Patents by Inventor Zhengyun WU

Zhengyun WU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing probe, testing device and testing method
    Patent number: 10816575
    Abstract: The present disclosure provides in some embodiments a testing probe, including a probe holder, and a probe body at least partially extending into an interior of the probe holder and capable of moving relative to the probe holder. The probe body is configured to be electrically connected to the probe holder within a first travel distance relative to the probe holder so as to output a testing signal, and configured to be electrically disconnected from the probe holder within a second travel distance relative to the probe holder.
    Type: Grant
    Filed: April 13, 2018
    Date of Patent: October 27, 2020
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Chao Zhou, Xianchun Huang, Tao Zhang, Zhengyun Wu, Tao Geng, Youpeng Gan
  • Array substrate, its manufacturing method and testing method, and display device
    Patent number: 10276456
    Abstract: The present disclosure provides an array substrate, its manufacturing method and testing method, and a display device. The array substrate includes a (Test Element Group) TEG arranged at a non-display area and including a plurality of to-be-tested elements and a plurality of testing contact electrodes configured to test the to-be-tested elements. Each of the to-be-tested elements is connected to at least two of the testing contact electrodes, and at least one of the testing contact electrodes is shared by at least two of the to-be-tested elements.
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: April 30, 2019
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yu Ji, Chengye Wu, Zhengyun Wu, Lei Feng, Bei Wang, Lei Song
  • TESTING PROBE, TESTING DEVICE AND TESTING METHOD
    Publication number: 20190011480
    Abstract: The present disclosure provides in some embodiments a testing probe, including a probe holder, and a probe body at least partially extending into an interior of the probe holder and capable of moving relative to the probe holder. The probe body is configured to be electrically connected to the probe holder within a first travel distance relative to the probe holder so as to output a testing signal, and configured to be electrically disconnected from the probe holder within a second travel distance relative to the probe holder.
    Type: Application
    Filed: April 13, 2018
    Publication date: January 10, 2019
    Applicants: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY, LTD.
    Inventors: Chao ZHOU, Xianchun HUANG, Tao ZHANG, Zhengyun WU, Tao GENG, Youpeng GAN
  • ARRAY SUBSTRATE, ITS MANUFACTURING METHOD AND TESTING METHOD, AND DISPLAY DEVICE
    Publication number: 20170194219
    Abstract: The present disclosure provides an array substrate, its manufacturing method and testing method, and a display device. The array substrate includes a (Test Element Group) TEG arranged at a non-display area and including a plurality of to-be-tested elements and a plurality of testing contact electrodes configured to test the to-be-tested elements. Each of the to-be-tested elements is connected to at least two of the testing contact electrodes, and at least one of the testing contact electrodes is shared by at least two of the to-be-tested elements.
    Type: Application
    Filed: August 12, 2016
    Publication date: July 6, 2017
    Applicants: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yu JI, Chengye WU, Zhengyun WU, Lei FENG, Bei WANG, Lei SONG