Patents by Inventor Yuzo Kato

Yuzo Kato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030211709
    Abstract: A method for dividing a semiconductor wafer which is covered by an opaque resin in a dicing process includes forming marks on the semiconductor wafer, wherein the marks are distinguished from electrodes which are formed on the semiconductor wafer. According to the method, in a dicing process, separating semiconductor chips from the semiconductor wafer can be precisely achieved.
    Type: Application
    Filed: May 8, 2003
    Publication date: November 13, 2003
    Inventors: Takashi Ohsumi, Yuzo Kato
  • Patent number: 6590274
    Abstract: A semiconductor wafer which is covered by an opaque resin in a dicing process includes marks formed on the semiconductor wafer, where the marks are distinguished from electrodes formed on the semiconductor wafer. In a dicing process, separating semiconductor chips from the semiconductor wafer can be precisely achieved.
    Type: Grant
    Filed: July 30, 2001
    Date of Patent: July 8, 2003
    Assignee: Oki Electric Industry Co., Ltd.
    Inventors: Takashi Ohsumi, Yuzo Kato
  • Publication number: 20010041425
    Abstract: A method for dividing a semiconductor wafer which is covered by an opaque resin in a dicing process includes forming marks on the semiconductor wafer, wherein the marks are distinguished from electrodes which are formed on the semiconductor wafer. According to the method, in a dicing process, separating semiconductor chips from the semiconductor wafer can be precisely achieved.
    Type: Application
    Filed: July 30, 2001
    Publication date: November 15, 2001
    Inventors: Takashi Ohsumi, Yuzo Kato
  • Patent number: 6303470
    Abstract: A method for dividing a semiconductor wafer which is covered by an opaque resin in a dicing process includes forming marks on the semiconductor wafer, wherein the marks are distinguished from electrodes which are formed on the semiconductor wafer. According to the method, in a dicing process, separating semiconductor chips from the semiconductor wafer can be precisely achieved.
    Type: Grant
    Filed: March 9, 2000
    Date of Patent: October 16, 2001
    Assignee: Oki Electric Industry Co., Ltd.
    Inventors: Takashi Ohsumi, Yuzo Kato
  • Patent number: 5675714
    Abstract: A mode identifying method of identifying a mode to which inputted code data belongs is provided. An inherent code existing in each mode so as to have a probability-manner relation and the probability-manner relation are stored so as to correspond to each other. A code which coincides with the inherent code stored is extracted from the code data and the number of coincidence times of every code is counted. The mode to which the code data belongs is identified on the basis of the number of coincidence times obtained by the counting step and the probability-manner relation stored by applying a multi-value logical relation or a fuzzy logical relation or both of a fuzzy rule and a fuzzy inference to the number of coincidence times obtained and probability-manner relation stored.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: October 7, 1997
    Assignee: Canon Kabushiki Kaisha
    Inventor: Yuzo Kato
  • Patent number: 5448413
    Abstract: The present invention relates to an apparatus for controlling the lens position of a zoom lens. The zoom lens comprises a plurality of lens units movable along the optical axis for zooming, a focal length setting unit for setting the focal length of the zoom lens, an object distance setting unit for setting an object distance, a store containing a plurality of inherent coefficients and an arithmetic logic unit which specifies focal length information and object distance information as variables, and uses the coefficients in calculating a position to which a lens unit should move.
    Type: Grant
    Filed: November 22, 1994
    Date of Patent: September 5, 1995
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takaaki Kobayashi, Susumu Fukita, Yuzo Kato, Jun Hosoya, Ryuji Ohmuro, Junichi Kasuya, Setsuo Yoshida, Noboru Suzuki
  • Patent number: 4971444
    Abstract: A method of detecting the position of an object with respect to a predetermined standard position, includes detecting a signal concerned wtih the object, subjecting the detected signal and a predetermined reference signal to correlation processing to form a correlation signal, and detecting the position of the object with respect to the predetermined standard position, in accordance with the formed correlation signal.
    Type: Grant
    Filed: July 28, 1989
    Date of Patent: November 20, 1990
    Assignee: Canon Kabushiki Kaisha
    Inventor: Yuzo Kato
  • Patent number: 4857742
    Abstract: A device for detecting the position of an object by use of an electron beam is disclosed. The device includes a beam supplying portion for supplying an electron beam, a scanning system operable to scan the object with the electron beam, a converting system operable to detect electrons from the object scanned with the electron beam and to convert the electrons into an electric signal, a detecting system operable to detect the position of the object on the basis of the signal from the converting system, and a control unit actable on the supplying portion to change, during the scan of the object, a condition for the irradiation of the object with the electron beam in accordance with the characteristic of the object.
    Type: Grant
    Filed: December 22, 1987
    Date of Patent: August 15, 1989
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yuzo Kato, Yasuo Kawai
  • Patent number: 4686580
    Abstract: An image is magnified or reduced by dividing the image into divisional images, magnifying or reducing each of the divisional images and combining the magnified or reduced divisional images. The magnification or reduction of the divisional images is carried out by inserting one pixel into, or deleting one pixel from, each of the divisional images.
    Type: Grant
    Filed: February 6, 1984
    Date of Patent: August 11, 1987
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yuzo Kato, Hidetoshi Suzuki
  • Patent number: 4415920
    Abstract: An image signal processing unit is disclosed which comprises: a contour extraction processing circuit for extracting a contour part from an input image signal, a color signal conversion processing circuit for replacing color signals of the contour part with contour emphasizing color signals on the basis of an output signal from said contour extraction processing circuit, and an image conversion processing circuit for producing a contour emphasized image signal from the input image signal and an output signal from said color signal conversion processing circuit. The image signals input to the image signal processing unit are converted to image signals suitable for display or printing.
    Type: Grant
    Filed: September 14, 1981
    Date of Patent: November 15, 1983
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yuzo Kato, Nobuyoshi Tanaka, Naoto Kawamura, Hisashi Nakatsui, Shunichi Ishihara, Yasushi Sato
  • Patent number: 4414581
    Abstract: An image signal processing method and apparatus for practicing the method are capable of identifying and differentiating information not having tonal rendition such as characters and linetone images from information having tonal rendition such as photographs and pictures, based on the difference of signal characteristics, for example based on the fact that the spatial frequency distribution in portions of an image not having tonal rendition are in the higher frequency range compared to that of the portions of the image having tonal rendition. The method and apparatus are also capable of conducting different processes on the identified different images.
    Type: Grant
    Filed: October 20, 1981
    Date of Patent: November 8, 1983
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yuzo Kato, Shunichi Ishihara, Yasushi Sato, Nobuyoshi Tanaka, Naoto Kawamura, Hisashi Nakatsui
  • Patent number: 4331616
    Abstract: An adjusting screw of a carburetor comprising a threaded portion, an enlarged head portion and a reduced diameter portion located therebetween. A thin hollow cylindrical wall is formed on a link lever of the carburetor. After the adjusting screw is screwed into the threaded hole of the hollow cylindrical wall, the reduced diameter portion of the adjusting screw is cut. Then, the top portion of the hollow cylindrical wall is bent inward for irremovably fixing the adjusting screw onto the link lever.
    Type: Grant
    Filed: December 17, 1980
    Date of Patent: May 25, 1982
    Assignees: Toyota Jidosha Kogyo Kabushiki Kaisha, Aisan Industry Co., Ltd.
    Inventors: Yuzo Kato, Mikitoshi Kako, Kunio Kadowaki
  • Patent number: 4317784
    Abstract: An adjust screw device for use with a carburetor of an internal combustion engine having stops for restricting the range within which the automobile user can readjust the idle R.P.M. by adjusting the adjust screw at the carburetor. The adjust screw device is composed majorly of a first adjust screw having a large adjustable range and a second adjust screw for fine adjustment, the physical position of the second adjust screw being changed by the adjustment of the first adjust screw. After initial adjustment of the first adjust screw by the manufacturer, further adjustment of the screw is completely blocked and the second adjust screw is then adjustable by the user only over a predetermined range.
    Type: Grant
    Filed: December 5, 1980
    Date of Patent: March 2, 1982
    Assignees: Toyota Jidosha Kogyo Kabushiki Kaisha, Aisan Kogyo Kabushiki Kaisha
    Inventors: Yuzo Kato, Hidenori Tateno, Mikitoshi Kako
  • Patent number: 4315201
    Abstract: An alignment apparatus for mask and wafer each having alignment marks provided in a narrow strip like area between circuit patterns is disclosed, which mask and wafer are used in manufacturing semiconductor circuit elements. In the apparatus, the mask and wafer are scanned to obtain scan signals by means of which the amount of relative deviation between the alignment marks on mask and wafer is detected. By means of the detected signal, an alignment is effected between the mask and wafer in the apparatus. For this type of alignment apparatus, there is a problem that since the alignment marks are provided in the narrow strip like area, no coincidence between the scanning position and the strip area is attainable with pre-alignment accuracy. Improvement in the alignment apparatus according to the invention lies in that a reading of alignment marks is initiated after the coincidence is photoelectrically detected.
    Type: Grant
    Filed: March 8, 1978
    Date of Patent: February 9, 1982
    Assignee: Canon Kabushiki Kaisha
    Inventors: Akiyoshi Suzuki, Ryozo Hiraga, Ichiro Kano, Hideki Yoshinari, Masao Totsuka, Yuzo Kato, Yasuo Ogino
  • Patent number: 4278893
    Abstract: An alignment apparatus by which two points on a first standard line on a first workpiece may be aligned in two regions having as the centers two standard points on a second standard line on a second workpiece optically opposed to the first workpiece and having predetermined areas. The two regions are diamond-shaped. By this, it is possible to reduce the alignment error of the first and second workpieces.
    Type: Grant
    Filed: February 23, 1979
    Date of Patent: July 14, 1981
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yuzo Kato, Yasuo Ogino, Ryozo Hiraga, Hideki Yoshinari, Masao Tozuka, Ichiro Kano, Akiyoshi Suzuki
  • Patent number: 4275306
    Abstract: An alignment apparatus in which alignment marks on a mask and a wafer for producing a semiconductor circuit element are photoelectrically read and the positional deviation between the two alignment marks is detected and one of the mask and the wafer is parallel-moved in accordance with the detected amount to align the mask and wafer into a predetermined positional relation. This apparatus has the function of correcting any interval error which may be present between the alignment marks.
    Type: Grant
    Filed: February 23, 1979
    Date of Patent: June 23, 1981
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yuzo Kato, Yasuo Ogino, Ryozo Hiraga, Hideki Yoshinari, Masao Tozuka, Ichiro Kano
  • Patent number: 4262208
    Abstract: This invention relates to a photo-electrical detecting apparatus for forming a dark-field image of an object on a one-dimensional image sensor and reading said image photo-electrically. The apparatus includes a telecentric objective lens, and a light source image is formed on the clear aperture plane of said lens, said image being in focus in a direction on said plane and out of focus in a perpendicular direction. A line- or band-shaped area of the object is illuminated by the light from said light source image. Thus a dark-field image of the object is formed on said one-dimensional image sensor by providing, on a plane equivalent to said aperture plane, a filter which intercepts the normal reflected light from said object and transmits the scattered light therefrom.
    Type: Grant
    Filed: June 19, 1979
    Date of Patent: April 14, 1981
    Assignee: Canon Kabushiki Kaisha
    Inventors: Akiyoshi Suzki, Ichiro Kano, Hideki Yoshinari, Masao Tozuka, Ryozo Hiraga, Yuzo Kato, Yasuo Ogino
  • Patent number: 4229768
    Abstract: In the transmission of binary image signals obtained by scanning of an original document, a high signal compression ratio without deterioration in image quality is achieved by subjecting the binary image signals to a selective thinning process in which the signals of a run-length within a determined range are converted into signals of a determined length and by subsequently coding thus selectively thinned signals. A further improved signal compression is also established without deterioration of image quality by conducting, prior to the selective thinning process, preliminary processes such as elimination of isolated dots in the image or smoothing in the principal and auxiliary scanning directions.
    Type: Grant
    Filed: March 29, 1979
    Date of Patent: October 21, 1980
    Assignee: Canon Kabushiki Kaisha
    Inventors: Sadasuke Kurahayashi, Yuzo Kato, Asao Watanabe, Shin Tsuda, Hakaru Muto
  • Patent number: 4202627
    Abstract: An improved photoelectric detecting apparatus is disclosed in which a subject surface containing a pattern which diffracts light in a predetermined direction is scanned with spotlight and the diffracted light coming from the pattern is detected by means of photoelectric element so as to read out information of the pattern. The apparatus comprises a first photoelectric element for detecting the light diffracted in the predetermined direction, a second photoelectric element adapted for detecting light diffracted in directions other than the predetermined direction and an operational circuit for operating the signal derived from the first photoelectric element and that derived from the second one. Thus, when there is any diffractive matter such as flaw, dust and the like on the subject surface, diffracted light from the diffractive matter is detected by both the first and second photoelectric elements whereas diffracted light from the pattern is detected only by the first photoelectric element.
    Type: Grant
    Filed: April 28, 1978
    Date of Patent: May 13, 1980
    Assignee: Canon Kabushiki Kaisha
    Inventors: Akiyoshi Suzki, Ichiro Kano, Hideki Yoshinari, Masao Tozuka, Ryozo Hiraga, Yuzo Kato, Yasuo Ogino
  • Patent number: 4193097
    Abstract: This invention relates to the reduction in time required for signal transmission in facsimile apparatus, and consists of a transmitting apparatus adapted for eliminating the signal indicating the line thickness from the binary image signal obtained by scanning the original to be transmitted and transmitting thus obtained band-compressed transmission signal, and a receiving apparatus adapted for adding a signal approximately equal to the above-mentioned signal indicating the line thickness to the above-mentioned transmission signal thereby forming received image.
    Type: Grant
    Filed: April 25, 1978
    Date of Patent: March 11, 1980
    Assignee: Canon Kabushiki Kaisha
    Inventors: Sadasuke Kurahayashi, Yuzo Kato, Shin Tsuda, Hakaru Muto, Asao Watanabe