Abstract: Disclosed are a test device and a test method thereof. The test device includes a first electrode, an electron transport unit, a charge generation layer, a hole transport unit and a second electrode which are stacked; the charge generation layer includes an N-type doped layer and a P-type doped layer which is stacked on the N-type doped layer, the N-type doped layer is adjacent to the electron transport unit, and the P-type doped layer is adjacent to the hole transport unit.

Abstract: An organic electroluminescent device and a display apparatus. The organic electroluminescent device includes a first electrode, a second electrode and at least two organic electroluminescent units located between the first electrode and the second electrode. The at least two organic electroluminescent units are arranged in a stacked manner. The at least two organic electroluminescent units include a first organic electroluminescent unit. The first organic electroluminescent unit includes a first light-emitting layer. The first light-emitting layer contains a first host material, a thermally activated delayed fluorescence sensitizer and a first fluorescent dye.

Abstract: An organic electroluminescent device and a display apparatus. The organic electroluminescent device includes a first electrode, a second electrode and an organic layer located between the first electrode and the second electrode. The organic layer includes a light-emitting layer. The light-emitting layer contains a host material, a thermally activated delayed fluorescence sensitizer and a fluorescent dye. The energy level relationship between the host material and the thermally activated delayed fluorescence sensitizer is LUMOhost?LUMOsensitizer, while HOMOsensitizer?HOMOhost.

Abstract: Disclosed is an organic light-emitting diode device including: an electron transport layer, a hole blocking layer and a light emitting layer arranged in a stacked manner; the hole blocking layer includes a first material, and the electron transport layer includes the first material.

Abstract: Disclosed are a test device and a test method thereof. The test device includes a first electrode, an electron transport unit, a charge generation layer, a hole transport unit and a second electrode which are stacked; the charge generation layer includes an N-type doped layer and a P-type doped layer which is stacked on the N-type doped layer, the N-type doped layer is adjacent to the electron transport unit, and the P-type doped layer is adjacent to the hole transport unit.