Abstract: In a process, a power mode indicator is transmitted from a content server and is received by a Portable Communication Device (PCD). The indicator is indicative of a power mode potentially available to a circuit block in the PCD. The circuit block exhibits different levels of power consumption when operated in different power modes and is operated in the indicated power mode in response to the received power mode indicator. The content server may be a stream server. The circuit block may be operated in the power mode to receive/process a data stream.

Abstract: The embodiments protect an IC against Design-For-Test (DFT) or other test mode attack. Secrets in ROM or PROM are secured. One embodiment for securing information on an IC includes receiving a ROM read command, writing data from a plurality of ROM address locations to an encryption logic in response to receiving the ROM read command, and writing an encryption logic output of the encryption logic to a test control logic, the encryption logic output representing the data from the plurality of ROM address locations. Writing the data from the plurality of ROM address locations to the encryption logic may also include writing the data from the plurality of ROM address locations to a multiple input shift register (MISR) in response to the ROM read command, and writing an MISR output to the test control logic, the MISR output representing the data from the plurality of ROM address locations.

Abstract: In a process, a power mode indicator is transmitted from a content server and is received by a Portable Communication Device (PCD). The indicator is indicative of a power mode potentially available to a circuit block in the PCD. The circuit block exhibits different levels of power consumption when operated in different power modes and is operated in the indicated power mode in response to the received power mode indicator. The content server may be a stream server. The circuit block may be operated in the power mode to receive/process a data stream.

Abstract: The embodiments protect an IC against Design-For-Test (DFT) or other test mode attack. Transitory secrets are secured whether stored in registers or latches, RAM, and/or permanent secrets stored in ROM and/or PROM. One embodiment for securing information on an IC includes entering a test mode and resetting each register in response to entering the test mode of operation and prior to receiving a test mode command. An integrated circuit embodiment includes a test control logic operative to configure the integrated circuit into a test mode and to control the integrated circuit while in the test mode, a set of registers, and a functional reset controller coupled to the test control logic and to the set of registers, operative to receive a reset command from the test control logic and provide the reset command to the set of registers in response to a command to enter the test mode.

Abstract: The embodiments protect an IC against Design-For-Test (DFT) or other test mode attack. Secrets in ROM or PROM are secured. One embodiment for securing information on an IC includes receiving a ROM read command, writing data from a plurality of ROM address locations to an encryption logic in response to receiving the ROM read command, and writing an encryption logic output of the encryption logic to a test control logic, the encryption logic output representing the data from the plurality of ROM address locations. Writing the data from the plurality of ROM address locations to the encryption logic may also include writing the data from the plurality of ROM address locations to a multiple input shift register (MISR) in response to the ROM read command, and writing an MISR output to the test control logic, the MISR output representing the data from the plurality of ROM address locations.

Abstract: The embodiments protect an IC against Design-For-Test (DFT) or other test mode attack. Transitory secrets are secured whether stored in registers or latches, RAM, and/or permanent secrets stored in ROM and/or PROM. One embodiment for securing information on an IC includes entering a test mode and resetting each register in response to entering the test mode of operation and prior to receiving a test mode command. An integrated circuit embodiment includes a test control logic operative to configure the integrated circuit into a test mode and to control the integrated circuit while in the test mode, a set of registers, and a functional reset controller coupled to the test control logic and to the set of registers, operative to receive a reset command from the test control logic and provide the reset command to the set of registers in response to a command to enter the test mode.