Abstract: The present invention discloses a lighting jig for testing a backlight module, comprising a switch unit and a delay unit; wherein the switch unit is connected to a power supply, and when the switch unit is in closed position, a power output terminal of the lighting jig is electrically connected to a power input terminal of the backlight module, a closing signal is generated at the same time, and the closing signal is output to the delay unit; and the delay unit is connected to the power supply, and outputs a delayed power signal to the power input terminal of the backlight module upon receipt of the closing signal output from the switch unit so as to delay the lighting up of the backlight module.

Abstract: A testing circuit for backlight source is provided. The testing circuit includes: a power module; a first ON/OFF module; a second ON/OFF module, the power module, the first ON/OFF module and the second ON/OFF module being connected in series; a control module electrically connected to the first ON/OFF module and the second ON/OFF module respectively; and a parallel branch connected in parallel with the second ON/OFF module. The backlight source is connected in the parallel branch, and the control module is configured to control the first ON/OFF module to switched to an ON state from an OFF state when the control module receives a control signal, and to control the second ON/OFF module to be switched to an OFF state from an ON state after a predetermined time delay.

Abstract: Embodiments of the present invention provide a film coating apparatus and a film coating method, relating to the field of manufacturing of display devices. The film coating apparatus comprises a feeding unit, an attaching unit and a cutting unit, which are arranged on a base, wherein the feeding unit is configured to feed a film to be attached to the surface of a product; the attaching unit is connected to the feeding unit and configured to attach the film onto the surface of the product; and the cutting unit is connected to the feeding unit and configured to cut the film. According to the present invention, the film coating of a light guide plate, a semi-finished backlight product and a finished backlight product can be achieved, the labor intensity of operators is greatly reduced, the productivity is liberated, and the production efficiency is further improved. Meanwhile, coating deviation resulted from human factors is avoided, and the bottleneck in the automation of producing TFT-LCDs is overcome.

Abstract: A testing system for a backlight source is provided. The testing system comprises: a power module; a first ON/OFF module; a second ON/OFF module, wherein a circuit is formed by the power module, the first ON/OFF module, and the second ON/OFF module; and a control module electrically connected to the first ON/OFF module and the second ON/OFF module respectively. The second ON/OFF module is arranged to be electrically connected in parallel with the backlight source. The control module is configured such that when receiving a control signal, the control module controls the first ON/OFF module to switch to an ON state from an OFF state, and after a predetermined time delay, the control module controls the second ON/OFF module to switch to an OFF state from an ON state so as to connect the backlight source into the circuit.

Abstract: Embodiments of the present invention provide a film coating apparatus and a film coating method, relating to the field of manufacturing of display devices. The film coating apparatus comprises a feeding unit, an attaching unit and a cutting unit, which are arranged on a base, wherein the feeding unit is configured to feed a film to be attached to the surface of a product; the attaching unit is connected to the feeding unit and configured to attach the film onto the surface of the product; and the cutting unit is connected to the feeding unit and configured to cut the film. According to the present invention, the film coating of a light guide plate, a semi-finished backlight product and a finished backlight product can be achieved, the labor intensity of operators is greatly reduced, the productivity is liberated, and the production efficiency is further improved. Meanwhile, coating deviation resulted from human factors is avoided, and the bottleneck in the automation of producing TFT-LCDs is overcome.

Abstract: The present invention discloses a lighting jig for testing a backlight module, comprising a switch unit and a delay unit; wherein the switch unit is connected to a power supply, and when the switch unit is in closed position, a power output terminal of the lighting jig is electrically connected to a power input terminal of the backlight module, a closing signal is generated at the same time, and the closing signal is output to the delay unit; and the delay unit is connected to the power supply, and outputs a delayed power signal to the power input terminal of the backlight module upon receipt of the closing signal output from the switch unit so as to delay the lighting up of the backlight module.