Patents by Inventor Yvon Nazon

Yvon Nazon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160318626
    Abstract: A system and a method are disclosed for managing a plurality of critical functions in an aircraft, the system comprising at least one data providing unit for providing digital signals, wherein at least one digital signal is associated with a given critical function of the plurality of critical functions; at least one transmission path coupled to the at least one providing unit; a memory unit for storing an operating system and a plurality of critical applications managing the plurality of critical functions; and a processing unit operatively coupled to the memory unit and configured to receive the digital signals along the at least one transmission path, the processing unit for executing the operating system and the plurality of critical applications, wherein the execution of the plurality of critical applications is managed by the operating system to accommodate fast loops and to ensure independence of the plurality of critical applications.
    Type: Application
    Filed: December 17, 2014
    Publication date: November 3, 2016
    Inventors: Franck Edward Gansmandel, Jacques Nacouzi, Étienne Alepins, Yvon Nazon, Patrick Cadotte, Frédérick Clément
  • Publication number: 20080192814
    Abstract: A physical-layer tester for testing a high-speed serial link between a mission-environment transmitter and a mission-environment receiver. The tester includes a data path and a measurement path. The data path allows a data signal transmitted from the mission-environment transmitter to be passed through the tester to the mission-environment receiver. The measurement path includes circuitry for use in analyzing characteristics of the high-speed serial data traffic on the high-speed serial link. The tester is placed in the high-speed serial link and allows the link to be tested while live, mission-environment data is present on the link. Methods for implementing in-link testing are also disclosed.
    Type: Application
    Filed: February 8, 2008
    Publication date: August 14, 2008
    Applicant: DFT Microsystems, Inc.
    Inventors: Mohamed M. Hafed, Donald Dansereau, Geoffrey Duerden, Sebastien Laberge, Yvon Nazon, Clarence Kar Lun Tam