Patents by Inventor Zhipeng Liang

Zhipeng Liang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11981569
    Abstract: A method includes the following steps: a first step: the material containing heteroatom and graphite powder are mixed for a preset time by grinding, and the molar ratio of heteroatom to carbon atom is 1%-10%, then the heteroatom precursors are obtained; a second contact step: the heteroatom precursor is filled into a graphite rod with holes and compacted, then the graphite rod is dried for a preset time to obtain a plasma anode and using a DC arc plasma device to prepare the graphite anode into heteroatom-doped CNHs; a third contact step: the heteroatom-doped CNHs are dispersed in a reducing solution, a platinum salt is added to stir evenly, the reduction reaction is carried out by heating and stirring, and after centrifugation, washing and drying, a catalyst with platinum loading is obtained.
    Type: Grant
    Filed: April 20, 2023
    Date of Patent: May 14, 2024
    Assignee: KUNMING UNIVERSITY OF SCIENCE AND TECHNOLOGY
    Inventors: Feng Liang, Zhipeng Xie, Da Zhang
  • Patent number: 11937020
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Grant
    Filed: March 16, 2022
    Date of Patent: March 19, 2024
    Assignee: Inovision Software Solutions, Inc.
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Publication number: 20240087654
    Abstract: The present disclosure provides a method for controlling a 3D NAND memory using a read operation. The method can include increasing a voltage to a plurality of top select gates, with respect to a first reference voltage level, during a pre-pulse period of the read operation prior to a read period of the read operation. The method can also include increasing a voltage to a plurality of word lines, with respect to a second reference voltage level, during the pre-pulse period. The method can also include decreasing a voltage to a bit line, with respect to the first voltage, during the pre-pulse period. The method can also include applying no voltage change to a bottom select gate during the pre-pulse period.
    Type: Application
    Filed: September 13, 2022
    Publication date: March 14, 2024
    Applicant: YANGTZE MEMORY TECHNOLOGIES., LTD.
    Inventors: Zhipeng DONG, Ke Liang, Liang Qiao
  • Publication number: 20220264057
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Application
    Filed: March 16, 2022
    Publication date: August 18, 2022
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Patent number: 11310467
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Grant
    Filed: May 4, 2020
    Date of Patent: April 19, 2022
    Assignee: INOVISION SOFTWARE SOLUTIONS, INC.
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Publication number: 20200344449
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Application
    Filed: May 4, 2020
    Publication date: October 29, 2020
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Patent number: 10394191
    Abstract: A time-to-digital converter is provided. The time-to-digital converter comprises an oscillator controller, an invertible oscillator and a measurement circuit. The oscillator controller receives a start signal and a stop signal and outputs a mode signal. The invertible oscillator is electrically connected with the oscillator controller for receiving the mode signal. The oscillation direction of the invertible oscillator is inverted according to the mode signal, and the invertible oscillator outputs plural delay signals. The measurement circuit is electrically connected with the invertible oscillator for receiving the plural delay signals. The measurement circuit receives a sampling signal, samples the plural delay signals in accordance with the sampling signal, and outputs an output signal.
    Type: Grant
    Filed: May 25, 2018
    Date of Patent: August 27, 2019
    Assignees: DELTA ELECTRONICS INT'L (SINGAPORE) PTE LTD, NANYANG TECHNOLOGICAL UNIVERSITY
    Inventors: Zhipeng Liang, Chirn Chye Boon, Xiang Yi, Jack Sheng Kee
  • Publication number: 20190238796
    Abstract: An object inspection system 10 and a method for detecting defects which utilizes a plurality of cameras 26 and lights 18 to capture images of a portion of an object 14 and which uses the captured images to determine the presence of a defect upon a surface, such as surface 12, of the object 14 and which may communicated the location of the identified defect to an automated defect repair assembly 9.
    Type: Application
    Filed: May 9, 2018
    Publication date: August 1, 2019
    Inventors: Jacob Nathaniel Allen, Brandon David See, Frank Damacio Luna, Zhipeng Liang
  • Publication number: 20190096057
    Abstract: An object inspection system 10 and a method for detecting defects which utilizes a plurality of cameras 26 and lights 18 to capture images of a portion of an object 14 and which uses the captured images to determine the presence of a defect upon a surface, such as surface 12, of the object 14 and which may communicated the location of the identified defect to an automated defect repair assembly 9.
    Type: Application
    Filed: May 9, 2018
    Publication date: March 28, 2019
    Inventors: Jacob Nathaniel Allen, Brandon David See, Zhipeng Liang, Frank Damacio Luna