Abstract: Reticle patterns are formed upon a chrome-coated plate by means of forming a resist pattern upon the surface of the chrome having a predetermined thickness at which resonant absorption phenomenon occurs and a maximum rate of development is achieved. The resist layer should comply with the relationship ##EQU1## where .lambda. is representative of the chosen wavelength of the light source used to expose the resist, n is representative of the index of refraction of the resist for that chosen wavelength, and k is an integer ranging from 0 to 4. Resists with such thicknesses establish stationary wave phenomena in order to permit use of very thin resist layers. The value of k should preferably be one, for a resist thickness of about 1800 A where n equals 1.63 and .lambda. is about 4050 A for xenon lamps. The resist is then exposed by a pattern generator, developed, and a positive or negative pattern is formed by means of etching or a lift-off technique, respectively.