Patents by Inventor Zen MIYAZAKI

Zen MIYAZAKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10928281
    Abstract: Provided are a material testing machine and a gripping force detecting method that can easily judge whether a test piece is gripped with an appropriate gripping force by a gripper. A controlling section is connected to a FFT transforming section via a load cell; the FFT transforming section calculates a natural frequency of a system comprising a test piece and an upper gripper which is connected to a load cell based on a detected value of a force of the load cell. In addition, the controlling section is connected to a storing section which stores the natural frequency calculated by the FFT transforming section. Furthermore, the controlling section is also connected to a comparing section which compares the natural frequency calculated by the FFT transforming section and the natural frequency stored by the storing section before a test starts.
    Type: Grant
    Filed: October 22, 2018
    Date of Patent: February 23, 2021
    Assignee: SHIMADZU CORPORATION
    Inventors: Shogoro Iwakiri, Zen Miyazaki
  • Publication number: 20190154554
    Abstract: Provided are a material testing machine and a gripping force detecting method that can easily judge whether a test piece is gripped with an appropriate gripping force by a gripper. A controlling section is connected to a FFT transforming section via a load cell; the FFT transforming section calculates a natural frequency of a system comprising a test piece and an upper gripper which is connected to a load cell based on a detected value of a force of the load cell. In addition, the controlling section is connected to a storing section which stores the natural frequency calculated by the FFT transforming section. Furthermore, the controlling section is also connected to a comparing section which compares the natural frequency calculated by the FFT transforming section and the natural frequency stored by the storing section before a test starts.
    Type: Application
    Filed: October 22, 2018
    Publication date: May 23, 2019
    Applicant: SHIMADZU CORPORATION
    Inventors: Shogoro IWAKIRI, Zen MIYAZAKI
  • Publication number: 20180364140
    Abstract: An evaluation method of an impact test and an impact tester are provided, capable of simply and accurately obtaining a natural frequency of the impact tester without adding a special machine for measuring the natural frequency of the impact tester. A personal computer includes, as a functional configuration, a data extraction section extracting from time-series data of force a data section for obtaining a natural frequency of an impact tester in a natural vibration analysis, and an analysis section carrying out a frequency spectrum analysis on the extracted data section. The data extraction section and the analysis section are respectively stored as a data extraction program and an analysis program in a memory.
    Type: Application
    Filed: June 15, 2018
    Publication date: December 20, 2018
    Applicant: SHIMADZU CORPORATION
    Inventors: Zen MIYAZAKI, Tsukasa NISHIMURA
  • Publication number: 20180364139
    Abstract: An evaluation method of an impact test and an impact tester are provided. A personal computer includes, as a functional configuration, a data extraction section extracting from time-series data of force a data section for obtaining a natural frequency of an impact tester in a natural vibration analysis, an analysis section carrying out a frequency spectrum analysis on the extracted data section, and a vibration waveform removal section removing a natural vibration waveform of the impact tester from force data. The data extraction section, the analysis section and the vibration waveform removal section are respectively stored as a data extraction program, an analysis program and a vibration waveform removal program in a memory.
    Type: Application
    Filed: June 15, 2018
    Publication date: December 20, 2018
    Applicant: SHIMADZU CORPORATION
    Inventors: Zen MIYAZAKI, Tsukasa NISHIMURA