Abstract: A device for storing and circulating drinking water with vortex flow includes a base, a tank and an actuator housed in the base and configured to circulate the drinking water stored in the tank with vortex flow. The base includes an inlet port through which the drinking water is received and an outlet port through which the drinking water is dispensed. The tank is mounted on the base with a sealed engagement and is configured to store the drinking water. The tank has spherical or egg shape and includes an air inlet on an upper portion of the tank through which air can flow in and out of the tank.

Abstract: There are provided a classifier and a method of classifying defects in a semiconductor specimen. The classifier enables assigning each class to a classification group among three or more classification groups with different priorities. Classifier further enables setting purity, accuracy and/or extraction requirements separately for each class, and optimizing the classification results in accordance with per-class requirements. During training, the classifier is configured to generate a classification rule enabling the highest possible contribution of automated classification while meeting per-class quality requirements defined for each class.

Abstract: A device for storing and circulating drinking water with vortex flow includes a base, a tank and an actuator housed in the base and configured to circulate the drinking water stored in the tank with vortex flow. The base includes an inlet port through which the drinking water is received and an outlet port through which the drinking water is dispensed. The tank is mounted on the base with a sealed engagement and is configured to store the drinking water. The tank has spherical or egg shape and includes an air inlet on an upper portion of the tank through which air can flow in and out of the tank.

Abstract: Inspection apparatus includes an imaging module, which is configured to capture images of defects at different, respective locations on a sample. A processor is coupled to process the images so as to automatically assign respective classifications to the defects, and to autonomously control the imaging module to continue capturing the images responsively to the assigned classifications.

Abstract: A method for generating a synthetic image of a region of an object, includes: generating, by a charged particle microscope, a charged particle microscope image of the region of the object; calculating a sparse representation of the charged particle microscope image; wherein the sparse representation of the charged particle microscope image comprises multiple first atoms; generating the synthetic image of the region, wherein the synthetic image of the region is formed from multiple second atoms; wherein the generating of the synthetic image of the region is based on a mapping between the multiple first atoms and the multiple second atoms; wherein the charged particle microscope image and the multiple first atoms are of a first resolution; and wherein the synthetic image of the region and the multiple second atoms are of a second resolution that is finer than the first resolution.

Abstract: Inspection apparatus includes an imaging module, which is configured to capture images of defects at different, respective locations on a sample. A processor is coupled to process the images so as to automatically assign respective classifications to the defects, and to autonomously control the imaging module to continue capturing the images responsively to the assigned classifications.

Abstract: There are provided a classifier and a method of classifying defects in a semiconductor specimen. The classifier enables assigning each class to a classification group among three or more classification groups with different priorities. Classifier further enables setting purity, accuracy and/or extraction requirements separately for each class, and optimizing the classification results in accordance with per-class requirements. During training, the classifier is configured to generate a classification rule enabling the highest possible contribution of automated classification while meeting per-class quality requirements defined for each class.

Abstract: A method for generating a synthetic image of a region of an object, includes: generating, by a charged particle microscope, a charged particle microscope image of the region of the object; calculating a sparse representation of the charged particle microscope image; wherein the sparse representation of the charged particle microscope image comprises multiple first atoms; generating the synthetic image of the region, wherein the synthetic image of the region is formed from multiple second atoms; wherein the generating of the synthetic image of the region is based on a mapping between the multiple first atoms and the multiple second atoms; wherein the charged particle microscope image and the multiple first atoms are of a first resolution; and wherein the synthetic image of the region and the multiple second atoms are of a second resolution that is finer than the first resolution.

Abstract: Inspection apparatus includes an imaging module, which is configured to capture images of defects at different, respective locations on a sample. A processor is coupled to process the images so as to automatically assign respective classifications to the defects, and to autonomously control the imaging module to continue capturing the images responsively to the assigned classifications.

Abstract: A device for mounting a display associated with a computing device onto a vertical surface, the device including a body portion including an opening enabling a user to view a display associated with a computing device, at least one body mounting mechanism, functionally associated with the body portion, for mounting the body portion onto a surface, a wire concealing portion, functionally associated with the body portion and accommodating at least one wire connected to the display, the wire concealing portion including at least one wire mounting mechanism, and at least one flexible portion connecting the body portion to the wire concealing portion.

Abstract: Inspection apparatus includes an imaging module, which is configured to capture images of defects at different, respective locations on a sample. A processor is coupled to process the images so as to automatically assign respective classifications to the defects, and to autonomously control the imaging module to continue capturing the images responsively to the assigned classifications.

Abstract: A system and method for automatic defect classification is provided including at least one tool handler to receive a defect result file and at least one image file from a remote defect inspection tool, a process controller to create a data set from the defect result file and at least one image file, a database including a set of automated defect classification system (CADC) session data that includes data related to the data set, and a classification engine to automatically classify defects in the data set. A system and method for an automated monitoring system is provided including a production automatic defect classification (ADC) system, a monitoring CADC, and a monitor process to compare the defect result files of the production ADC system and said monitoring CADC.