Patents by Inventor Yuval Yahav

Yuval Yahav has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System, method and computed readable medium for evaluating a parameter of a feature having nano-metric dimensions
    Patent number: 9383196
    Abstract: A non-transitory computer readable medium, a system and a method. The method may include obtaining, by an image obtaining module, an image of a measurement site, the measurement site comprise the feature, the image of the measurement site comprises an image of the feature; processing, by an image processor, the image of the measurement site to provide an artificial image, the artificial image comprise a artificial image of an artificial feature, the artificial feature differs from the feature; measuring a parameter of the artificial feature to provide a measurement result, wherein the measuring comprises applying a measurement algorithm that is inadequate for measuring the parameter of the feature; and determining a value of the parameter of the feature in response to the measurement result.
    Type: Grant
    Filed: March 6, 2013
    Date of Patent: July 5, 2016
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Yuval Yahav, Ofer Adan