Patents by Inventor Zachary Erich Berndlmaier

Zachary Erich Berndlmaier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040190585
    Abstract: The present invention provides for calibrating a TSRO with two tests, wherein generating a first or second calibration value does not substantially alter the temperature performed within the first or second test. The first calibration value is generated during a first test at a first temperature. The first test can be a wafer test, a module test, a burn-in test, and so on. The first calibration value is stored with an e-fuse in the integrated circuit. A second calibration value is generated during a second integrated circuit test of the integrated circuit at a second temperature. The second test can be a test that is performed at a temperature other than the first test. The second calibration value is stored with an e-fuse in the integrated circuit.
    Type: Application
    Filed: March 27, 2003
    Publication date: September 30, 2004
    Applicant: International Business Machines Corporation
    Inventors: Zachary Erich Berndlmaier, Daniel Lawrence Stasiak, Michael Fan Wang