Patents by Inventor Yvez Danthez

Yvez Danthez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050024639
    Abstract: The invention relates to a device and a method for spectroscopic measurement of the spectrum of a light beam. According to the method, one detects the dispersed light fluxes of said beam on an imaging device comprising a matrix of photodetectors (23) with active columns (11). According to the invention, said imaging device (10) is directed so that one wavelength is allocated to a line (27) of photodetectors (12). One determines for each light flux (i=1, 2, . . . , n) the exposure time ?i necessary to measure a maximal intensity Imax and the sub-matrix Mi (13, 24-26) of photodetectors (12) associated with said light fluxes. One allocates to the sub-matrix Mi (13, 24-26) of photodetectors an exposure time ?!i so that ??i is the largest integer divider of the total integration time T smaller than ?i. During the integration time T of said spectrum, one measures and one resets, at each time ??i with i=(1, 2, . . .
    Type: Application
    Filed: September 2, 2004
    Publication date: February 3, 2005
    Inventors: Emmanuel Fretel, Yvez Danthez, Catherine Wallerand, Arshad Mirza