Patents by Inventor Zeynep Sueda Turk

Zeynep Sueda Turk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ratiometric gain error calibration schemes for delta-sigma ADCs with capacitive gain input stages
    Patent number: 11057047
    Abstract: An analog to digital converter (ADC) circuit includes voltage and reference input terminals, a sample circuit, and control logic. The sample circuit includes input and output terminals, and capacitors connected in parallel and arranged between the input and output terminals. The control logic is configured to, in a calibration phase of operation, cause the multiplexer to route the ADC reference input terminal to the sampling voltage input terminal, determine a given gain value, determine a set of the capacitors to be used to achieve the given gain value, successively enable capacitor subsets to sample voltage of the reference input while disabling a remainder of the capacitors until all capacitors have been enabled, determine a resulting output code, and from the output code, determine a gain error of the given gain value of the ADC circuit.
    Type: Grant
    Filed: May 21, 2020
    Date of Patent: July 6, 2021
    Assignee: MICROCHIP TECHNOLOGY INCORPORATED
    Inventors: Vincent Quiquempoix, Zeynep Sueda Turk
  • Ratiometric Gain Error Calibration Schemes for Delta-Sigma ADCs with Capacitive Gain Input Stages
    Publication number: 20200373938
    Abstract: An analog to digital converter (ADC) circuit includes voltage and reference input terminals, a sample circuit, and control logic. The sample circuit includes input and output terminals, and capacitors connected in parallel and arranged between the input and output terminals. The control logic is configured to, in a calibration phase of operation, cause the multiplexer to route the ADC reference input terminal to the sampling voltage input terminal, determine a given gain value, determine a set of the capacitors to be used to achieve the given gain value, successively enable capacitor subsets to sample voltage of the reference input while disabling a remainder of the capacitors until all capacitors have been enabled, determine a resulting output code, and from the output code, determine a gain error of the given gain value of the ADC circuit.
    Type: Application
    Filed: May 21, 2020
    Publication date: November 26, 2020
    Applicant: Microchip Technology Incorporated
    Inventors: Vincent Quiquempoix, Zeynep Sueda Turk