Patents by Inventor Zhaobo Zhang

Zhaobo Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9612284
    Abstract: A method for diagnosing a faulty board includes generating a table of debug knowledge in accordance with predefined debug rules, and configuring a diagnostic engine in accordance with the table of debug knowledge. The method also includes subjecting the faulty board to the diagnostic engine to generate a suggested repair, receiving feedback regarding an effectiveness of the suggested repair, and reconfiguring the diagnostic engine in accordance with the feedback regarding the effectiveness of the suggested repair.
    Type: Grant
    Filed: August 27, 2013
    Date of Patent: April 4, 2017
    Assignee: FUTUREWEI TECHNOLOGIES, INC.
    Inventors: Xinli Gu, Zhaobo Zhang, Yaohui Xie
  • Publication number: 20140058698
    Abstract: A method for diagnosing a faulty board includes generating a table of debug knowledge in accordance with predefined debug rules, and configuring a diagnostic engine in accordance with the table of debug knowledge. The method also includes subjecting the faulty board to the diagnostic engine to generate a suggested repair, receiving feedback regarding an effectiveness of the suggested repair, and reconfiguring the diagnostic engine in accordance with the feedback regarding the effectiveness of the suggested repair.
    Type: Application
    Filed: August 27, 2013
    Publication date: February 27, 2014
    Applicant: FutureWei Technologies, Inc.
    Inventors: Xinli Gu, Zhaobo Zhang, Yaohui Xie
  • Patent number: 8560474
    Abstract: An example method is provided and includes collecting inputs for a circuit board under test; evaluating historical repair records using a neuron network; providing repair actions for the circuit board based on the historical repair records; and providing an output reflecting a particular component of the circuit board to be replaced or to be repaired, where the output is associated with a developed probability of successfully fixing an issue that was identified by the test. In more specific implementations, the inputs include fault syndromes and log files associated with the circuit board under test. Additionally, at least one of the inputs of the neuron network is a syndrome vector extracted from a failure log. In yet other instances, particular outputs having higher probabilities are selected as the repair actions. The neuron network can be weighted using diagnosis knowledge weights.
    Type: Grant
    Filed: March 7, 2011
    Date of Patent: October 15, 2013
    Assignee: Cisco Technology, Inc.
    Inventors: Zhiyuan Wang, Xinli Gu, Zhanglei Wang, Zhaobo Zhang, Haoming Zong
  • Patent number: 8373493
    Abstract: Power switching circuits and power management techniques are provided that can reduce static power of ICs, including digital core processors. In one embodiment, the power switching circuit includes a footer (power-gating transistor) between the core and a ground rail and at least two additional power-gating transistors parallel to the footer. The power-gating transistors are controlled by respective control signals to enable selective switching. In a specific embodiment, for each sleep mode, at most, a single one of the transistors is turned on. Multiple sleep modes are accomplished according to the relative sizing of the additional power-gating transistors. A larger of the additional transistors is used to provide a standby mode during short idling times by providing a fast wake-up time and some reduction in static power. For standby modes during longer idling periods, smaller sized transistors are turned on. For longest idling periods, all transistors are turned off.
    Type: Grant
    Filed: September 15, 2010
    Date of Patent: February 12, 2013
    Assignee: Duke University
    Inventors: Krishnendu Chakrabarty, Chrysovalantis Kavousianos, Zhaobo Zhang
  • Publication number: 20120233104
    Abstract: An example method is provided and includes collecting inputs for a circuit board under test; evaluating historical repair records using a neuron network; providing repair actions for the circuit board based on the historical repair records; and providing an output reflecting a particular component of the circuit board to be replaced or to be repaired, where the output is associated with a developed probability of successfully fixing an issue that was identified by the test. In more specific implementations, the inputs include fault syndromes and log files associated with the circuit board under test. Additionally, at least one of the inputs of the neuron network is a syndrome vector extracted from a failure log. In yet other instances, particular outputs having higher probabilities are selected as the repair actions. The neuron network can be weighted using diagnosis knowledge weights.
    Type: Application
    Filed: March 7, 2011
    Publication date: September 13, 2012
    Inventors: Zhiyuan Wang, Xinli Gu, Zhanglei Wang, Zhaobo Zhang, Haoming Zong
  • Publication number: 20120062308
    Abstract: Power switching circuits and power management techniques are provided that can reduce static power of ICs, including digital core processors. In one embodiment, the power switching circuit includes a footer (power-gating transistor) between the core and a ground rail and at least two additional power-gating transistors parallel to the footer. The power-gating transistors are controlled by respective control signals to enable selective switching. In a specific embodiment, for each sleep mode, at most, a single one of the transistors is turned on. Multiple sleep modes are accomplished according to the relative sizing of the additional power-gating transistors. A larger of the additional transistors is used to provide a standby mode during short idling times by providing a fast wake-up time and some reduction in static power. For standby modes during longer idling periods, smaller sized transistors are turned on. For longest idling periods, all transistors are turned off.
    Type: Application
    Filed: September 15, 2010
    Publication date: March 15, 2012
    Inventors: KRISHNENDU CHAKRABARTY, Chrysovalantis Kavousianos, Zhaobo Zhang