Patents by Inventor Zheng-Yao Sun

Zheng-Yao Sun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method to test the quality factor of a MEMS gyroscope at chip probe
    Patent number: 10267636
    Abstract: A method for a MEMS device comprises determining in a computer system, a first driving signal for the MEMS device in response to a first time delay and to a base driving signal, applying the first driving signal to the MEMS device to induce the MEMS device to operate at a first frequency, determining a second driving signal for the MEMS device in response to a second time delay and to the base driving signal, applying the second driving signal to the MEMS device to induce the MEMS device to operate at a second frequency, determining a first quality factor associated with the MEMS device in response to the first frequency and the second frequency, determining a quality factor associated with the MEMS device in response to the first quality factor, and determining whether the quality factor associated with the MEMS device, exceeds a threshold quality factor.
    Type: Grant
    Filed: January 4, 2016
    Date of Patent: April 23, 2019
    Assignee: mCube, Inc.
    Inventors: Sudheer S. Sridharamurthy, Tony Maraldo, Zheng-Yao Sun, Wenhua Zhang, Te-Hsi Terrence Lee, Sanjay Bhandari, Joseph Rastegar