Patents by Inventor Zhensong Li

Zhensong Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuitry and method for an at-speed scan test
    Patent number: 7710801
    Abstract: An integrated circuit has a plurality of clock domains and a plurality of memory cells being configurable as operational memory cells or as scan test memory cells for testing the integrated circuit. A pulse generator of the integrated circuit generates pulses for triggering the memory cells when being configured as scan test memory cells, the pulse generator comprising a plurality of pulse outputs. The pulses are provided to the memory cells by multiplexer circuits selecting one of the pulses of the pulse generator and an operational clock.
    Type: Grant
    Filed: May 31, 2007
    Date of Patent: May 4, 2010
    Assignee: Infineon Technologies AG
    Inventor: Zhensong Li
  • Circuitry and method for an at-speed scan test
    Publication number: 20070245180
    Abstract: An integrated circuit has a plurality of clock domains and a plurality of memory cells being configurable as operational memory cells or as scan test memory cells for testing the integrated circuit. A pulse generator of the integrated circuit generates pulses for triggering the memory cells when being configured as scan test memory cells, the pulse generator comprising a plurality of pulse outputs. The pulses are provided to the memory cells by multiplexer circuits selecting one of the pulses of the pulse generator and an operational clock.
    Type: Application
    Filed: May 31, 2007
    Publication date: October 18, 2007
    Applicant: INFINEON TECHNOLOGIES AG
    Inventor: Zhensong Li