Patents by Inventor Zewu Chen

Zewu Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140105363
    Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
    Type: Application
    Filed: October 11, 2013
    Publication date: April 17, 2014
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu CHEN, David M. GIBSON, Walter M. GIBSON, Adam BAILEY, R. Scott SEMKEN, Kai XIN, John H. BURDETT, JR.
  • Patent number: 8625737
    Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
    Type: Grant
    Filed: February 8, 2011
    Date of Patent: January 7, 2014
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Sony Cheriyan, Kai Xin, Jay Burdett
  • Patent number: 8559597
    Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
    Type: Grant
    Filed: March 3, 2009
    Date of Patent: October 15, 2013
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett
  • Publication number: 20120321045
    Abstract: This invention relates in general to the determination of silicon levels in fuel mixtures, such as petroleum products. More particularly, the present invention relates to compositions for use as standards in an x-ray analyzer for the measurement of silicon in various fuel mixtures, and to methods of using these compositions.
    Type: Application
    Filed: June 14, 2012
    Publication date: December 20, 2012
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: James CARNAHAN, Zewu CHEN, Leslie JOHNSON
  • Patent number: 8050382
    Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream suspended in the space and streaming through the focal area, using a laminar air flow and/or pressure to define the stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
    Type: Grant
    Filed: February 24, 2009
    Date of Patent: November 1, 2011
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Rory Delaney, Kai Xin
  • Publication number: 20110194671
    Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
    Type: Application
    Filed: February 8, 2011
    Publication date: August 11, 2011
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu CHEN, Sony CHERIYAN, Kai XIN, Jay BURDETT
  • Patent number: 7991116
    Abstract: An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.
    Type: Grant
    Filed: July 26, 2006
    Date of Patent: August 2, 2011
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Ning Gao, Walter Gibson
  • Publication number: 20110170666
    Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
    Type: Application
    Filed: March 3, 2009
    Publication date: July 14, 2011
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett
  • Patent number: 7899154
    Abstract: An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: March 1, 2011
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Li Danhong
  • Patent number: 7738629
    Abstract: A diffracting x-ray optic for accepting and redirecting x-rays. The optic includes at least two layers, the layers having a similar or differing material composition and similar or differing crystalline orientation. Each of the layers exhibits a diffractive effect, and their collective effect provides a diffractive effect on the received x-rays. In one embodiment, the layers are silicon, and are bonded together using a silicon-on-insulator bonding technique. In another embodiment, an adhesive bonding technique may be used. The optic may be a curved, monochromating optic.
    Type: Grant
    Filed: November 16, 2007
    Date of Patent: June 15, 2010
    Assignee: X-Ray Optical Systems, Inc.
    Inventor: Zewu Chen
  • Patent number: 7738630
    Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.
    Type: Grant
    Filed: March 4, 2009
    Date of Patent: June 15, 2010
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: John H. Burdett, Jr., Adam Bailey, Zewu Chen, R. Scott Semken, Kai Xin
  • Publication number: 20100046702
    Abstract: An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.
    Type: Application
    Filed: March 14, 2008
    Publication date: February 25, 2010
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu Chen, Li Danhong
  • Publication number: 20090225948
    Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.
    Type: Application
    Filed: March 4, 2009
    Publication date: September 10, 2009
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: John H. BURDETT, JR., Adam BAILEY, Zewu CHEN, R. Scott SEMKEN, Kai XIN
  • Publication number: 20090225947
    Abstract: An x-ray imaging system includes an optical device having at least one point-focusing, curved monochromating optic for directing x-rays from an x-ray source towards a focal point. The at least one point-focusing, curved monochromating optic provides a focused monochromatic x-ray beam directed towards the focal point, and a detector is aligned with the focused monochromatic x-ray beam. The optical device facilitates x-ray imaging of an object when the object is located between the optical device and the detector within the focused monochromatic x-ray beam. In various embodiments: each point-focusing, curved monochromatic optic has an optical surface that is doubly-curved; the optical device facilitates passive image demagnification or magnification depending upon placement of the object and detector relative to the focal point; and at least one second point-focusing, curved monochromatic optic can be employed to facilitate refractive index or polarized beam imaging of the object.
    Type: Application
    Filed: July 31, 2006
    Publication date: September 10, 2009
    Applicants: X-RAY OPTICAL SYSTEMS, INC., THE RESEARCH FOUNDATION OF STATE UNIVERSITY OF NEW YORK
    Inventors: Carolyn A. MacDonald, Noor Mail, Zewu Chen
  • Patent number: 7583789
    Abstract: An x-ray imaging system includes an optical device having at least one point-focusing, curved monochromating optic for directing x-rays from an x-ray source towards a focal point. The at least one point-focusing, curved monochromating optic provides a focused monochromatic x-ray beam directed towards the focal point, and a detector is aligned with the focused monochromatic x-ray beam. The optical device facilitates x-ray imaging of an object when the object is located between the optical device and the detector within the focused monochromatic x-ray beam. In various embodiments: each point-focusing, curved monochromatic optic has an optical surface that is doubly-curved; the optical device facilitates passive image demagnification or magnification depending upon placement of the object and detector relative to the focal point; and at least one second point-focusing, curved monochromatic optic can be employed to facilitate refractive index or polarized beam imaging of the object.
    Type: Grant
    Filed: July 31, 2006
    Date of Patent: September 1, 2009
    Assignees: The Research Foundation of State University of New York, X-Ray Optical Systems, Inc.
    Inventors: Carolyn A. MacDonald, Noor Mail, Zewu Chen
  • Publication number: 20090213988
    Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream suspended in the space and streaming through the focal area, using a laminar air flow and/or pressure to define the stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
    Type: Application
    Filed: February 24, 2009
    Publication date: August 27, 2009
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu CHEN, Rory DELANEY, Kai XIN
  • Publication number: 20090161829
    Abstract: An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.
    Type: Application
    Filed: July 26, 2006
    Publication date: June 25, 2009
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu Chen, Ning Gao, Walter Gibson
  • Patent number: 7519159
    Abstract: A method and device for cooling and electrically-insulating a high-voltage, heat-generating component, for example, an x-ray tube (1105) for analyzing fluids by means of x-ray fluorescence. The device includes an x-ray source (1100) including an x-ray tube (1105) having improved heat-dissipating properties due to the thermal coupling of the x-ray tube with a thermally-conductive, dielectric material (1150). The device may include a base assembly (1135) mounted to the component for conducting heat away from the component while electrically isolating the component. In one aspect of the invention, the base assembly includes two copper plates (1140, 1145) separated by a dielectric plate (1150). The dielectric plate minimizes or prevents the leakage of current through the base assembly (1135). One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.
    Type: Grant
    Filed: April 14, 2006
    Date of Patent: April 14, 2009
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Thomas J. Bievenue, John H. Burdett, Jr., Brian W. Gallagher, Stuart M. Shakshober, Zewu Chen
  • Patent number: 7382856
    Abstract: An x-ray source assembly and method of operation are provided having enhanced output stability. The assembly includes an anode having a source spot upon which electrons impinge and a control system for controlling position of the anode source spot relative to an output structure. The control system can maintain the anode source spot location relative to the output structure notwithstanding a change in one or more operating conditions of the x-ray source assembly. One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.
    Type: Grant
    Filed: February 8, 2007
    Date of Patent: June 3, 2008
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ian Radley, Thomas J. Bievenue, John H. Burdett, Brian W. Gallagher, Stuart M. Shakshober, Zewu Chen, Michael D. Moore
  • Publication number: 20080117511
    Abstract: A diffracting x-ray optic for accepting and redirecting x-rays. The optic includes at least two layers, the layers having a similar or differing material composition and similar or differing crystalline orientation. Each of the layers exhibits a diffractive effect, and their collective effect provides a diffractive effect on the received x-rays. In one embodiment, the layers are silicon, and are bonded together using a silicon-on-insulator bonding technique. In another embodiment, an adhesive bonding technique may be used. The optic may be a curved, monochromating optic.
    Type: Application
    Filed: November 16, 2007
    Publication date: May 22, 2008
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventor: Zewu CHEN