Patents by Inventor Zhanfang LIU

Zhanfang LIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230228562
    Abstract: A method includes the steps of arranging mark points for image recognition on a plane of a test piece to be measured; recognizing and recording positions of two-dimensional Cartesian coordinates of each mark point of the test piece to be measured before and after each stretching; and determining a deformation gradient of each mark point and deformation measurement parameters of each mark point through a numerical method, where the deformation measurement parameters include a deformation gradient matrix, an elongation tensor matrix, a finite strain tensor matrix, an orthogonal tensor matrix, an angular tensor matrix, a rotation angle, and a curvature. According to the method, objective measurement of super-large deformation of the plane relating to rotation deformation is achieved.
    Type: Application
    Filed: January 18, 2023
    Publication date: July 20, 2023
    Applicant: Chongqing University
    Inventors: Zhanfang LIU, Tao HE