Patents by Inventor Zewu Chen
Zewu Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20140105363Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: ApplicationFiled: October 11, 2013Publication date: April 17, 2014Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu CHEN, David M. GIBSON, Walter M. GIBSON, Adam BAILEY, R. Scott SEMKEN, Kai XIN, John H. BURDETT, JR.
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Patent number: 8625737Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.Type: GrantFiled: February 8, 2011Date of Patent: January 7, 2014Assignee: X-Ray Optical Systems, Inc.Inventors: Zewu Chen, Sony Cheriyan, Kai Xin, Jay Burdett
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Patent number: 8559597Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: GrantFiled: March 3, 2009Date of Patent: October 15, 2013Assignee: X-Ray Optical Systems, Inc.Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett
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Publication number: 20120321045Abstract: This invention relates in general to the determination of silicon levels in fuel mixtures, such as petroleum products. More particularly, the present invention relates to compositions for use as standards in an x-ray analyzer for the measurement of silicon in various fuel mixtures, and to methods of using these compositions.Type: ApplicationFiled: June 14, 2012Publication date: December 20, 2012Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: James CARNAHAN, Zewu CHEN, Leslie JOHNSON
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Patent number: 8050382Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream suspended in the space and streaming through the focal area, using a laminar air flow and/or pressure to define the stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.Type: GrantFiled: February 24, 2009Date of Patent: November 1, 2011Assignee: X-Ray Optical Systems, Inc.Inventors: Zewu Chen, Rory Delaney, Kai Xin
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Publication number: 20110194671Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.Type: ApplicationFiled: February 8, 2011Publication date: August 11, 2011Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu CHEN, Sony CHERIYAN, Kai XIN, Jay BURDETT
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Patent number: 7991116Abstract: An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.Type: GrantFiled: July 26, 2006Date of Patent: August 2, 2011Assignee: X-Ray Optical Systems, Inc.Inventors: Zewu Chen, Ning Gao, Walter Gibson
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Publication number: 20110170666Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: ApplicationFiled: March 3, 2009Publication date: July 14, 2011Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett
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Patent number: 7899154Abstract: An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.Type: GrantFiled: March 14, 2008Date of Patent: March 1, 2011Assignee: X-Ray Optical Systems, Inc.Inventors: Zewu Chen, Li Danhong
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Patent number: 7738629Abstract: A diffracting x-ray optic for accepting and redirecting x-rays. The optic includes at least two layers, the layers having a similar or differing material composition and similar or differing crystalline orientation. Each of the layers exhibits a diffractive effect, and their collective effect provides a diffractive effect on the received x-rays. In one embodiment, the layers are silicon, and are bonded together using a silicon-on-insulator bonding technique. In another embodiment, an adhesive bonding technique may be used. The optic may be a curved, monochromating optic.Type: GrantFiled: November 16, 2007Date of Patent: June 15, 2010Assignee: X-Ray Optical Systems, Inc.Inventor: Zewu Chen
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Patent number: 7738630Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.Type: GrantFiled: March 4, 2009Date of Patent: June 15, 2010Assignee: X-Ray Optical Systems, Inc.Inventors: John H. Burdett, Jr., Adam Bailey, Zewu Chen, R. Scott Semken, Kai Xin
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Publication number: 20100046702Abstract: An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.Type: ApplicationFiled: March 14, 2008Publication date: February 25, 2010Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu Chen, Li Danhong
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Publication number: 20090225948Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.Type: ApplicationFiled: March 4, 2009Publication date: September 10, 2009Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: John H. BURDETT, JR., Adam BAILEY, Zewu CHEN, R. Scott SEMKEN, Kai XIN
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Publication number: 20090225947Abstract: An x-ray imaging system includes an optical device having at least one point-focusing, curved monochromating optic for directing x-rays from an x-ray source towards a focal point. The at least one point-focusing, curved monochromating optic provides a focused monochromatic x-ray beam directed towards the focal point, and a detector is aligned with the focused monochromatic x-ray beam. The optical device facilitates x-ray imaging of an object when the object is located between the optical device and the detector within the focused monochromatic x-ray beam. In various embodiments: each point-focusing, curved monochromatic optic has an optical surface that is doubly-curved; the optical device facilitates passive image demagnification or magnification depending upon placement of the object and detector relative to the focal point; and at least one second point-focusing, curved monochromatic optic can be employed to facilitate refractive index or polarized beam imaging of the object.Type: ApplicationFiled: July 31, 2006Publication date: September 10, 2009Applicants: X-RAY OPTICAL SYSTEMS, INC., THE RESEARCH FOUNDATION OF STATE UNIVERSITY OF NEW YORKInventors: Carolyn A. MacDonald, Noor Mail, Zewu Chen
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Patent number: 7583789Abstract: An x-ray imaging system includes an optical device having at least one point-focusing, curved monochromating optic for directing x-rays from an x-ray source towards a focal point. The at least one point-focusing, curved monochromating optic provides a focused monochromatic x-ray beam directed towards the focal point, and a detector is aligned with the focused monochromatic x-ray beam. The optical device facilitates x-ray imaging of an object when the object is located between the optical device and the detector within the focused monochromatic x-ray beam. In various embodiments: each point-focusing, curved monochromatic optic has an optical surface that is doubly-curved; the optical device facilitates passive image demagnification or magnification depending upon placement of the object and detector relative to the focal point; and at least one second point-focusing, curved monochromatic optic can be employed to facilitate refractive index or polarized beam imaging of the object.Type: GrantFiled: July 31, 2006Date of Patent: September 1, 2009Assignees: The Research Foundation of State University of New York, X-Ray Optical Systems, Inc.Inventors: Carolyn A. MacDonald, Noor Mail, Zewu Chen
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Publication number: 20090213988Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream suspended in the space and streaming through the focal area, using a laminar air flow and/or pressure to define the stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.Type: ApplicationFiled: February 24, 2009Publication date: August 27, 2009Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu CHEN, Rory DELANEY, Kai XIN
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Publication number: 20090161829Abstract: An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.Type: ApplicationFiled: July 26, 2006Publication date: June 25, 2009Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu Chen, Ning Gao, Walter Gibson
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Patent number: 7519159Abstract: A method and device for cooling and electrically-insulating a high-voltage, heat-generating component, for example, an x-ray tube (1105) for analyzing fluids by means of x-ray fluorescence. The device includes an x-ray source (1100) including an x-ray tube (1105) having improved heat-dissipating properties due to the thermal coupling of the x-ray tube with a thermally-conductive, dielectric material (1150). The device may include a base assembly (1135) mounted to the component for conducting heat away from the component while electrically isolating the component. In one aspect of the invention, the base assembly includes two copper plates (1140, 1145) separated by a dielectric plate (1150). The dielectric plate minimizes or prevents the leakage of current through the base assembly (1135). One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.Type: GrantFiled: April 14, 2006Date of Patent: April 14, 2009Assignee: X-Ray Optical Systems, Inc.Inventors: Ian Radley, Thomas J. Bievenue, John H. Burdett, Jr., Brian W. Gallagher, Stuart M. Shakshober, Zewu Chen
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Patent number: 7382856Abstract: An x-ray source assembly and method of operation are provided having enhanced output stability. The assembly includes an anode having a source spot upon which electrons impinge and a control system for controlling position of the anode source spot relative to an output structure. The control system can maintain the anode source spot location relative to the output structure notwithstanding a change in one or more operating conditions of the x-ray source assembly. One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.Type: GrantFiled: February 8, 2007Date of Patent: June 3, 2008Assignee: X-Ray Optical Systems, Inc.Inventors: Ian Radley, Thomas J. Bievenue, John H. Burdett, Brian W. Gallagher, Stuart M. Shakshober, Zewu Chen, Michael D. Moore
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Publication number: 20080117511Abstract: A diffracting x-ray optic for accepting and redirecting x-rays. The optic includes at least two layers, the layers having a similar or differing material composition and similar or differing crystalline orientation. Each of the layers exhibits a diffractive effect, and their collective effect provides a diffractive effect on the received x-rays. In one embodiment, the layers are silicon, and are bonded together using a silicon-on-insulator bonding technique. In another embodiment, an adhesive bonding technique may be used. The optic may be a curved, monochromating optic.Type: ApplicationFiled: November 16, 2007Publication date: May 22, 2008Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventor: Zewu CHEN