Patents by Inventor Zhengmao Xu

Zhengmao Xu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ultrasonic flaw detector test block
    Patent number: 11366084
    Abstract: A dudou-shaped test block includes a testing structure, a first beam-path structure, and a second beam-path structure. A first arc-shaped groove and a second arc-shaped groove are provided on one side of the testing structure. The other side of the testing structure is a flat surface. The first beam-path structure and the second beam-path structure are both flat plates. A thickness of the first beam-path structure is less than a thickness of the second beam-path structure. The first beam-path structure and the second beam-path structure are both in contact with the flat surface and arranged parallel to the flat surface. The first arc-shaped groove is arranged corresponding to the first beam-path structure, and the second arc-shaped groove is arranged corresponding to the second beam-path structure.
    Type: Grant
    Filed: October 9, 2018
    Date of Patent: June 21, 2022
    Assignee: NANJING DEVELOP ADVANCED MANUFACTURING CO., LTD.
    Inventors: Changhua Chen, Li Zhang, Hong Zhang, Zhengmao Xu, Zheng Dong, Qingyong Chen, Xiaolei Liu, Yao Ha
  • DUDOU-SHAPED TEST BLOCK
    Publication number: 20210003537
    Abstract: A dudou-shaped test block includes a testing structure, a first beam-path structure, and a second beam-path structure. A first arc-shaped groove and a second arc-shaped groove are provided on one side of the testing structure. The other side of the testing structure is a flat surface. The first beam-path structure and the second beam-path structure are both flat plates. A thickness of the first beam-path structure is less than a thickness of the second beam-path structure. The first beam-path structure and the second beam-path structure are both in contact with the flat surface and arranged parallel to the flat surface. The first arc-shaped groove is arranged corresponding to the first beam-path structure, and the second arc-shaped groove is arranged corresponding to the second beam-path structure.
    Type: Application
    Filed: October 9, 2018
    Publication date: January 7, 2021
    Applicant: NANJING DEVELOP ADVANCED MANUFACTURING CO., LTD.
    Inventors: Changhua CHEN, Li ZHANG, Hong ZHANG, Zhengmao XU, Zheng DONG, Qingyong CHEN, Xiaolei LIU, Yao HA
  • Heel test block
    Patent number: 9810667
    Abstract: A heel test block comprises a semi-cylinder, a first flat plate and a second flat plate, wherein the side surface of the semi-cylinder comprises a circular arc-shaped surface and a first plane, the first flat plate and the second flat plate are arranged on one side of the first plane, all the parts of the first flat plate have the same thickness, all the parts of the second flat plate have the same thickness, the first flat plate and the second flat plate are arranged in parallel to the first plane, the first flat plate and the second flat plate are arranged on the two sides of the mother line of the semi-cylinder respectively, and the thickness of the first flat plate is less than that of the second flat plate.
    Type: Grant
    Filed: July 9, 2014
    Date of Patent: November 7, 2017
    Assignee: Nanjing Develop Advanced Manufacturing Co., Ltd.
    Inventors: Changhua Chen, Li Zhang, Xiaolei Liu, Yao Ha, Zhengmao Xu, Zheng Dong, Qingyong Chen