Patents by Inventor Zeno Schumacher

Zeno Schumacher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ATOMIC FORCE MICROSCOPY USING CORRELATED PROBE OSCILLATION AND PROBE-SAMPLE BIAS VOLTAGE
    Publication number: 20150276795
    Abstract: A method of Atomic Force Microscopy (AFM). A first drive signal is generated for causing a periodic motion of a probe tip in a direction normal to a sample surface. The first drive signal has a known amplitude and frequency. A bias signal is generated for applying an electric potential to the probe tip relative to a potential the sample surface. At least one component of the bias signal is oscillatory and correlated with the periodic motion of the probe tip. A response of the probe tip is detected, and analyzed by a processor to infer information about a composition of the sample surface.
    Type: Application
    Filed: April 1, 2014
    Publication date: October 1, 2015
    Applicant: CHIPWORKS INCORPORATED
    Inventors: Jessica Maude TOPPLE, Yoichi MIYAHARA, Peter Heinz GRUTTER, Zeno Schumacher