Patents by Inventor Zhengyi Pan

Zhengyi Pan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240207827
    Abstract: The present invention relates to the technical field of new catalytic materials, and specifically relates to a phosphorus-doped nickel-aluminum oxide, its preparation method and the application thereof. Said preparation method comprises: the nickel-aluminum-based layered double hydroxide is subjected to high-temperature aerobic calcination to obtain nickel-aluminum oxide, the nickel-aluminum oxide obtained thereby is mixed with a phosphorus source and heated in an inert gas atmosphere or in vacuum conditions to dope phosphorus into the nickel-aluminum oxide, whereby the final phosphorus-doped nickel-aluminum oxide is obtained. In the present invention the Ni—Al interactions are constructed by subjecting the nickel-aluminum based layered double hydroxides to aerobic calcination at high temperature. The Ni—P interactions are constructed by doping P into nickel-aluminum oxides.
    Type: Application
    Filed: November 16, 2021
    Publication date: June 27, 2024
    Inventors: Guanghui WANG, Dechang LI, Zhengyi PAN, Shan ZHANG
  • Publication number: 20230326010
    Abstract: Clean Version of the Abstract A defective picture generation method applied to industrial quality inspection and a defective picture generation apparatus applied to industrial quality inspection are provided.
    Type: Application
    Filed: August 23, 2022
    Publication date: October 12, 2023
    Applicant: CHANGZHOU MICROINTELLIGENCE CO., LTD.
    Inventors: Zheng ZHENG, Zhengyi PAN, Dawei HOU
  • Patent number: 11783474
    Abstract: A defective picture generation method applied to industrial quality inspection and a defective picture generation apparatus applied to industrial quality inspection are provided. The method includes: acquiring a first workpiece picture set with defects and a second workpiece picture set without defects; determining a defect annotation picture corresponding to each first workpiece picture in the first workpiece picture set; determining a feature value of each second workpiece picture in the second workpiece picture set; training a pix2pixHD network based on the first workpiece pictures, the second workpiece pictures, the defect annotation pictures and the feature values; acquiring a target defect annotation picture from the defect feature database according to the desired defect type; acquiring a target feature value from the picture feature database according to the desired picture type; and inputting the target defect annotation picture and the target feature value into the trained generator.
    Type: Grant
    Filed: August 23, 2022
    Date of Patent: October 10, 2023
    Assignee: CHANGZHOU MICROINTELLIGENCE CO., LTD.
    Inventors: Zheng Zheng, Zhengyi Pan, Dawei Hou