Patents by Inventor Zephaniah Phillips, V

Zephaniah Phillips, V has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Photodetector selection apparatus and method and scattering coefficient measurement apparatus and method
    Patent number: 10502683
    Abstract: A photodetector selection apparatus and method and a scattering coefficient measurement apparatus and method are provided. The photodetector selection apparatus for measuring a scattering coefficient may include: a light source configured to emit light to a subject; a photodetector array configured to detect the light that is reflected or scattered from the subject and measure a light intensity of the detected light; and a processor configured to select at least one photodetector from a plurality of photodetectors of the photodetector array, based on a change in the measured light intensity of each of the plurality of photodetectors according to a change in a scattering coefficient of the subject, and determine the scattering coefficient of the subject based on the light intensity that is measured by the selected at least one photodetector.
    Type: Grant
    Filed: July 5, 2018
    Date of Patent: December 10, 2019
    Assignees: SAMSUNG ELECTRONICS CO., LTD., Korea University Research and Business Foundation
    Inventors: Joon Hyung Lee, Beop Min Kim, Jung Yong Nam, Ki Young Chang, Zephaniah Phillips, V, Seung Ho Paik
  • PHOTODETECTOR SELECTION APPARATUS AND METHOD AND SCATTERING COEFFICIENT MEASUREMENT APPARATUS AND METHOD
    Publication number: 20190033212
    Abstract: A photodetector selection apparatus and method and a scattering coefficient measurement apparatus and method are provided. The photodetector selection apparatus for measuring a scattering coefficient may include: a light source configured to emit light to a subject; a photodetector array configured to detect the light that is reflected or scattered from the subject and measure a light intensity of the detected light; and a processor configured to select at least one photodetector from a plurality of photodetectors of the photodetector array, based on a change in the measured light intensity of each of the plurality of photodetectors according to a change in a scattering coefficient of the subject, and determine the scattering coefficient of the subject based on the light intensity that is measured by the selected at least one photodetector.
    Type: Application
    Filed: July 5, 2018
    Publication date: January 31, 2019
    Applicants: SAMSUNG ELECTRONICS CO., LTD., Korea University Research and Business Foundation
    Inventors: Joon Hyung LEE, Beop Min KIM, Jung Yong NAM, Ki Young CHANG, Zephaniah Phillips, V, Seung Ho PAIK