Patents by Inventor Zengyuan GAI

Zengyuan GAI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DEFECT DETECTION METHOD AND APPARATUS, AND ELECTRONIC DEVICE
    Publication number: 20240296537
    Abstract: A defect detection method and apparatus and an electronic device are disclosed. The method comprises: acquiring an image of an object to be detected (S1100); acquiring brightness information of pixels in the image (S1200); and acquiring appearance defect information of the object to be detected based on the brightness information (S1300), wherein the appearance defect information represents defects existing in an appearance of the object to be detected. This method enables the electronic device to quickly and accurately obtain the appearance defect information of the object to be detected, thereby saving human labor and improving the user experience.
    Type: Application
    Filed: June 24, 2021
    Publication date: September 5, 2024
    Applicant: GOERTEK INC.
    Inventors: Zengyuan GAI, Xiaoyu CHI