode in response to incidence of secondary electrons from the MCP group, within a space between the acceleration electrode and the anode.
    Type: Application
    Filed: October 9, 2013
    Publication date: April 10, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Akio SUZUKI, Yuuya WASHIYAMA
  • Publication number: 20140097340
    Abstract: An MCP unit of the present invention has a triode structure with a structure to achieve a desired time response characteristic independent of restrictions from a channel diameter of MCP, and is provided with an MCP group, a first electrode, a second electrode, an anode, and an acceleration electrode. Particularly, the MCP unit further comprises an electron lens structure for confining reflected electrons emitted from the anode in response to incidence of secondary electrons from the MCP group, within a space between the acceleration electrode and the anode.
    Type: Application
    Filed: October 9, 2013
    Publication date: April 10, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Akio SUZUKI, Yuuya WASHIYAMA
  • Patent number: 8294089
    Abstract: In a charged particle detecting apparatus 100 for which an MCP is sandwiched with an IN electrode 1 and an OUT electrode and an anode electrode and a rear cover are installed therebehind, the component members in the rear of the IN electrode 1 are arranged further inside than the IN electrode 1 when viewed from an MCP incident surface, and the charged particle detecting apparatus 100 is fixed by screwing and the like to a cabinet wall surface 330 of a TOF-MS by using a flange portion provided at a part of IN electrode 1 projected further outside than the rear component members.
    Type: Grant
    Filed: March 19, 2009
    Date of Patent: October 23, 2012
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Akio Suzuki, Etsuo Iizuka, Katsutoshi Nonaka, Masahiro Hayashi, Yuuya Washiyama
  • Patent number: 7982172
    Abstract: In an MCP assembly 10 having one or a plurality of MCPs 5, 6 sandwiched with an input-side electrode 4 and an output-side electrode 7, there provided at the surface facing the MCP 5, 6 of at least either (preferably, both) of the input-side electrode 4 and the output-side electrode 7, is a substantially annular contact face that contacts the MCP surface to fix the same, and there provided at a periphery of the contact face is a separation surface retracted in a direction to be separated from the MCP surface. Thereby, provided is an MCP assembly having a construction enabled to prevent damage to the MCP in manufacturing and handling.
    Type: Grant
    Filed: March 5, 2009
    Date of Patent: July 19, 2011
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Akio Suzuki, Etsuo Iizuka, Katsutoshi Nonaka, Masahiro Hayashi, Yuuya Washiyama
  • Patent number: 7655891
    Abstract: The present invention relates to a charged-particle detecting apparatus having a structure which enables adjustment of a potential distribution so as to stably maintain flight loci of charged particles without depending on a change in a voltage-applied state. The charged-particle detecting apparatus comprises a first electrode, an MCP, a second electrode, a third electrode that functions as an anode, and a rear cover arranged in order along a predetermined reference axis. The third electrode is arranged on the opposite side of the MCP with respect to the second electrode, and is electrically connected to an output signal part via a capacitor.
    Type: Grant
    Filed: March 22, 2007
    Date of Patent: February 2, 2010
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Akio Suzuki, Masahiro Hayashi, Katsutoshi Nonaka, Yuuya Washiyama
  • Publication number: 20090236517
    Abstract: In a charged particle detecting apparatus 100 for which an MCP is sandwiched with an IN electrode 1 and an OUT electrode and an anode electrode and a rear cover are installed therebehind, the component members in the rear of the IN electrode 1 are arranged further inside than the IN electrode 1 when viewed from an MCP incident surface, and the charged particle detecting apparatus 100 is fixed by screwing and the like to a cabinet wall surface 330 of a TOF-MS by using a flange portion provided at a part of IN electrode 1 projected further outside than the rear component members.
    Type: Application
    Filed: March 19, 2009
    Publication date: September 24, 2009
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Akio SUZUKI, Etsuo IIZUKA, Katsutoshi NONAKA, Masahiro HAYASHI, Yuuya WASHIYAMA
  • Publication number: 20090230286
    Abstract: In an MCP assembly 10 having one or a plurality of MCPs 5, 6 sandwiched with an input-side electrode 4 and an output-side electrode 7, there provided at the surface facing the MCP 5, 6 of at least either (preferably, both) of the input-side electrode 4 and the output-side electrode 7, is a substantially annular contact face that contacts the MCP surface to fix the same, and there provided at a periphery of the contact face is a separation surface retracted in a direction to be separated from the MCP surface. Thereby, provided is an MCP assembly having a construction enabled to prevent damage to the MCP in manufacturing and handling.
    Type: Application
    Filed: March 5, 2009
    Publication date: September 17, 2009
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Akio SUZUKI, Etsuo Iizuka, Katsutoshi Nonaka, Masahiro Hayashi, Yuuya Washiyama
  • Patent number: 7564043
    Abstract: The present invention relates to an MCP unit or the like having a structure intended to achieve a desired time response characteristic, without depending on a limitation imposed by a channel diameter of MCP. The MCP unit comprises the MCP for releasing secondary electrons internally multiplied in response to incidence of charged particles, an anode arranged in a position where the secondary electrons reach, and an acceleration electrode arranged between the MCP and the anode. In particular, the acceleration electrode includes a plurality of openings which permit passing of the secondary electrons migrating from the MCP toward the anode. Further, the acceleration electrode is arranged such that the shortest distance B between the acceleration electrode and the anode is longer than the shortest distance A between the MCP and the acceleration electrode. Thus, an FWHM of a detected peak appearing in response to the incidence of the charged particles is remarkably shortened.
    Type: Grant
    Filed: May 24, 2007
    Date of Patent: July 21, 2009
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Masahiro Hayashi, Yuuya Washiyama, Akio Suzuki, Masahiko Iguchi
  • Publication number: 20080290267
    Abstract: The present invention relates to an MCP unit or the like having a structure intended to achieve a desired time response characteristic, without depending on a limitation imposed by a channel diameter of MCP. The MCP unit comprises the MCP for releasing secondary electrons internally multiplied in response to incidence of charged particles, an anode arranged in a position where the secondary electrons reach, and an acceleration electrode arranged between the MCP and the anode. In particular, the acceleration electrode includes a plurality of openings which permit passing of the secondary electrons migrating from the MCP toward the anode. Further, the acceleration electrode is arranged such that the shortest distance B between the acceleration electrode and the anode is longer than the shortest distance A between the MCP and the acceleration electrode. Thus, an FWHM of a detected peak appearing in response to the incidence of the charged particles is remarkably shortened.
    Type: Application
    Filed: May 24, 2007
    Publication date: November 27, 2008
    Inventors: Masahiro Hayashi, Yuuya Washiyama, Akio Suzuki, Masahiko Iguchi
  • Publication number: 20080230686
    Abstract: The present invention relates to a charged-particle detecting apparatus having a structure which enables adjustment of a potential distribution so as to stably maintain flight loci of charged particles without depending on a change in a voltage-applied state. The charged-particle detecting apparatus comprises a first electrode, an MCP, a second electrode, a third electrode that functions as an anode, and a rear cover arranged in order along a predetermined reference axis. The third electrode is arranged on the opposite side of the MCP with respect to the second electrode, and is electrically connected to an output signal part via a capacitor.
    Type: Application
    Filed: March 22, 2007
    Publication date: September 25, 2008
    Inventors: Akio Suzuki, Masahiro Hayashi, Katsutoshi Nonaka, Yuuya Washiyama