Abstract: A method for electric field measurement based on a levitated particle includes steps of (1) capturing a particle and levitating the captured particle; (2) adjusting a quantity of electric charge carried by the levitated particle; (3) measuring a charge number N of the levitated particle; (4) disposing the levitated particle in an electric field to be measured, measuring a displacement power spectral density Svxel of the levitated particle under the electric field and obtaining an electric field force Fel; and (5) according to a formula of E=Fel/Nqe, obtaining an electric field intensity E. An apparatus for electric field measurement based on a levitated particle includes a high-voltage DC (direct current) power supply, two bare wire electrodes, a vacuum chamber, a trapping laser, an objective lens, a pair of parallel electrodes, a collective lens, a quadrant photodetector, a lock-in amplifier, a signal generator and a power amplifier.

Abstract: A method for electric field measurement based on a levitated particle includes steps of (1) capturing a particle and levitating the captured particle; (2) adjusting a quantity of electric charge carried by the levitated particle; (3) measuring a charge number N of the levitated particle; (4) disposing the levitated particle in an electric field to be measured, measuring a displacement power spectral density Svxel of the levitated particle under the electric field and obtaining an electric field force Fel; and (5) according to a formula of E=Fel/Nqe, obtaining an electric field intensity E. An apparatus for electric field measurement based on a levitated particle includes a high-voltage DC (direct current) power supply, two bare wire electrodes, a vacuum chamber, a trapping laser, an objective lens, a pair of parallel electrodes, a collective lens, a quadrant photodetector, a lock-in amplifier, a signal generator and a power amplifier.

Abstract: Disclosed is an optical trap calibration apparatus and method based on variation of electric field by optical imaging of a nanoparticle. By means of a direct optical imaging method, a linear nanoparticle equilibrium position displacement under the action of a constant electric field is measured to realize calibration, thereby avoiding the introduction of error signals, and improving the reliability of differential calibration. The specific calibration method and apparatus of the present invention are not only suitable for calibration of electric field quantity, but also suitable for the calibration of other magnetic forces and the like. By means of the accurate calibration of mechanical quantity in the present invention, the development and application of the vacuum optical trap sensing technology can be promoted.

Abstract: Disclosed is a multi-dimensional optical tweezers calibration device based on electric field quantity calibration and a method thereof. The polarization-dependent characteristics of a tightly focused optical trap are utilized to realize triaxial electric field force calibration of particles through a one-dimensional electric field quantity calibration device. The method of the present application enables a particle electric field force calibration system to be compatible with particle delivery and particle detection systems; the device is simplified and calibration complexity is reduced.

Abstract: A method and a device for measuring light field distribution are provided; including steps of utilizing the optical trap to stably levitating particles, moving the optical trap to bring the particles close to the light field to be measured, and utilizing the photodetector to collect the scattered light signals of the particles at different positions in the three-dimensional space of the light field to be measured, and calculating the light field distribution of the light field to be measured according to the scattered light intensity which is proportional to the light intensity at that position. The device for measuring the optical field distribution includes a laser, an optical trapping path, particles, a photodetector, a control system and an upper computer; the laser emits a laser, passes through the optical trapping path, and emits highly focused captured light B to form an V optical trap to capture particles.

Abstract: A method and a device for measuring light field distribution are provided; including steps of utilizing the optical trap to stably levitating particles, moving the optical trap to bring the particles close to the light field to be measured, and utilizing the photodetector to collect the scattered light signals of the particles at different positions in the three-dimensional space of the light field to be measured, and calculating the light field distribution of the light field to be measured according to the scattered light intensity which is proportional to the light intensity at that position. The device for measuring the optical field distribution includes a laser, an optical trapping path, particles, a photodetector, a control system and an upper computer; the laser emits a laser, passes through the optical trapping path, and emits highly focused captured light B to form an V optical trap to capture particles.

Abstract: An apparatus for routing power between a set of power supply taps of an automated tester and power connections on an integrated circuit under test, where the integrated circuit belongs to a family of integrated circuits that have a common power connection layout and different power connection voltage requirements. An interface board having first electrical contacts disposed in the common power connection layout makes electrical connections to the power connections of all integrated circuits belonging to the family of integrated circuits. The first electrical contacts are electrically routed to second electrical contacts disposed in a standardized configuration. A power personality card having third electrical contacts makes electrical connections to the second electrical contacts of the interface board.

Abstract: An apparatus for routing power between a set of power supply taps of an automated tester and power connections on an integrated circuit under test, where the integrated circuit belongs to a family of integrated circuits that have a common power connection layout and different power connection voltage requirements. An interface board having first electrical contacts disposed in the common power connection layout makes electrical connections to the power connections of all integrated circuits belonging to the family of integrated circuits. The first electrical contacts are electrically routed to second electrical contacts disposed in a standardized configuration. A power personality card having third electrical contacts makes electrical connections to the second electrical contacts of the interface board.