Patents by Inventor Zhenying Wang

Zhenying Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10385656
    Abstract: Systems and methods for determining manufacturing or operating parameters for a deviated downhole well component, including a method that includes representing a tubular string as nodes separated by segments, determining transfer matrices for determining an ith node's state vector from an ith?1 node's state vector, and defining initial state vector values for the reference node. The nodes are numerable from 1 to N with an initial, mechanically constrained reference node representable with i=0, and each is associated with a state vector describing a corresponding node position and one or more forces present at said node. The method further includes applying the transfer matrices to obtain each of the state vectors' values, deriving from at least one of the state vectors a parameter value for said component, and specifying a component having said parameter value. The parameter value can include a centralizer or stabilizer composition, manufacturing dimensions, or position.
    Type: Grant
    Filed: January 17, 2014
    Date of Patent: August 20, 2019
    Assignee: LANDMARK GRAPHICS CORPORATION
    Inventors: Robello Samuel, Zhenying Wang
  • Patent number: 9128126
    Abstract: An oscilloscope and a method and system thereof for collecting and displaying signal waveform are disclosed, including a control measuring unit determining a corresponding test command and test parameter according to the selection of test points on a tested object; calculating position coordinate of each test point, and sending the test command and test parameter to an automatic collecting unit; the automatic collecting unit returning test signals of each test point collected by a collecting probe of the automatic collection unit to the control measuring unit according to the test command and test parameter; and the control measuring unit generating corresponding waveform data according to the test signals returned by the automatic collecting unit, storing and displaying the waveform data.
    Type: Grant
    Filed: October 20, 2010
    Date of Patent: September 8, 2015
    Assignee: ZTE Corporation
    Inventors: Guangming Ma, Zhenying Wang
  • Publication number: 20120203500
    Abstract: An oscilloscope and a method and system thereof for collecting and displaying signal waveform are disclosed, including a control measuring unit determining a corresponding test command and test parameter according to the selection of test points on a tested object; calculating position coordinate of each test point, and sending the test command and test parameter to an automatic collecting unit; the automatic collecting unit returning test signals of each test point collected by a collecting probe of the automatic collection unit to the control measuring unit according to the test command and test parameter; and the control measuring unit generating corresponding waveform data according to the test signals returned by the automatic collecting unit, storing and displaying the waveform data.
    Type: Application
    Filed: October 20, 2010
    Publication date: August 9, 2012
    Applicant: ZTE CORPORATION
    Inventors: Guangming Ma, Zhenying Wang
  • Patent number: D993669
    Type: Grant
    Filed: January 4, 2022
    Date of Patent: August 1, 2023
    Inventor: Zheni Wang