Abstract: A reference voltage buffer circuit is provided, which could improve the reliability of the reference voltage buffer circuit, including: at least one output branch, where each output branch includes a delay control branch, a first MOSFET, and a second MOSFET; and a feedback branch, where in a first time period, the feedback branch is configured to output a first voltage to the delay control branch, and the delay control branch is configured to control the first MOSFET and the second MOSFET to be turned on, such that a source of the first MOSFET continuously outputs a reference voltage; and in a second time period, a voltage output from the feedback branch to the delay control branch is 0, the delay control branch is configured to control the second MOSFET to be turned off before the first MOSFET is turned off.

Abstract: A reference voltage buffer circuit is provided, which could improve the reliability of the reference voltage buffer circuit, including: at least one output branch, where each output branch includes a delay control branch, a first MOSFET, and a second MOSFET; and a feedback branch, where in a first time period, the feedback branch is configured to output a first voltage to the delay control branch, and the delay control branch is configured to control the first MOSFET and the second MOSFET to be turned on, such that a source of the first MOSFET continuously outputs a reference voltage; and in a second time period, a voltage output from the feedback branch to the delay control branch is 0, the delay control branch is configured to control the second MOSFET to be turned off before the first MOSFET is turned off.

Abstract: A capacitance detecting circuit, includes a first front end circuit, a second front end circuit, a control circuit and a processing circuit, wherein the control circuit controls the first front end circuit and the second front end circuit such that the first front end circuit is configured to convert a capacitance signal of a detection capacitor into a first voltage signal through a first calibration capacitor, and the second front end circuit is configured to convert a capacitance signal of the detection capacitor into a second voltage signal through a second calibration capacitor; the processing circuit is calculates a differential signal of the first voltage signal and the second voltage signal to determine a capacitance variation of the detection capacitor according to the differential signal.

Abstract: The present application discloses a capacitance detecting circuit, a touch device and terminal device, which are beneficial for reducing an area of the capacitance detecting circuit, thereby reducing costs of a chip. The capacitance detecting circuit is connected to a measurement capacitor and where it includes a calibration capacitor; a charging and discharging module including a first current source configured to perform charging or discharging on the measurement capacitor, and a second current source configured to perform charging or discharging on the calibration capacitor; an integrator, configured to convert a capacitance signal of the measurement capacitor into a voltage signal; and a control module, configured to control working states of the charging and discharging module and the integrator.

Abstract: A high-pressure filter is provided, which belongs to the field of filter device technologies, and comprises a trough, a filter disc, a power device, a spiral stirring device, and a compressed air storage tank. A sealed housing is disposed outside the trough, and an inner wall of the sealed housing is connected to an outer wall of the trough to form a sealed cavity. The compressed air storage tank is in communication with the sealed cavity, and compressed air is supplied to the sealed cavity to form a high pressure environment in the sealed cavity. Therefore, a pressure difference is formed between the interior and the exterior of the filter disc to improve the filtering efficiency.

Abstract: A capacitance detecting circuit, includes a first front end circuit, a second front end circuit, a control circuit and a processing circuit, wherein the control circuit controls the first front end circuit and the second front end circuit such that the first front end circuit is configured to convert a capacitance signal of a detection capacitor into a first voltage signal through a first calibration capacitor, and the second front end circuit is configured to convert a capacitance signal of the detection capacitor into a second voltage signal through a second calibration capacitor; the processing circuit is calculates a differential signal of the first voltage signal and the second voltage signal to determine a capacitance variation of the detection capacitor according to the differential signal.

Abstract: The present application discloses a capacitance detecting circuit, a touch device and terminal device, which are beneficial for reducing an area of the capacitance detecting circuit, thereby reducing costs of a chip. The capacitance detecting circuit is connected to a measurement capacitor and where it includes a calibration capacitor; a charging and discharging module including a first current source configured to perform charging or discharging on the measurement capacitor, and a second current source configured to perform charging or discharging on the calibration capacitor; an integrator, configured to convert a capacitance signal of the measurement capacitor into a voltage signal; and a control module, configured to control working states of the charging and discharging module and the integrator.

Abstract: The present invention relates to bamboo manufacturing field, in particular, to a process for making a bamboo filament slab floor by opposite directional hot pressing. Aiming to overcome the defects that, while compressing, the existing bamboo filament slab floor at normal temperature under cold pressing is easy to rebound and expand, has low strength and weak resistance to abrasion and is easy to mildew while using for a long time, the present invention adopts shredding bamboo sheet, sizing treatment, molding bamboo filament and etc. procedures, characterized in that, a secondary drying procedure should be inserted between said sizing treatment and bamboo filament molding procedure; said sizing treatment should be implemented by soak sizing bamboo filament; said compressing includes opposite directional hot pressing of positive pressing and side pressing.

Abstract: The present invention relates to bamboo manufacturing field, in particular, to a process for making a bamboo filament slab floor by opposite directional hot pressing. Aiming to overcome the defects that, while compressing, the existing bamboo filament slab floor at normal temperature under cold pressing is easy to rebound and expand, has low strength and weak resistance to abrasion and is easy to mildew while using for a long time, the present invention adopts shredding bamboo sheet, sizing treatment, moulding bamboo filament and etc. procedures, characterized in that, a secondary drying procedure should be inserted between said sizing treatment and bamboo filament moulding procedure; said sizing treatment should be implemented by soak sizing bamboo filament; said compressing includes opposite directional hot pressing of positive pressing and side pressing.