Abstract: A method for chemical identification of a sample having nanostructures includes the steps of irradiating the surface at wavelengths for each of a first and a second of the nanostructures that are uniquely absorbed by each of the first nanostructure and the second nanostructure such that each is excited to modulate at a first or a second nanostructure frequency, respectively. The method continues with the steps of irradiating the surface with electron beams incident on each of the first and second nanostructure, wherein at least one of secondary electrons, backscattered electrons and transmitted electrons are modulated at the frequency corresponding to each of the first and second nanostructure frequencies. A chemical map of the sample at an atomic scale is then created. A microscope is provided to carry out the method.

Abstract: A method for chemical identification of a sample having nanostructures includes the steps of irradiating the surface at wavelengths for each of a first and a second of the nanostructures that are uniquely absorbed by each of the first nanostructure and the second nanostructure such that each is excited to modulate at a first or a second nanostructure frequency, respectively. The method continues with the steps of irradiating the surface with electron beams incident on each of the first and second nanostructure, wherein at least one of secondary electrons, backscattered electrons and transmitted electrons are modulated at the frequency corresponding to each of the first and second nanostructure frequencies. A chemical map of the sample at an atomic scale is then created. A microscope is provided to carry out the method.

Abstract: A computer-implemented method, a device and a computer program product are proposed. The method comprises obtaining a resource service time of a transaction of an application. The resource service time indicates a time period when the transaction occupies a computer resource. The method further comprises obtaining a time-resource model. The time-resource model indicates a historical relationship among the resource service time, a resource wait time of the transaction, and a reference resource utilization of a second transaction of a second application. The resource wait time indicates a time period when the transaction waits for the computer resource to become available, and the reference resource utilization indicates a degree of the second transaction occupying the computer resource during a time period when the second transaction is running Additionally, the method further comprises determining transaction run time based on the resource service time and the time-resource model.

Abstract: In an example, a logic apparatus of an interface board in a network device may generate an Ethernet flow control packet including sending completion information according to Ethernet data packets sent from a sending buffering queue maintained in the interface board. The logic apparatus of the interface board may transmit the Ethernet flow control packet including sending completion information to an Ethernet data channel by taking priority over Ethernet data packets in a receiving buffering queue in an ingress direction. The sending completion information is used by a CPU of a mainboard to maintain a state of the sending buffering queue.

Abstract: A double-tilt in-situ nanoindentation platform for TEM (transmission electron microscope) belongs to the field of in-situ characterization of the mechanical property-microstructure relationship of materials at the nano- and atomic scale. The platform is consisted of adhesive area, support beams, bearing beams, sample loading stage and mini indenter. The overall structure of the platform is prepared by semiconductor microfabrication technology. The in-situ nanoindentation experiment can be driven by bimetallic strip, V-shaped electro-thermal beam, piezoelectric ceramics, electrostatic comb or shape memory alloys et. al. The sample is obtained by focused ion beam cutting. The integrated platform can be placed in the narrow space on the front end of the TEM sample holder, giving rise to the condition of double-axis tilt. The driving device drives the mini indenter to carry out in-situ nanoindentation, in-situ compression and in-situ bending and the like of the materials in TEM.

Abstract: The present invention provides methods for low temperature desulfating sulfur-poisoned SCR catalysts, and emission control systems adapted to apply such desulfating methods, in order to regenerate catalytic NOx conversion activity. The methods are adapted for treating an SCR catalyst to desorb sulfur from the surface of the SCR catalyst and increase NOx conversion activity of the SCR catalyst, the treating step including treating the SCR catalyst with a gaseous stream comprising a reductant for a first treatment time period and at a first treatment temperature, wherein the first treatment temperature is about 350° C. or less, followed by a second treatment time period and a second treatment temperature higher than the first treatment temperature, wherein the molar ratio of reductant to NOx during the treating step is about 1.05:1 or higher.

Abstract: A double-tilt in-situ mechanical sample holder for TEM based on piezoelectric ceramic drive belongs to the field of material microstructure-mechanical properties in-situ characterization, and it comprise two parts of sample holder shaft body and piezoelectric ceramic drive system. The sample holder shaft body comprise tilt stage, sample holder, linear stepping motor, drive rod, drive linkage. The piezoelectric ceramic drive system comprise piezoelectric ceramic loading stage, piezoelectric ceramic, connecting base and the sample loading stage realizing stretch or compression function. The double-axis tilt of the samples in X and Y axis directions is realized by the reciprocating motion back and forth of the drive rod driven by the linear stepping motor. The stretch or compression of the samples is realized by applying voltage on the piezoelectric ceramic to generate displacement and push the sample loading stage by the connecting base.

Abstract: A double-tilt sample holder for TEM, comprising: it comprise the main body of sample holder body, front-end tilt stage, drive rod, linkage, tilt axis, rotation axis, fixed axis of drive rod and sample loading stage. The axis hole is arranged at the front-end tilt stage, which is connected to the main body of the sample holder body by the tilt axis. The linkage, the boss slot and the drive rod slot are connected by the rotation axis. Two through movement guide grooves are designed symmetrically at both sides of the front-end of sample holder body, and the drive rod is fixed by the fixed axis of the drive rod, which restricts the drive rod to move reciprocally in a straight line driven by the linear stepping motor at the back-end of the main body of the holder body, further leading the tilt stage to rotate around the tilt axis. The tilt angle of the sample loading stage can be precisely controlled by the high precision linear stepping motor in the apparatus.

Abstract: A display module detection device is disclosed. The display module detection device includes a storage module, in which configuration parameters of multiple types of display modules are pre-stored for determining a configuration parameter to be outputted by the storage module based on a type of a display module to be detected, and a test system module being communicatively connected with the storage module and configured for determining an output parameter of a test signal output interface based on the configuration parameter outputted by the storage module.

Abstract: A flexible circuit board and a cutting device are provided. The flexible circuit board includes a board body including a cutting region. A plurality rows of testing terminals are located in the cutting region, a first spacing being provided between two adjacent rows of testing terminals. The testing terminals can be respectively cut off from the board body along a cutting direction which is along the extending direction of the first spacing in the board body. A testing circuit is located on a surface of the board body. The testing circuit is arranged in a region outside the cutting region and the testing circuit is independently and electrically connected to each row of the testing terminals.

Abstract: A double-tilt in-situ nanoindentation platform for TEM (transmission electron microscope) belongs to the field of in-situ characterization of the mechanical property-microstructure relationship of materials at the nano- and atomic scale. The platform is consisted of adhesive area, support beams, bearing beams, sample loading stage and mini indenter. The overall structure of the platform is prepared by semiconductor microfabrication technology. The in-situ nanoindentation experiment can be driven by bimetallic strip, V-shaped electro-thermal beam, piezoelectric ceramics, electrostatic comb or shape memory alloys et. al. The sample is obtained by focused ion beam cutting. The integrated platform can be placed in the narrow space on the front end of the TEM sample holder, giving rise to the condition of double-axis tilt. The driving device drives the mini indenter to carry out in-situ nanoindentation, in-situ compression and in-situ bending and the like of the materials in TEM.

Abstract: In an example, a logic apparatus of an interface board in a network device may generate an Ethernet flow control packet including sending completion information according to Ethernet data packets sent from a sending buffering queue maintained in the interface board. The logic apparatus of the interface board may transmit the Ethernet flow control packet including sending completion information to an Ethernet data channel by taking priority over Ethernet data packets in a receiving buffering queue in an ingress direction. The sending completion information is used by a CPU of a mainboard to maintain a state of the sending buffering queue.

Abstract: The present invention discloses a touch panel scribing detection device and a detection method thereof. The touch panel scribing detection device includes a loading platform, a scribing standardization unit, a test unit and a signal unit. The touch panel scribing detection device can provide an accurate scribing test path, so the accuracy and efficiency of manual test on a touch panel can be improved.

Abstract: In an example for implementing a process under a superuser privilege within a computing device, a monitor function library for monitoring an executable function is loaded when the process acquires the superuser privilege. When it is detected that the process runs the executable function, the monitor function library may suspend the running of the executable function, and output process monitoring information. If a feedback to the process monitoring information indicates that it is allowable to perform the executable function, a system function library is invoked to perform the executable function the process runs.

Abstract: A double-tilt sample holder for TEM, comprising: it comprise the main body of sample holder body, front-end tilt stage, drive rod, linkage, tilt axis, rotation axis, fixed axis of drive rod and sample loading stage. The axis hole is arranged at the front-end tilt stage, which is connected to the main body of the sample holder body by the tilt axis. The linkage, the boss slot and the drive rod slot are connected by the rotation axis. Two through movement guide grooves are designed symmetrically at both sides of the front-end of sample holder body, and the drive rod is fixed by the fixed axis of the drive rod, which restricts the drive rod to move reciprocally in a straight line driven by the linear stepping motor at the back-end of the main body of the holder body, further leading the tilt stage to rotate around the tilt axis. The tilt angle of the sample loading stage can be precisely controlled by the high precision linear stepping motor in the apparatus.

Abstract: A double-tilt in-situ mechanical sample holder for TEM based on piezoelectric ceramic drive belongs to the field of material microstructure-mechanical properties in-situ characterization, and it comprise two parts of sample holder shaft body and piezoelectric ceramic drive system. The sample holder shaft body comprise tilt stage, sample holder, linear stepping motor, drive rod, drive linkage. The piezoelectric ceramic drive system comprise piezoelectric ceramic loading stage, piezoelectric ceramic, connecting base and the sample loading stage realizing stretch or compression function. The double-axis tilt of the samples in X and Y axis directions is realized by the reciprocating motion back and forth of the drive rod driven by the linear stepping motor. The stretch or compression of the samples is realized by applying voltage on the piezoelectric ceramic to generate displacement and push the sample loading stage by the connecting base.

Abstract: The present invention provides a method and a system for ordering browsing histories, wherein the method for ordering browsing histories includes: receiving a triggering instruction of a user for viewing browsing histories; acquiring the geographical location information of a current location; extracting browsing histories corresponding to the geographical location information; and displaying the browsing histories extracted. The present invention also discloses a system for ordering browsing histories. The method and the system for ordering browsing histories provided by the present invention can order the browsing histories according to the geographical location information of the user, and enable the user to quickly find the history to be browsed, thus improving the user experience.

Abstract: A method for preparing a comb-like polyurethane, including: 1) adding a diol to a reaction vessel, stirring, heating, vacuum dehydrating, and cooling the diol; adding a diisocyanate to the diol, and pre-polymerizing the diisocyanate and the diol under vacuum to yield a polyurethane prepolymer; 2) dissolving lysine in a mixture of water and an organic solvent to yield a first solution, adding the first solution to the polyurethane prepolymer to yield a first reaction mixture; stopping stirring and allowing the first reaction mixture to stand for between 10 and 12 hrs, pouring the first reaction mixture into water, and drying a precipitate to yield a polyurethane elastomer containing carboxyl groups; 3) dissolving the polyurethane elastomer in an organic solvent to yield a second solution; adding an epoxy-terminated polyethylene glycol to the second solution, and stirring a resulting mixture at between 110 and 130° C.

Abstract: A flexible circuit board and a cutting device are provided. The flexible circuit board includes a board body including a cutting region. A plurality rows of testing terminals are located in the cutting region, a first spacing being provided between two adjacent rows of testing terminals. The testing terminals can be respectively cut off from the board body along a cutting direction which is along the extending direction of the first spacing in the board body. A testing circuit is located on a surface of the board body. The testing circuit is arranged in a region outside the cutting region and the testing circuit is independently and electrically connected to each row of the testing terminals.

Abstract: A first pair of resistors formed in a first layer of material, and a second pair of resistors formed in the first layer or in a second layer can be wired into a Wheatstone bridge to form a temperature sensor. Either layer can include a semiconductor or a dielectric. In a semiconductor layer, a pair of resistors can be doped areas of the layer, while in a dielectric, a pair of resistors can be material deposited in cavities in the layer, such as material from an added “middle-of-line” (MOL) metallization layer.