Abstract: Disclosed is a device for measuring a property of a material. The device comprises a base; a sensor, the sensor being in a fixed coupling with the base; an indenter, the indenter being slidably coupled to the base to move relative to the base in an axial direction in response to a first abutment of the indenter with a surface of the material such that the indenter provides a push force to the sensor in the axial direction; and a locking device, the locking device being configured to releasably lock the indenter in a locked state in response to a second abutment of the base with the surface of the material, wherein the indenter in the locked state is prevented from moving relative to the base in the axial direction. Also disclosed is a new method of measuring Young's modulus of a material.