Patents by Inventor Zhang PAN

Zhang PAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12123855
    Abstract: The present invention discloses a chromatographic analysis device based on a multifunctional integrated probe, and a use method of the chromatographic analysis device. The chromatographic analysis device integrates chromatographic sampling, sample injection and separation functions into the integrated probe. Meanwhile, the present invention further discloses a method for performing microsample analysis by the chromatographic analysis device based on the multifunctional integrated probe. The present invention has the main advantages as follows: the device is high in integration level, small in dead volume, simple in structure, convenient to use and particularly suitable for microsample analysis with a small sample amount, provides a new chromatographic sample injection mode for chromatographic analysis, and provides an ideal platform for chromatographic analysis and on-site chromatographic analysis of a trace amount of samples.
    Type: Grant
    Filed: December 2, 2019
    Date of Patent: October 22, 2024
    Assignee: ZHEJIANG UNIVERSITY
    Inventors: Qun Fang, Di Qiong Jin, Jian Zhang Pan, Guan Sheng Du
  • Patent number: 11189492
    Abstract: A semiconductor structure and its fabrication method are provided in the present disclosure. The method includes providing a base substrate, forming a plurality of discrete core layers on the base substrate, forming an isolation layer on a top surface of a core layer, forming a sacrificial layer on the base substrate and exposing a top surface of the isolation layer, removing the isolation layer after forming the sacrificial layer, removing the sacrificial layer after removing the isolation layer, forming a mask layer on a sidewall surface of the core layer after removing the sacrificial layer, and removing the core layer after forming the mask layer.
    Type: Grant
    Filed: September 18, 2020
    Date of Patent: November 30, 2021
    Assignees: Semiconductor Manufacturing International (Shanghai) Corporation, Semiconductor Manufacturing International (Beijing) Corporation
    Inventors: Zhang Pan, Ting Zhang
  • Publication number: 20210325351
    Abstract: The present invention discloses a chromatographic analysis device based on a multifunctional integrated probe, and a use method of the chromatographic analysis device. The chromatographic analysis device integrates chromatographic sampling, sample injection and separation functions into the integrated probe. Meanwhile, the present invention further discloses a method for performing microsample analysis by the chromatographic analysis device based on the multifunctional integrated probe. The present invention has the main advantages as follows: the device is high in integration level, small in dead volume, simple in structure, convenient to use and particularly suitable for microsample analysis with a small sample amount, provides a new chromatographic sample injection mode for chromatographic analysis, and provides an ideal platform for chromatographic analysis and on-site chromatographic analysis of a trace amount of samples.
    Type: Application
    Filed: December 2, 2019
    Publication date: October 21, 2021
    Inventors: Qun FANG, Di Qiong JIN, Jian Zhang PAN, Guan Sheng DU
  • Publication number: 20210224234
    Abstract: The present application relates to a method for evaluating an operation of a distribution network based on data capture and Spark. The method includes: acquiring a packet from a terminal, and mirroring the packet through a mirroring port of a switch to acquire a mirror packet of the packet; analyzing the mirror packet, acquiring a 101/104 protocol packet, and storing the 101/104 protocol packet into an HDFS; acquiring the 101/104 protocol packet from the HDFS, parsing the 101/104 protocol packet on a Spark platform to acquire a parameter in the 101/104 protocol packet, and analyzing and processing the parameter to obtain a key indicator for evaluating the operation of the distribution network; and displaying the key indicator through a web page.
    Type: Application
    Filed: December 16, 2019
    Publication date: July 22, 2021
    Inventors: ZHANG Pan, Menghan WU, Ning JIANG, Xudong WANG, Guodong LI, Yi DING, Yan QI, Yanxin SHI, Xuejun SHANG, Wei FAN, Ning KANG, Zhijun ZHANG, Jie ZHANG, Tao LI
  • Publication number: 20210098256
    Abstract: A semiconductor structure and its fabrication method are provided in the present disclosure. The method includes providing a base substrate, forming a plurality of discrete core layers on the base substrate, forming an isolation layer on a top surface of a core layer, forming a sacrificial layer on the base substrate and exposing a top surface of the isolation layer, removing the isolation layer after forming the sacrificial layer, removing the sacrificial layer after removing the isolation layer, forming a mask layer on a sidewall surface of the core layer after removing the sacrificial layer, and removing the core layer after forming the mask layer.
    Type: Application
    Filed: September 18, 2020
    Publication date: April 1, 2021
    Inventors: Zhang PAN, Ting ZHANG