Abstract: Microwave photonic vector network analyzer and a method for measuring scattering parameters of a microwave device are provided. The analyzer comprises a microwave source, wherein a signal loading module, an optical sampling module and a signal processing module are sequentially arranged along a signal output direction of the microwave source; an output end of the signal processing module is respectively connected with a control end of the microwave source and a control end of the optical sampling module; and two test ports of the signal loading module are connected with both ends of a device to be tested. The invention realizes direct sampling and frequency conversion for microwave signals, abandons a superheterodyne structure and/or direct frequency conversion structure in the traditional network analyzer, simplifies the structure of the system while improving the measurement frequency range and avoiding image interference, and reduces system complexity, cost and power consumption.

Abstract: Microwave photonic vector network analyzer and a method for measuring scattering parameters of a microwave device are provided. The analyzer comprises a microwave source, wherein a signal loading module, an optical sampling module and a signal processing module are sequentially arranged along a signal output direction of the microwave source; an output end of the signal processing module is respectively connected with a control end of the microwave source and a control end of the optical sampling module; and two test ports of the signal loading module are connected with both ends of a device to be tested. The invention realizes direct sampling and frequency conversion for microwave signals, abandons a superheterodyne structure and/or direct frequency conversion structure in the traditional network analyzer, simplifies the structure of the system while improving the measurement frequency range and avoiding image interference, and reduces system complexity, cost and power consumption.