Patents by Inventor Zachary Bednarke

Zachary Bednarke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11801003
    Abstract: At least one magnetic field actuator is configured for generating an actuated magnetic field that at least partially cancels an outside magnetic field, thereby yielding a total residual magnetic field. A plurality of magnetometers are configured for taking measurements of the total residual magnetic field. The magnetometers include a plurality of coarse magnetometers and a plurality of fine magnetometers. A processor is configured for acquiring the total residual magnetic field measurements from the coarse magnetometers, estimating the total residual magnetic field at the fine magnetometers based on total residual magnetic field measurements acquired from the plurality of coarse magnetometers, and controlling the actuated magnetic field at least partially based on the total residual magnetic field estimates at the fine magnetometers in a manner that suppresses the total residual magnetic field at the fine magnetometers to a baseline level, such that at least one of the fine magnetometers is in-range.
    Type: Grant
    Filed: January 27, 2021
    Date of Patent: October 31, 2023
    Assignee: HI LLC
    Inventors: Benjamin Shapiro, Ricardo Jimenez-Martinez, Julian Kates-Harbeck, Zachary Bednarke, Jamu Alford
  • Patent number: 11415641
    Abstract: A calibration arrangement of a magnetic field measurement device includes at least one attachment point nub configured for attachment to the magnetic field measurement device; mounting arms extending from the at least one attachment point nub; and reference coil loops distributed among the mounting arms. A magnetic field measurement system includes the calibration arrangement and a magnetic field measurement device including a sensor mounting body, magnetic field sensors disposed on or within the sensor mounting body, and at least one primary attachment point formed in or on the sensor mounting body configured to receive the at least one attachment point nub of the calibration arrangement.
    Type: Grant
    Filed: July 7, 2020
    Date of Patent: August 16, 2022
    Assignee: HI LLC
    Inventor: Zachary Bednarke
  • Publication number: 20210244330
    Abstract: At least one magnetic field actuator is configured for generating an actuated magnetic field that at least partially cancels an outside magnetic field, thereby yielding a total residual magnetic field. A plurality of magnetometers are configured for taking measurements of the total residual magnetic field. The magnetometers include a plurality of coarse magnetometers and a plurality of fine magnetometers. A processor is configured for acquiring the total residual magnetic field measurements from the coarse magnetometers, estimating the total residual magnetic field at the fine magnetometers based on total residual magnetic field measurements acquired from the plurality of coarse magnetometers, and controlling the actuated magnetic field at least partially based on the total residual magnetic field estimates at the fine magnetometers in a manner that suppresses the total residual magnetic field at the fine magnetometers to a baseline level, such that at least one of the fine magnetometers is in-range.
    Type: Application
    Filed: January 27, 2021
    Publication date: August 12, 2021
    Applicant: HI LLC
    Inventors: Benjamin Shapiro, Ricardo Jimenez-Martinez, Julian Kates-Harbeck, Zachary Bednarke, Jamu Alford
  • Publication number: 20210247468
    Abstract: Measurements of an arbitrary magnetic field having one or more magnetic field components are acquired from a plurality of magnetometers, and a generic model of at least one of the one or more magnetic field components of the arbitrary magnetic field is generated in the vicinity of the magnetometers. The generic magnetic field model comprises an initial number of different basis functions. Maxwell's equations are applied to the generic magnetic field model to reduce the initial number of different basis functions, thereby yielding a Maxwell-constrained model of the magnetic field component(s) of the arbitrary magnetic field, and the magnetic field component(s) of the arbitrary magnetic field are estimated at each of at least one of the magnetometers based on the constrained magnetic field model and the arbitrary magnetic field measurements acquired from each magnetometer.
    Type: Application
    Filed: January 27, 2021
    Publication date: August 12, 2021
    Applicant: HI LLC
    Inventors: Benjamin Shapiro, Zachary Bednarke, Ricardo Jiménez-Martínez, Julian Kates-Harbeck
  • Publication number: 20210011094
    Abstract: A calibration arrangement of a magnetic field measurement device includes at least one attachment point nub configured for attachment to the magnetic field measurement device; mounting arms extending from the at least one attachment point nub; and reference coil loops distributed among the mounting arms. A magnetic field measurement system includes the calibration arrangement and a magnetic field measurement device including a sensor mounting body, magnetic field sensors disposed on or within the sensor mounting body, and at least one primary attachment point formed in or on the sensor mounting body configured to receive the at least one attachment point nub of the calibration arrangement.
    Type: Application
    Filed: July 7, 2020
    Publication date: January 14, 2021
    Inventor: Zachary Bednarke