Patents by Inventor Zehui Lin

Zehui Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230420671
    Abstract: A positive electrode active material includes an active material A having a composition formula of Lix1Nia1Cob1Mnc1O2-y1Qy1, an active material B having a composition formula of Lix2Nia2Cob2Mnc2O2-y2Qy2, and an active material C having a composition formula of Lix3Nia3Cob3Mnc3O2-y3Qy3, where the subscripts in the formulae are as defined in the description. The active material A has an average particle size Dv50 greater than both an average particle size Dv50 of the active material B and an average particle size Dv50 of the active material C.
    Type: Application
    Filed: September 11, 2023
    Publication date: December 28, 2023
    Inventors: Zehui LIN, Huan NI, Hongyu LIU
  • Patent number: 11094111
    Abstract: A progressive photon mapping method based on statistical test includes launching rays from the viewpoint to each pixel on the image plane and intersecting the three-dimensional scene to be rendered. If an intersection with diffuse surface is found on the tracing path, it is recorded as the hit point; a photon pass is performed: 31) performing photon tracing step; 32) performing photon collection processing for each hit point; 33) if the current iteration of photon pass does not need chi-square test, then performing flux accumulation and keeping the collection radius unchanged; if chi-square is required, evaluating the photon distribution quality; computing a collection radius according to the estimated photon distribution, and performing the flux accumulation in the current photon pass; 34) if the photon collection radius is reduced, then performing distributed ray tracing, generating new hit points, and go to 31), otherwise go to 31), start a new iteration of photon pass.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: August 17, 2021
    Assignee: Peking University
    Inventors: Sheng Li, Zehui Lin, Xinlu Zeng, Guoping Wang
  • Publication number: 20210118222
    Abstract: A progressive photon mapping method based on statistical test includes launching rays from the viewpoint to each pixel on the image plane and intersecting the three-dimensional scene to be rendered. If an intersection with diffuse surface is found on the tracing path, it is recorded as the hit point; a photon pass is performed: 31) performing photon tracing step; 32) performing photon collection processing for each hit point; 33) if the current iteration of photon pass does not need chi-square test, then performing flux accumulation and keeping the collection radius unchanged; if chi-square is required, evaluating the photon distribution quality; computing a collection radius according to the estimated photon distribution, and performing the flux accumulation in the current photon pass; 34) if the photon collection radius is reduced, then performing distributed ray tracing, generating new hit points, and go to 31), otherwise go to 31), start a new iteration of photon pass.
    Type: Application
    Filed: March 30, 2018
    Publication date: April 22, 2021
    Inventors: Sheng Li, Zehui Lin, Xinlu Zeng, Guoping Wang