Patents by Inventor Yves Huttel

Yves Huttel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OBTAINING SAID SYSTEM
    Publication number: 20210318352
    Abstract: The invention relates to a system suitable for its use in scanning probe microscopy, such as tip-enhanced Raman spectroscopy or magnetic force microscopy, that comprises: a tip (1) comprising an apex (1?); a plurality of nanoparticles (2, 2?) attached to the tip (1); having a size between 0.5 and 100 nm. Advantageously, the plurality of nanoparticles (2, 2?) comprises a cluster (2?) of one or more nanoparticles (2?) disposed at the apex (1?) of the tip (1), wherein the cluster (2?) is spaced from any other nanoparticle (2) of the tip (1) at least a distance d of 0.5 nm. The invention also relates to a method for obtaining such system through a controlled thermal treatment that exploits the intrinsic properties of nanoparticles.
    Type: Application
    Filed: September 12, 2019
    Publication date: October 14, 2021
    Inventors: Lidia MARTINEZ ORELLANA, Yves HUTTEL
  • Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source
    Patent number: 9015861
    Abstract: The present invention relates to a method for covering Atomic Force Microscopy (AFM) tips by depositing a material in the form of nanoparticles with an aggregate source.
    Type: Grant
    Filed: May 4, 2011
    Date of Patent: April 21, 2015
    Assignee: Consejo Superior de Investigaciones Cientificas (CSIC)
    Inventors: Elisa Leonor Román García, Lidia Martínez Orellana, Mercedes Díaz Lagos, Yves Huttel
  • MODIFICATION OF ATOMIC FORCE MICROSCOPY TIPS BY DEPOSITION OF NANOPARTICLES WITH AN AGGREGATE SOURCE
    Publication number: 20130111637
    Abstract: The present invention relates to a method for covering Atomic Force Microscopy (AFM) tips by depositing a material in the form of nanoparticles with an aggregate source.
    Type: Application
    Filed: May 4, 2011
    Publication date: May 2, 2013
    Applicant: CONSEJO SUPERIOR DE INVESTICACIONES CIENTÍFICAS (CSIC)
    Inventors: Elisa Leonor Roman Garcia, Lidia Martinez Orellana, Mercedes Diaz Lagos, Yves Huttel